2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)最新文献

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Bayesian probability approach for exponential AFT 指数AFT的贝叶斯概率方法
2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517718
S. Voiculescu
{"title":"Bayesian probability approach for exponential AFT","authors":"S. Voiculescu","doi":"10.1109/RAMS.2013.6517718","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517718","url":null,"abstract":"The present paper provides a step down stress, acceleration parameter free method of testing for Reliability. The main advantages of the method are 1) optimization of the testing time by failing most of the samples at the highly accelerated level and 2) an acceleration model is not required. The approach is based on determining the cumulative distribution values as random variables which allows free adjustment of the results on the data. The paper also illustrates an experimental example.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132733565","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Evaluating disaster recovery plans using the cloud 使用云评估灾难恢复计划
2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517700
Omar H. Alhazmi, Y. Malaiya
{"title":"Evaluating disaster recovery plans using the cloud","authors":"Omar H. Alhazmi, Y. Malaiya","doi":"10.1109/RAMS.2013.6517700","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517700","url":null,"abstract":"Every organization requires a business continuity plan (BCP) or disaster recovery plan (DRP) which falls within cost constraints while achieving the target recovery requirements in terms of recovery time objective (RTO) and recovery point objective (RPO). The organizations must identify the likely events that can cause disasters and evaluate their impact. They need to set the objectives clearly, evaluate feasible disaster recovery plans to choose the DRP that would be optimal. The paper examines tradeoffs involved and presents guidelines for choosing among the disaster recovery options. The optimal disaster recovery planning should take into consideration the key parameters including the initial cost, the cost of data transfers, and the cost of data storage. The organization data needs and its disaster recovery objectives need to be considered. To evaluate the risk, the types of disaster (natural or human-caused) need to be identified. The probability of a disaster occurrence needs to be assessed along with the costs of corresponding failures. An appropriate approach for the cost evaluation needs to be determined to allow a quantitative assessment of currently active disaster recovery plans (DRP) in terms of the time need to restore the service (associated with RTO) and possible loss of data (associated with RPO). This can guide future development of the plan and maintenance of the DRP. Such a quantitative approach would also allow CIOs to compare applicable DRP solutions.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132965318","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 41
On a Weibull related distribution model with decreasing, increasing and upside-down bathtub-shaped failure rate 浴缸形故障率减小、增大和倒立的威布尔相关分布模型
2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517749
Tieling Zhang, R. Dwight, K. El-Akruti
{"title":"On a Weibull related distribution model with decreasing, increasing and upside-down bathtub-shaped failure rate","authors":"Tieling Zhang, R. Dwight, K. El-Akruti","doi":"10.1109/RAMS.2013.6517749","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517749","url":null,"abstract":"A lifetime distribution model was proposed by Dimitrakopoulou, et al. in 2007 [1]. This model has three parameters and includes the Weibull distribution as a special case. Therefore, this is a Weibull related distribution model and it has decreasing, increasing, bathtub and upside-down bathtub-shaped failure rate. Since this distribution model has more flexibility than the conventional 2- and 3-parameter Weibull distributions in modeling the lifetime data, it is of interest to have a study on its statistical characteristics and explore the real application of the model to modeling time to failure data. The objective of this paper is to investigate the parameter estimation of this 3-parameter Weibull related model by graphical approach with short discussion on its statistical characteristics. The procedure in detail for parameter estimation of the model is presented and its usefulness is demonstrated by two real examples.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124185206","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Allocating reliability & maintainability goals to NASA ground systems 分配NASA地面系统的可靠性和可维护性目标
2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517683
A. M. Gillespie, M. W. Monaghan
{"title":"Allocating reliability & maintainability goals to NASA ground systems","authors":"A. M. Gillespie, M. W. Monaghan","doi":"10.1109/RAMS.2013.6517683","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517683","url":null,"abstract":"A Reliability, Maintainability, and Availability (RMA) analysis team, supported by the National Aeronautics and Space Administration (NASA) Kennedy Space Center (KSC) Ground Systems Development and Operations (GSDO) Program, developed an RMA allocation and analysis process utilizing standard Reliability and Maintainability (R&M) allocation techniques, along with system-based knowledge, to ensure the GSDO subsystems (SS) achieve the required launch availability goal. In this paper, we will present an effective way to allocate RMA requirements that are Specific, Measureable, Attainable, Realistic, and Time-bound (SMART) [1].","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130304819","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Using reliability modeling and accelerated life testing to estimate solar inverter useful life 采用可靠性建模和加速寿命试验方法估算太阳能逆变器的使用寿命
2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517651
G. Sanaie, F. Schenkelberg
{"title":"Using reliability modeling and accelerated life testing to estimate solar inverter useful life","authors":"G. Sanaie, F. Schenkelberg","doi":"10.1109/RAMS.2013.6517651","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517651","url":null,"abstract":"Three-phase inverters are physically large, complex and expensive elements of major solar power generation systems. The inverter converts DC power created by the photovoltaic (PV) panels to AC power suitable for adding to the power grid.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"234 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127680316","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Human space mission architecture risk analysis 载人航天任务架构风险分析
2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517727
S. Go, D. Mathias, H. Nejad
{"title":"Human space mission architecture risk analysis","authors":"S. Go, D. Mathias, H. Nejad","doi":"10.1109/RAMS.2013.6517727","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517727","url":null,"abstract":"A human space flight mission is extremely dynamic in nature. A spacecraft faces multiple physical environments and is exposed to dramatically different hazards over the typical phases of a mission: from a minutes-long ascent phase, to a months-long orbital phase, and then an hours-long entry, descent and landing phase. The space transportation vehicle's configuration also changes as each of the stages of the launch vehicle's engines are ignited, burned, turned off, and jettisoned, with new stages and engines taking over the thrusting of the vehicle until the spacecraft is separated from the launch vehicle. Once in orbit, the spacecraft performs its orbital tasks and then returns to earth for safe landing of the astronauts. All the changes in the physical environments encountered during the mission and the response of the system to failures or changes in the configuration of the vehicle call for a modular, dynamic probabilistic risk model that integrates the modeling pieces and faithfully tracks the entire mission timeline in order to understand the risks to the crew across all mission phases. Using a flexible modeling framework that is capable of incorporating various levels of data fidelity, modeling inputs, and timescales allows for a risk analysis methodology that grows with the maturity of the system's design definition while capturing the risk drivers at the right levels throughout the mission.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127720063","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Optimal software rejuvenation policies 最优软件复兴策略
2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517695
R. Agepati, N. Gundala, S. Amari
{"title":"Optimal software rejuvenation policies","authors":"R. Agepati, N. Gundala, S. Amari","doi":"10.1109/RAMS.2013.6517695","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517695","url":null,"abstract":"Studies on software reliability and performance reveal that long-running software systems show an increasing failure rate and/or a progressive degradation of their performance. This phenomenon is referred to as software aging, and it may eventually lead to an unacceptable level of system performance degradation and/or crash failure. A technique called software rejuvenation can be used to counteract software aging. This technique involves occasionally terminating an application or a system, cleaning its internal state and/or its environment, and restarting it. By removing the accrued error conditions and freeing up or defragmenting operating system resources, this technique proactively prevents unexpected future system outages. Unlike downtime caused by sudden failure occurrences, the downtime related to software rejuvenation can be scheduled at the discretion of the user or administrator, typically during the middle of the night or over weekends. This paper presents a generalized condition-based software rejuvenation model that is applicable to a wide range of applications. The rejuvenation model includes a stochastic deterioration process, a set of rejuvenation actions and their effects, and a schedule inspection policy that identifies the system deterioration. The optimal rejuvenation policy that minimizes the overall cost associated with the system is obtained using Markov decision processes. With minor modifications, the model can also be used for maximizing the system availability/capacity. This paper demonstrates the proposed model and the optimization procedure using an example of a web server subject to a two-dimensional software degradation process.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129789429","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
Developing a reliability, availability and maintainability process 开发可靠性、可用性和可维护性流程
2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517730
R. Knight
{"title":"Developing a reliability, availability and maintainability process","authors":"R. Knight","doi":"10.1109/RAMS.2013.6517730","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517730","url":null,"abstract":"The Department of Defense (DoD) has put an increased focus on reliability during system acquisition and development. This is due to historically poor reliability performance which has significantly increased sustainment costs for systems that have been built over the last 25 years. The Director of the Department of Operational Test and Evaluation has written a memorandum, dated June 30, 2010 with subject “State of Reliability” discussing these concerns. Training time for a new reliability engineer can be reduced by providing the engineer with a documented process guide for reliability engineering activities. This process guide provides guidance for each reliability task, and relates the task to the DoD acquisition life cycle phase, which enhances the training for new graduates as well as experienced reliability engineers that lack exposure to DoD programs. Maintaining a standard set of modeling and simulation tools produces consistent analytical products and improves the efficiency within the organization by eliminating redundant modeling packages. Documenting the Reliability, Availability and Maintainability (RAM) process in a guide allows the reliability group to provide consistent and sound technical guidance to any DoD project. This process guide also reduces the transition time for RAM Subject Matter Experts (SMEs) when entering a new project that may be in a different phase of the DoD life cycle. The process guide also improves the awareness, at the program level, of the RAM efforts that are required to ensure reliability is integrated into product development.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117234301","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Life prediction of multiple performance parameters ADT based on multidimensional time series analysis 基于多维时间序列分析的多性能参数ADT寿命预测
2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517670
Li Wang, Zaiwen Liu, B. Wan, Youhu Zhao
{"title":"Life prediction of multiple performance parameters ADT based on multidimensional time series analysis","authors":"Li Wang, Zaiwen Liu, B. Wan, Youhu Zhao","doi":"10.1109/RAMS.2013.6517670","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517670","url":null,"abstract":"For long lifetime and high reliability products, it is difficult to obtain failure data in a short time period. Hence, Accelerated Degradation Testing (ADT) is presented to deal with the cases where no failure time data could be obtained but degradation data of parameters of the product are available. At present, the ADT life prediction method is utilized primarily with feedback from a single performance parameter ADT dataset. However, for most products, multiple performance parameters of these products will degrade with time, leading to failure. It is important to note that often the products various performance parameters will interact with each other as the performance degrades. Hence, a correct life prediction based on ADT data must take into account the integrated effect of a product's multiple performance parameters and the random effect of environmental variables. In the literature, such as in the noted references [1-5], ADT life prediction is studied using time series methods due to its excellent capability of stochastic and periodic information mining. However, life predictions using the time series method in present literature are all based upon a one-dimensional time series analysis. To take into account multiple dimensions of product performance degradation, it is important to study these parameters using an ADT life prediction based on a multidimensional time series analysis method.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121276552","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A robust design method to improve performance reliability based on degradation characteristic 一种基于退化特性提高性能可靠性的稳健设计方法
2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS) Pub Date : 2013-05-23 DOI: 10.1109/RAMS.2013.6517622
Yuege Zhou, X. Ye, G. Zhai
{"title":"A robust design method to improve performance reliability based on degradation characteristic","authors":"Yuege Zhou, X. Ye, G. Zhai","doi":"10.1109/RAMS.2013.6517622","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517622","url":null,"abstract":"Component performance degradation and parameter drift due to the effects of environmental condition and operating stress causes the performance measures of electronic system to deviate from the initial design specifications. The non-conformance of performance measures over time is referred as performance reliability, or soft failure. This paper presents a new robust design method for electronic system based on component degradation to improve the system performance reliability. Experiment design and sensitivity analysis are employed to determine the critical component parameters that lead to the deviation of system performance measures. Degradation path models of critical components are established by accelerated degradation test. Using the degradation path models, the degradation characteristic of system performance are evaluated using Monte Carlo simulation. Limited by design specifications, the degradation measure distribution and performance reliability are predicted. Then, the normal and tolerance parameters of sensitive components are optimized by robust design to improve performance reliability and time to soft failure. Finally, a practical implementation of the proposed method is validated by optimizing an LED driver, which shows the practicability and efficiency of the method.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122576073","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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