接触面非线性畸变电压测试

Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts Pub Date : 1900-01-01 DOI:10.1109/HOLM.1988.16129

I. Minowa, M. Kanno

{"title":"接触面非线性畸变电压测试","authors":"I. Minowa, M. Kanno","doi":"10.1109/HOLM.1988.16129","DOIUrl":null,"url":null,"abstract":"Contact resistance, second-order distortion voltages, and DC vias voltages, which minimize distortion, are measured on a copper surface for studying surface film conditions. Platinum contact members to a copper rod and a polished surface of a single copper crystal are tested. The results are statistically indicated and shown with histograms in order to compare the contact resistance to the DC bias voltage. The results, obtained using a dual-frequency method and DC source, suggest that the second-order distortion (result of rectification) would be caused by a potential difference (difference of work functions of the contact metals) through layers, since the second-order distortion is strongly influenced by a DC bias voltage and approaches zero at a characteristic value for the combination of metals.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Nonlinear distortion voltage testing of contact surfaces\",\"authors\":\"I. Minowa, M. Kanno\",\"doi\":\"10.1109/HOLM.1988.16129\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Contact resistance, second-order distortion voltages, and DC vias voltages, which minimize distortion, are measured on a copper surface for studying surface film conditions. Platinum contact members to a copper rod and a polished surface of a single copper crystal are tested. The results are statistically indicated and shown with histograms in order to compare the contact resistance to the DC bias voltage. The results, obtained using a dual-frequency method and DC source, suggest that the second-order distortion (result of rectification) would be caused by a potential difference (difference of work functions of the contact metals) through layers, since the second-order distortion is strongly influenced by a DC bias voltage and approaches zero at a characteristic value for the combination of metals.<<ETX>>\",\"PeriodicalId\":191800,\"journal\":{\"name\":\"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts\",\"volume\":\"33 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1900-01-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HOLM.1988.16129\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.1988.16129","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}

引用次数: 0

摘要

接触电阻，二阶失真电压，直流过孔电压，这是最小的失真，测量在铜表面，以研究表面薄膜条件。对铜棒的铂接触部件和单个铜晶体的抛光表面进行测试。结果用直方图进行统计和显示，以便比较接触电阻和直流偏置电压。使用双频方法和直流源获得的结果表明，二阶畸变(整流的结果)将由电位差(接触金属的功函数的差)引起，因为二阶畸变受直流偏置电压的强烈影响，并且在金属组合的特征值处接近零。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

查看原文本刊更多论文

Nonlinear distortion voltage testing of contact surfaces

Contact resistance, second-order distortion voltages, and DC vias voltages, which minimize distortion, are measured on a copper surface for studying surface film conditions. Platinum contact members to a copper rod and a polished surface of a single copper crystal are tested. The results are statistically indicated and shown with histograms in order to compare the contact resistance to the DC bias voltage. The results, obtained using a dual-frequency method and DC source, suggest that the second-order distortion (result of rectification) would be caused by a potential difference (difference of work functions of the contact metals) through layers, since the second-order distortion is strongly influenced by a DC bias voltage and approaches zero at a characteristic value for the combination of metals.<>

求助全文

通过发布文献求助，成功后即可免费获取论文全文。去求助

来源期刊

Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts

自引率

0.00%

发文量