2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)最新文献

{"title":"Reliability growth analysis tailored for continuous process plants","authors":"S. Kar","doi":"10.1109/RAMS.2013.6517711","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517711","url":null,"abstract":"Traditional equipment-centric approach to conduct Reliability Growth Analysis (RGA) cannot be used in as-is condition in a continuous process plant. Part of this is owing to deficiencies in failure information. But mostly this is due to some special considerations typical of the operating environment of a continuous process plant. In this paper we have proposed and elaborated a practical, system-centric methodology that has taken into account all such considerations and ultimately factored them into the calculation process.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123712787","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Risk comparison method, assumptions, and issues","authors":"D. Bradt, E. A. Weisblatt","doi":"10.1109/RAMS.2013.6517690","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517690","url":null,"abstract":"Communicating the likelihood and consequence of potential risks is critical in today's business environment. A comparison of the likelihood of several different potential events can provide insight to management about factors that, if left unchecked, may cause an unwanted scenario. One method utilized to calculate the likelihood of a risk being realized is the “One-out-of-X” measure. This high-level measure is very effective for comparing different risk scenarios; however, it is important that the risk analyst provides additional information to management regarding the confidence in this value, what factors significantly influence it, and how other scenarios compare. It is also important that the team establish a risk management system that includes likelihood levels that will aid in deciding which problem areas to try and solve first. The risk management system should include likelihood levels that define where mitigation must be implemented. This system should also establish lower risk levels where mitigation can either be delayed or never implemented. The methodology outlined in this paper provides the basis for a robust risk management system.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121650571","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"An exploration of PRA methodology used in spacecraft design","authors":"C. Mattenberger, H. Nejad","doi":"10.1109/RAMS.2013.6517726","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517726","url":null,"abstract":"In order to achieve an optimal design of a complex space system that meets all constraints, the requirements placed upon the performance, mass, cost, and risk of the system must be considered, understood and traded against each other during the conceptual design of the system to avoid costly redesigns or project cancellation later in the development process. A design process that follows this tenet of risk-informed design will need detailed insight into the relative risks facing the system, as well as quantitative estimates that can be produced through probabilistic risk assessment (PRA), in order to evaluate design decisions based upon the impact to all requirements on a co-equal basis. In this study, four types of methodologies used to produce risk estimates for spacecraft and satellites are examined. These include two traditional PRA methodologies, an innovative approach, and a top-down approach, all of which are explored by using the propulsion subsystem of the Lunar Reconnaissance Orbiter (LRO) as a comparative basis for the methodologies considered. Similarities, differences, benefits, and drawbacks of various bottom-up, component-based PRA approaches and the top-down approach are elucidated in terms of the process of modeling a system, the actionable information produced for the design team, and the overall quantitative risk evaluation of the system as compared to similar heritage space systems. Results of the various PRA methodologies are examined at the level of component failure rates, single-component failure probabilities, single-function failure probabilities where redundancy exists in the design, as well as the subsystem failure probability for the nominal LRO mission. Ultimately, all of the bottom-up, component-based PRA methods capture only the risk of a mature system and miss the risk contribution of design defects, which have been shown to be key drivers of reliability in single-use developmental systems. Therefore, further steps must be taken to incorporate this contribution in future PRA methodologies.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"146 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123363933","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Understanding operational availability in performance-based logistics and maintenance services","authors":"T. Jin, Yisha Xiang, R. Cassady","doi":"10.1109/RAMS.2013.6517654","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517654","url":null,"abstract":"Performance-based service contracting is envisioned to reduce the assets ownership cost while ensuring the system performance. Operational availability is considered as the key performance measure to assess the system reliability outcome. This paper presents a unified modeling approach that comprehends eight key performance drivers underpinning the operational availability. These drivers include inherent reliability, usage rate, maintenance, spare parts, fleet size, repair-by-replacement time, and parts repair and reconditioning turn-around times. We investigate the maintenance logistics in a single-site repairable inventory setting, yet the result can be appropriately extended to more complex logistics networks. This study shows that high operational availability could be attained even under low parts availability. This finding is contradictory to the traditional belief that low operational availability is ascribed to excessive parts backorders. The study has the great potentials to shift the service business paradigm from traditional material-based contracting to performance-based contracting.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131058114","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Risk-informed maintenance for non-coherent systems","authors":"Ye Tao, Lixuan Lu","doi":"10.1109/RAMS.2013.6517648","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517648","url":null,"abstract":"Risk Importance Measures (RIMS) obtained from both qualitative and quantitative aspects of Fault Tree (FT) analysis can be used to identify weak links in a system. Information from RIMS can be used to direct resources towards the components that deserve the most attention. When RIMS are used to make maintenance-related decisions, it is referred to as risk-informed maintenance. Risk importance analysis for coherent FT has received much attention over the years. However, non-coherent FT does occur in real systems due to either the nature of the system or poor design. Non-coherent FT introduces difficulties in terms of both qualitative and quantitative assessment, and the importance analysis of noncoherent FT is rather limited. In this paper, eight most commonly used RIMS are investigated and extended to noncoherent forms. They are the Birnbaum's Measure (BM), Criticality Importance Factor (CIF), Improvement Potential (IP), Fussell-Vesely Measure (FV), Risk Achievement (RA), Conditional Probability (CP), Risk Achievement Worth (RAW) and Risk Reduction Worth (RRW). The feasibility of the extension are proved and presented throughout the analysis and applications. Furthermore, they are classified with respect to risk significance and safety significance. The CIF, IP, FV and RRW are identified as risk significant measures, while BM, RA, CP and RAW are identified as safety significant measures. Since maintenance can normally be categorized as corrective maintenance and preventive maintenance, it is concluded that risk significant measures contribute most information to corrective maintenance and safety significant measures contribute most information to preventive maintenance. An Automatic Power Control System (APCS) for an experimental nuclear reactor is used as a case study to demonstrate the theoretical development.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134220371","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Chi-Squared Accelerated Reliability Growth model","authors":"A. Feinberg","doi":"10.1109/RAMS.2013.6517750","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517750","url":null,"abstract":"A Chi-Squared Accelerated Reliability Growth (CARG) model has been developed as a new method for single- and multi-stress level reliability growth life data analysis. The model is relatively easy to apply and is very practical. The CARG method is appropriate when an exponential distribution can be assumed. The chi-squared distribution has been used as a traditional method of identifying reliability confidence bounds for the exponential failure lifetime behavior of components, assemblies, and systems and is often extended to accelerated life test data analysis. The distribution is key for assessment when observance of few or even zero failures occur in accelerated testing for estimates on reliability at a statistical significance level. It is therefore natural to consider using the chi-squared method in the application of accelerated reliability growth data analysis. Using the statistic, the model is demonstrated on a manufacturing data set consisting of single accelerated stress and multi-accelerated stress tests. Reliability growth predictions show good agreement with the product's field data.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"67 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130926387","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Research on key technologies of aircraft Two Level Maintenance System","authors":"Wang Yuanda, Xia Qing, B. Xiao Boping","doi":"10.1109/RAMS.2013.6517733","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517733","url":null,"abstract":"Aircrafts has performed Three Level Maintenance for a long time, and exposed many problems, such as maintenance system couldn't fit the aircraft self's technologies and logistical support demands, and led to the increasing of support costs. Based on it, we research the parts of key technologies on the Two Level Maintenance for modern aircraft, including support process model, simulation calculation and prediction analyses, find some useful results. The result of study is beneficial to simplified maintenance system of modern aircraft and realizing Two Level Maintenance System.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133645411","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Risk analysis of E-tourism service supply chain","authors":"Jin Qin, Lu Zhang","doi":"10.1109/RAMS.2013.6517647","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517647","url":null,"abstract":"E-tourism is becoming more popular in both developed and developing countries. With the involvement of multiple service enterprises, and the intangible, heterogeneous characteristics of e-service, the E-tourism service supply chain faces a number of risks that need to be mitigated or averted. In this paper, risks of E-tourism service supply chain are analyzed in detail from the business process point of view. A risk categorization scheme is proposed, which includes online travel agencies' endogenous risks, service supply chain's internal risks and external environmental risks. We also briefly discuss risk management method according to the proposed categorization.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114880586","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Improving product's reliability by stress derating and Design Rules Check","authors":"Y. Bot","doi":"10.1109/RAMS.2013.6517745","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517745","url":null,"abstract":"Electronic Systems Reliability Analysis is based on Failure Rates (FR), which is mostly predicted using physics of failures techniques. In fact, we assume that the “electronic design” is near to perfect, and that the FR is based only on the physical materials. However, based on field failures analysis, we have found that many failures actually occur due in large part to a poor design, and that this poor design is mostly caused by common mistakes. In this article, a new method will be introduced, which will provide guidelines to understanding the root cause of common design mistakes and eliminating them. These common design mistakes will then be transformed into a set of rules that we call a \"rule check,\" which will ensure that these very same mistakes will be detected and eliminated in new designs. Thousands of electronic board failures were collected for the duration of one year. The data was analyzed statistically, and for the 100 most important failures a root cause analysis was performed. It was found that 50 out of the 100 mistakes occurred due to errors in the design and these errors were based on common mistakes. To avoid these mistakes from reoccurring, a dictionary of rules was created which we call \"Good Design Reliability Practice\" (GDRP). The statistics show that the field failures are categorized as: - 25% are overstressed components and need to be up rated, - 35% are mistakes which increase the power dissipation and if we correct the mistake the power will be reduced, - 10% are mistakes which looks as if they are software failures but actually are hardware failures. - 30% are pure GDRP mistakes, such as pull-up /pull-down resistors, technology match, resistance/ capacitance values, power supply match etc. As of today we have successfully collected over 200 design rules, which have been grouped into five categories. These rules are used in the scanning of new designs, and significantly help eliminate the mistakes from reoccurring. Doing so dramatically increases the product's reliability (power dissipation and stress will be reduced) and robustness (design will be free from design errors). The innovation of the method is that by analyzing field failure data analysis we can setup rules which are checked in new designs.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114653733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Characteristic instantaneous relevant reversible failures and reliability of modern mass-produced electronics","authors":"D. Verbitsky","doi":"10.1109/RAMS.2013.6517721","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517721","url":null,"abstract":"Typical instantaneous relevant reversible failures (IRRF) of modern electronics and their role are defined and classified. Characteristic prevalent IRRF are exemplified and analyzed across technologies and applications. Matching interactions of parametric shifts and anomalies, imbalanced tight tolerance and low resilience system under complex stresses are shown to cause most characteristic IRRF. Their relation with project-relevant features, functions, factors and faults are discussed, as are their links with isentropic phenomena. Systemic early failure analysis (FA) is again shown to be a vital part of modern responsible and profitable quality and reliability assurance. Practical recommendations resulted in concurrent improvement of customer satisfaction and yield, as well as facilitation of operations and R&D.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128654580","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}