Nature Electronics最新文献_第3页

Sensing systems for safe lithium-ion batteries 安全锂离子电池传感系统

IF 34.3 1区工程技术

Nature Electronics Pub Date : 2025-06-26 DOI: 10.1038/s41928-025-01412-3

Yan Huang

引用次数: 0

A fast and reconfigurable sort-in-memory system based on memristors 一种基于忆阻器的快速可重构内存排序系统

IF 34.3 1区工程技术

Nature Electronics Pub Date : 2025-06-25 DOI: 10.1038/s41928-025-01405-2

Lianfeng Yu, Teng Zhang, Zeyu Wang, Xile Wang, Zelun Pan, Bowen Wang, Zhaokun Jing, Jiaxin Liu, Yuqi Li, Ziang Xie, Yihang Zhu, Bonan Yan, Yaoyu Tao, Yuchao Yang

{"title":"A fast and reconfigurable sort-in-memory system based on memristors","authors":"Lianfeng Yu, Teng Zhang, Zeyu Wang, Xile Wang, Zelun Pan, Bowen Wang, Zhaokun Jing, Jiaxin Liu, Yuqi Li, Ziang Xie, Yihang Zhu, Bonan Yan, Yaoyu Tao, Yuchao Yang","doi":"10.1038/s41928-025-01405-2","DOIUrl":"https://doi.org/10.1038/s41928-025-01405-2","url":null,"abstract":"Sorting is a fundamental task in modern computing systems. Hardware sorters are typically based on the von Neumann architecture, and their performance is limited by the data transfer bandwidth and CMOS memory. Sort-in-memory using memristors could help overcome these limitations, but current systems still rely on comparison operations so that sorting performance remains limited. Here we describe a fast and reconfigurable sort-in-memory system that uses digit reads of one-transistor–one-resistor memristor arrays. We develop digit-read tree node skipping, which supports various data quantities and data types. We extend this approach with the multi-bank, bit-slice and multi-level strategies for cross-array tree node skipping. We experimentally show that our comparison-free sort-in-memory system can improve throughput by ×7.70, energy efficiency by ×160.4 and area efficiency by ×32.46 compared with conventional sorting systems. To illustrate the potential of the approach to solve practical sorting tasks, as well as its compatibility with other compute-in-memory schemes, we apply it to Dijkstra’s shortest path search and neural network inference with in situ pruning.","PeriodicalId":19064,"journal":{"name":"Nature Electronics","volume":"39 1","pages":""},"PeriodicalIF":34.3,"publicationDate":"2025-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144479027","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Large-scale reconfigurable devices with defective dielectrics 具有缺陷电介质的大规模可重构器件

IF 34.3 1区工程技术

Nature Electronics Pub Date : 2025-06-13 DOI: 10.1038/s41928-025-01401-6

Wangmyung Choi, Hocheon Yoo

引用次数: 0

Electroluminescence measurement of microscale light-emitting diode wafers using a three-dimensional flexible probe head 利用三维柔性探头对微尺度发光二极管晶圆进行电致发光测量

IF 34.3 1区工程技术

Nature Electronics Pub Date : 2025-06-13 DOI: 10.1038/s41928-025-01396-0

Ziyue Wu, Xiangyu Zhang, Chengjie Jiang, Jingyi Wang, Yuqing Zhang, Rongrong Zhong, Jiaxuan Xing, Wenxing Huo, Chenxi Li, Qing Yang, Xian Huang

{"title":"Electroluminescence measurement of microscale light-emitting diode wafers using a three-dimensional flexible probe head","authors":"Ziyue Wu, Xiangyu Zhang, Chengjie Jiang, Jingyi Wang, Yuqing Zhang, Rongrong Zhong, Jiaxuan Xing, Wenxing Huo, Chenxi Li, Qing Yang, Xian Huang","doi":"10.1038/s41928-025-01396-0","DOIUrl":"https://doi.org/10.1038/s41928-025-01396-0","url":null,"abstract":"Microscale light-emitting diodes (LEDs) could be used as the backlights of next-generation displays. However, high-density, large-area displays have stringent requirements in terms of manufacturing yields and the lack of effective tools—capable of high-throughput electroluminescence detection, which can facilitate known-good-die transfer printing—limits mass production of microscale LEDs. Here we show that a three-dimensional flexible probe head (analogous to the rigid probe cards used to conduct wafer-level tests of chips in semiconducting testing) and a corresponding electroluminescence detection system can measure the electrical and optical properties of microscale LEDs without introducing surface defects. Elastic microposts in the probe head can deform adaptively to match the surface morphology of the microscale LEDs and can tolerate height differences between the LED pads. The probe head has 32 × 32 pairs of probes that can simultaneously measure 1,024 microscale LEDs using a passive-matrix driving approach in 0.5 s. The contact stress applied from the probe head to the microscale LEDs is 0.91 MPa, which is at least two orders of magnitude lower than the yield stress that will typically create surface defects. We show that the system can perform more than 1 million repeated contact measurements with negligible probe wear.","PeriodicalId":19064,"journal":{"name":"Nature Electronics","volume":"609 1","pages":""},"PeriodicalIF":34.3,"publicationDate":"2025-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144278577","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Testing microscale light-emitting diodes with a lighter touch 用更轻的触感测试微型发光二极管

IF 34.3 1区工程技术

Nature Electronics Pub Date : 2025-06-13 DOI: 10.1038/s41928-025-01403-4

Xinqin Liao, Ziquan Guo, Zhong Chen

引用次数: 0

Terahertz sensing based on the nonlinear electrodynamics of the two-dimensional correlated topological semimetal TaIrTe4 基于二维相关拓扑半金属TaIrTe4非线性电动力学的太赫兹传感

IF 34.3 1区工程技术

Nature Electronics Pub Date : 2025-06-12 DOI: 10.1038/s41928-025-01397-z

Tairan Xi, Haotian Jiang, Jiangxu Li, Yangchen He, Yuchen Gu, Carter Fox, Louis Primeau, Yulu Mao, Jack Rollins, Takashi Taniguchi, Kenji Watanabe, Daniel van der Weide, Daniel Rhodes, Yang Zhang, Ying Wang, Jun Xiao

{"title":"Terahertz sensing based on the nonlinear electrodynamics of the two-dimensional correlated topological semimetal TaIrTe4","authors":"Tairan Xi, Haotian Jiang, Jiangxu Li, Yangchen He, Yuchen Gu, Carter Fox, Louis Primeau, Yulu Mao, Jack Rollins, Takashi Taniguchi, Kenji Watanabe, Daniel van der Weide, Daniel Rhodes, Yang Zhang, Ying Wang, Jun Xiao","doi":"10.1038/s41928-025-01397-z","DOIUrl":"https://doi.org/10.1038/s41928-025-01397-z","url":null,"abstract":"The development of terahertz-sensing technologies has been limited by the lack of sensitive, broadband and fast terahertz detectors. Thermal bolometers are bulky and slow, whereas electronic terahertz detectors (such as Schottky diodes) are fast, but their sensitivity degrades quickly outside a narrow frequency window. Here, we show that a two-dimensional correlated topological semimetal, tantalum iridium telluride (TaIrTe4), has a large room-temperature nonlinear Hall effect and that the interaction between this effect and terahertz nonlinear electrodynamics can be used as a mechanism for terahertz sensing. Our photodetectors exhibit a high sensitivity (noise-equivalent power of around 1 pW Hz−1/2) and a large zero-bias responsivity (around 0.3 A W−1) over a broadband spectral range (0.1–10 THz) at room temperature with an intrinsic ultrafast response time (picoseconds). The zero-bias responsivity and noise-equivalent power performance can be further improved (to 18 A W−1 and 0.05 pW Hz−1/2, respectively) by introducing gate-tunable electron correlations.","PeriodicalId":19064,"journal":{"name":"Nature Electronics","volume":"36 1","pages":""},"PeriodicalIF":34.3,"publicationDate":"2025-06-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144268742","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

A coupled-oscillator-based Ising chip for combinatorial optimization 一种基于耦合振荡器的组合优化Ising芯片

IF 34.3 1区工程技术

Nature Electronics Pub Date : 2025-06-11 DOI: 10.1038/s41928-025-01393-3

Hüsrev Cılasun, William Moy, Ziqing Zeng, Tahmida Islam, Hao Lo, Alex Vanasse, Megan Tan, Mohammad Anees, Ramprasath S, Abhimanyu Kumar, Sachin S. Sapatnekar, Chris H. Kim, Ulya R. Karpuzcu

{"title":"A coupled-oscillator-based Ising chip for combinatorial optimization","authors":"Hüsrev Cılasun, William Moy, Ziqing Zeng, Tahmida Islam, Hao Lo, Alex Vanasse, Megan Tan, Mohammad Anees, Ramprasath S, Abhimanyu Kumar, Sachin S. Sapatnekar, Chris H. Kim, Ulya R. Karpuzcu","doi":"10.1038/s41928-025-01393-3","DOIUrl":"https://doi.org/10.1038/s41928-025-01393-3","url":null,"abstract":"Numerous practical problems—ranging from machine learning to bioinformatics—can be formulated as combinatorial optimization problems. However, the computational resources required to find an optimal solution to these problems using conventional von Neumann computers increases rapidly with problem size. Alternative solvers based on Ising machines, which directly leverage equilibrium characteristics of physical systems, offer a potential solution for such problems. Here we report a coupled-oscillator-based all-to-all-connected Ising chip that is manufactured in 65-nm complementary metal–oxide–semiconductor (CMOS) technology and operates at room temperature. The approach relies on logic-based coupling, which leads to low power consumption and a large number of all-to-all-connected spins. We show that the chip can solve representative combinatorial optimization problems in a more time- and energy-efficient manner than can optimized classical solvers in software and emerging quantum annealers. Due to its energy efficiency and all-to-all connectivity, our chip can also efficiently solve dense combinatorial optimization problems that cannot be effectively mapped or solved by quantum annealers.","PeriodicalId":19064,"journal":{"name":"Nature Electronics","volume":"70 1","pages":""},"PeriodicalIF":34.3,"publicationDate":"2025-06-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144260182","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Programmable threshold sensing in wireless devices using Ising dynamics 无线设备中使用Ising动力学的可编程阈值传感

IF 34.3 1区工程技术

Nature Electronics Pub Date : 2025-06-02 DOI: 10.1038/s41928-025-01392-4

Nicolas Casilli, Seunghwi Kim, Hussein M. E. Hussein, Ryan Tetro, Luca Colombo, Matteo Rinaldi, Philip X.-L. Feng, Andrea Alù, Cristian Cassella

{"title":"Programmable threshold sensing in wireless devices using Ising dynamics","authors":"Nicolas Casilli, Seunghwi Kim, Hussein M. E. Hussein, Ryan Tetro, Luca Colombo, Matteo Rinaldi, Philip X.-L. Feng, Andrea Alù, Cristian Cassella","doi":"10.1038/s41928-025-01392-4","DOIUrl":"https://doi.org/10.1038/s41928-025-01392-4","url":null,"abstract":"Ising machines—comprising dissipatively coupled nodes capable of emulating the behaviour of ferromagnetic spins—can form analogue computing engines that surpass the sequential processing constraints of von Neumann architectures. However, the incorporation of Ising dynamics into radio-frequency wireless technologies remains limited, especially in terms of their potential to enhance wireless sensing capabilities. Here we report a passive wireless sensor that uses Ising dynamics to accurately implement threshold sensing. The device correlates the occurrence of violations in a sensed parameter with transitions in the coupling state of two parametric oscillators acting as Ising spins. As a result, the accuracy of the device is unaffected by distortions in its input and output signals due to multipath and is less prone to clutter caused by co-site interference. We illustrate the potential of the approach in temperature threshold sensing using a microfabricated lithium niobate microelectromechanical temperature sensor to couple two radio-frequency parametric oscillators, and show that such a system allows the sensor threshold to be wirelessly reprogrammed.","PeriodicalId":19064,"journal":{"name":"Nature Electronics","volume":"9 1","pages":""},"PeriodicalIF":34.3,"publicationDate":"2025-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144193051","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Low-loss electronics with superconducting diodes 具有超导二极管的低损耗电子器件

IF 34.3 1区工程技术

Nature Electronics Pub Date : 2025-05-29 DOI: 10.1038/s41928-025-01388-0

Denis Kochan, Christoph Strunk

引用次数: 0

Federated learning using a memristor compute-in-memory chip with in situ physical unclonable function and true random number generator 采用具有原位物理不可克隆功能和真随机数生成器的记忆电阻器内存计算芯片进行联合学习

IF 34.3 1区工程技术

Nature Electronics Pub Date : 2025-05-29 DOI: 10.1038/s41928-025-01390-6

Xueqi Li, Bin Gao, Qi Qin, Peng Yao, Jiaming Li, Han Zhao, Chenji Liu, Qingtian Zhang, Zhenqi Hao, Yang Li, Dequn Kong, Jikang Xu, Jie Yang, Jianshi Tang, Yawen Niu, Xiaobing Yan, He Qian, Huaqiang Wu

{"title":"Federated learning using a memristor compute-in-memory chip with in situ physical unclonable function and true random number generator","authors":"Xueqi Li, Bin Gao, Qi Qin, Peng Yao, Jiaming Li, Han Zhao, Chenji Liu, Qingtian Zhang, Zhenqi Hao, Yang Li, Dequn Kong, Jikang Xu, Jie Yang, Jianshi Tang, Yawen Niu, Xiaobing Yan, He Qian, Huaqiang Wu","doi":"10.1038/s41928-025-01390-6","DOIUrl":"https://doi.org/10.1038/s41928-025-01390-6","url":null,"abstract":"Federated learning provides a framework for multiple participants to collectively train a neural network while maintaining data privacy, and is commonly achieved through homomorphic encryption. However, implementation of this approach at a local edge requires key generation, error polynomial generation and extensive computation, resulting in substantial time and energy consumption. Here, we report a memristor compute-in-memory chip architecture with an in situ physical unclonable function for key generation and an in situ true random number generator for error polynomial generation. Our architecture—which includes a competing-forming array operation method, a compute-in-memory based entropy extraction circuit design and a redundant residue number system-based encoding scheme—allows low error-rate computation, the physical unclonable function and the true random number generator to be implemented within the same memristor array and peripheral circuits. To illustrate the functionality of this memristor-based federated learning, we conduct a case study in which four participants cotrain a two-layered long short-term memory network with 482 weights for sepsis prediction. The test accuracy on the 128-kb memristor array is only 0.12% lower than that achieved with software centralized learning. Our approach also exhibits reduced energy and time consumption compared with conventional digital federated learning.","PeriodicalId":19064,"journal":{"name":"Nature Electronics","volume":"1 1","pages":""},"PeriodicalIF":34.3,"publicationDate":"2025-05-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144165483","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":1,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0