Bayesian probability approach for exponential AFT

Abstract

The present paper provides a step down stress, acceleration parameter free method of testing for Reliability. The main advantages of the method are 1) optimization of the testing time by failing most of the samples at the highly accelerated level and 2) an acceleration model is not required. The approach is based on determining the cumulative distribution values as random variables which allows free adjustment of the results on the data. The paper also illustrates an experimental example.