固定触点的电不稳定性:Al/Al和Al/黄铜结

R. Timsit
{"title":"固定触点的电不稳定性:Al/Al和Al/黄铜结","authors":"R. Timsit","doi":"10.1109/HOLM.1988.16111","DOIUrl":null,"url":null,"abstract":"Electrical instabilities in Al/Al and Al/brass stationary point junctions has been examined in ultrahigh vacuum and in oxygen gas. It is found that Al/brass junctions are electrically stable in vacuum and in oxygen gas if the surfaces are sufficiently clean. The growth of intermetallic compounds in this interface affects stability only after a sufficiently long exposure of the contact, typically several hours, to a temperature typically higher than 150 degrees C. Surface contaminants, probably in the form of carbonaceous material, are deleterious to the performance of Al/Al and Al/brass junctions. However, the junctions often recover from contaminant-induced degeneration. This recovery is attributed in part to thermal dispersal of the contaminants from the electrical interface during the early stages of degeneration.<<ETX>>","PeriodicalId":191800,"journal":{"name":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","volume":"452 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1988-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":"{\"title\":\"Electrical instabilities in stationary contacts: Al/Al and Al/brass junctions\",\"authors\":\"R. Timsit\",\"doi\":\"10.1109/HOLM.1988.16111\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"Electrical instabilities in Al/Al and Al/brass stationary point junctions has been examined in ultrahigh vacuum and in oxygen gas. It is found that Al/brass junctions are electrically stable in vacuum and in oxygen gas if the surfaces are sufficiently clean. The growth of intermetallic compounds in this interface affects stability only after a sufficiently long exposure of the contact, typically several hours, to a temperature typically higher than 150 degrees C. Surface contaminants, probably in the form of carbonaceous material, are deleterious to the performance of Al/Al and Al/brass junctions. However, the junctions often recover from contaminant-induced degeneration. This recovery is attributed in part to thermal dispersal of the contaminants from the electrical interface during the early stages of degeneration.<<ETX>>\",\"PeriodicalId\":191800,\"journal\":{\"name\":\"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts\",\"volume\":\"452 1\",\"pages\":\"0\"},\"PeriodicalIF\":0.0000,\"publicationDate\":\"1988-03-01\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"12\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts\",\"FirstCategoryId\":\"1085\",\"ListUrlMain\":\"https://doi.org/10.1109/HOLM.1988.16111\",\"RegionNum\":0,\"RegionCategory\":null,\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"\",\"JCRName\":\"\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"Electrical Contacts, 1988., Proceedings of the Thirty Fourth Meeting of the IEEE Holm Conference on Electrical Contacts","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/HOLM.1988.16111","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12

摘要

本文研究了在超高真空和氧气条件下Al/Al和Al/黄铜固结的电不稳定性。研究发现,如果表面足够清洁,铝/黄铜结在真空和氧气中都是电稳定的。金属间化合物在该界面中的生长只有在接触点暴露足够长的时间(通常是几个小时)后才会影响稳定性,通常高于150摄氏度。表面污染物可能以碳质材料的形式存在,对Al/Al和Al/黄铜结的性能有害。然而,连接处通常会从污染引起的退化中恢复。这种恢复部分归因于在退化的早期阶段污染物从电界面的热扩散。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Electrical instabilities in stationary contacts: Al/Al and Al/brass junctions
Electrical instabilities in Al/Al and Al/brass stationary point junctions has been examined in ultrahigh vacuum and in oxygen gas. It is found that Al/brass junctions are electrically stable in vacuum and in oxygen gas if the surfaces are sufficiently clean. The growth of intermetallic compounds in this interface affects stability only after a sufficiently long exposure of the contact, typically several hours, to a temperature typically higher than 150 degrees C. Surface contaminants, probably in the form of carbonaceous material, are deleterious to the performance of Al/Al and Al/brass junctions. However, the junctions often recover from contaminant-induced degeneration. This recovery is attributed in part to thermal dispersal of the contaminants from the electrical interface during the early stages of degeneration.<>
求助全文
通过发布文献求助,成功后即可免费获取论文全文。 去求助
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信