{"title":"The effect of current on stationary contact behaviour","authors":"B. Bennett","doi":"10.1109/HOLM.1988.16128","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16128","url":null,"abstract":"A general time-dependent model has been developed that is based on electromigration and describes the effect of current on stationary electrical contacts, as used in telecommunication circuits. Model predictions were found to be in excellent agreement with experimental results obtained from gold and copper contacts. Based on these results it is proposed that sealing current, which is a 5-30-mA DC continuous current applied to splices to maintain their integrity, works by establishing a steady state between contact growth due to electromigration and contact degradation due to oxidation and/or corrosion.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"214 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122518245","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
D. Jeannotte, S. Biyani, J. Roth, L. Hall, S. Davies, B. Vaughen, J. Steppan
{"title":"Critical variables in gaseous corrosion testing","authors":"D. Jeannotte, S. Biyani, J. Roth, L. Hall, S. Davies, B. Vaughen, J. Steppan","doi":"10.1109/HOLM.1988.16134","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16134","url":null,"abstract":"In recent work at Vanderbilt University, a failure mode was characterized that is accelerated by the presence of hostile gases in the environment. The effect of the velocity of the hostile gas stream was tested. Three different gas velocities were evaluated by measurement of the time of development of a shorting failure over a range of electrical field strengths. It was found that the time to failure decreased in proportion to the square root of the gas velocity as velocity increased in the range of 4 mm/s to 400 mm/s. The electrolyte base was provided by a coating of polyethylene glycol, average molecular weight 400, PEG400, between the Cu electrodes. These results make it possible to relate the time to failure to application variables such as gas concentration and gas-flow velocity, thus making possible at estimate of product lifetime from test results.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"92 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126126918","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The future of electrical switching contacts under the influence of electronics","authors":"K. Schrøder","doi":"10.1109/HOLM.1988.16088","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16088","url":null,"abstract":"After a short presentation of the principles of switching of electromechanical switches, transistors, MOSFETs, thyristors, triacs, and GTOs (gate turn-offs), the requirements for the different applications of switching devices are elucidated. The replacement of electromechanical switches by electronic ones is considered for energy distribution, energy in industry, control and regulation, for domestic installations, domestic equipment, and railways, electric vehicles, and motorcars. It is concluded that electronic components will not completely replace switching contacts, but that in the future both types of switch will complement each other.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132816793","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A new rapid screening method for silicones by size exclusion chromatography","authors":"A. Muller, R. Opila","doi":"10.1109/HOLM.1988.16131","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16131","url":null,"abstract":"A method is described of characterizing silicone extracts which provide the entire viscosity distribution of the extract instead of only a single average value. This distinction is very important, since it is the very low viscosity components of the silicone extract that are most likely to creep, thus causing relay contact failures and these components are not detected by methods that provide average viscosity values. In addition, since the lowest viscosity fractions are also the most volatile, this method also addresses the problem of gas-phase transport. The method described requires only standard chromatographic equipment and results can be obtained in a matter of minutes. The development of this method, including the principles underlying the determination of the viscosity distribution, is briefly described, followed by examples of its application and comparisons to other silicone-extract characterization methods.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123032799","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Application of silver-based contact materials in air-break switching devices for power engineering","authors":"R. Michal, K. E. Saeger","doi":"10.1109/HOLM.1988.16107","DOIUrl":"https://doi.org/10.1109/HOLM.1988.16107","url":null,"abstract":"The properties of some commonly used silver-based contact materials are discussed on the basis of the various metallurgical processes occurring in the interaction of the electric arc with the contact material. Using selected examples taken from research work and field experience, it is pointed out how the contact properties are influenced by the metallurgical mechanisms involved. Good results are obtained by using contact materials like Ag/MeO (with MeO standing for metal oxides such as CdO, ZnO, or SnO/sub 2/), Ag/Ni, Ag/C, Ag/W, and Ag/WC. Each of these materials has its own typical profile of properties, which are briefly reviewed, and which define the field of application and the type of switching design where it gives best performance.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123509284","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}