2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)最新文献

{"title":"Condition monitoring and identification of failure modes of subsea electrical equipments","authors":"H. Ang, T. Markeset, T. O. Bang-Steinsvik","doi":"10.1109/RAMS.2013.6517634","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517634","url":null,"abstract":"Offshore oil and gas field development is shifting to the usage of subsea systems where the field is located either in deepwater area or close to existing fields and can be connected to existing productions systems. Subsea field development is trending towards subsea processing systems: the oil and gas processing equipments normally installed in the surface facility will be placed on the seabed closer to the well. This strategy is expected to increase the reservoir recovery rate, especially in marginal fields, and also to reduce total capital expenditure by eliminating the topside processing cost at the same time. Meanwhile, the processing equipment normally requires a high electrical power supply, for which the dedicated subsea electrical power and distribution units are required.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"164 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116914196","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Role of human factors / usability engineering in medical device design","authors":"V. Hegde","doi":"10.1109/RAMS.2013.6517650","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517650","url":null,"abstract":"There is mounting evidence that medical device use error is a significant factor in thousands of patient deaths and injuries. Doctors, nurses and patients make mistakes while using medical devices that result in patient harm. Poor human factors design is one of the root causes of the problem. The Food and Drug Administration (FDA) and other International Regulatory agencies identified that manufacturers must pay more attention to human factors at the earliest stages of product design and development, when user input can make a difference. To this end, the FDA has developed guidance documents and recognized standards (e.g. AAMI/ANSI HE75:2009, Human Factors Engineering-Design of Medical Devices and IEC 62366, Medical Devices - Application of Usability Engineering to Medical Devices) to help medical device manufacturers understand and use human factors engineering during the development and validation of medical devices.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116986177","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A lifetime model for piezoceramic actuators in adaptronic systems","authors":"D. Flaschentrager, J. Nuffer","doi":"10.1109/RAMS.2013.6517628","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517628","url":null,"abstract":"This work presents a lifetime model for piezoelectric actuators by combination of previous available information/expertise and tailored tests in order to save test time and costs. It is shown that the assumptions drawn from expertise comply with the experimental results. Therefore, it was possible to set up a lifetime model which uses linear interpolation between given data points to assess the lifetime at any combination of relative humidity and temperature within the range covered by the model. The lifetime model is applied to a selected piezoceramic multilayer actuator (Ceramtec SP 505 7×7×32.4). The results of this application are presented and discussed. In general, the application of this method allows a cheaper lifetime assessments of piezoceramic actuators in early development stages of adaptronic systems.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127091105","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Physics of failure for portable electronic devices in military applications","authors":"E. Habtour, B. Werner, A. Hilburn, H. I. Saraidaridis","doi":"10.1109/RAMS.2013.6517620","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517620","url":null,"abstract":"In military applications electronic devices play a vital role in the success of a mission. These devices which provide control, guidance, communication, and reconnaissance are critical components in modern unmanned vehicular applications. The current trend is to provide a human interface to control theses systems via portable devices. This trend in modern warfare has increased the complexity of electronic equipment, especially in low volume, highly sophisticated, and dense electronic systems. These modern devices take advantage of the remarkable advances made in low cost commercial electronics. This current movement of using commercial-off-the-shelf (COTS) electronics and devices for military applications has led to concerns about their reliability in harsh battlefield environments. The increase in the use of COTS components lead to the need to improve the reliability of these components by understanding the failure mechanisms due to thermal loads, dynamic vibration, and shock through Physics of Failure (PoF) analyses.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"53 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125349442","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Reliability analysis in model-driven development of embedded systems","authors":"D. S. Velasco, T. Kuhn, S. Kemmann","doi":"10.1109/RAMS.2013.6517638","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517638","url":null,"abstract":"Numerous techniques for modeling reliability aspects are applicable in research and industry. However, reliability models are often specialized artifacts; they are created once by specialists and then tend to remain unmaintained, yielding outdated and inaccurate models after short periods of time. This degradation of reliability models can be prevented by integrating them with design models, which improves their visibility to developers and keeps them consistent with other artifacts. Our UML-based approach presented in this paper supports this by enabling integrated modeling of reliability aspects and other, e.g. functional and physical aspects of systems under development. This is achieved by extending the UML through profiles that support the modeling of reliability aspects. We present a notation for the modeling of functions and function networks in combination with Dynamic Reliability Block Diagrams (DRBDs). DRBDs extend standard reliability block diagrams with the possibility of modeling dynamic behaviors and dependencies. Integration of these aspects into a model-driven approach improves model traceability and consistency, and enables integrated reliability modeling.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116172211","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"FRACAS improves production bottom line","authors":"E. Cota, L. Gullo","doi":"10.1109/RAMS.2013.6517762","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517762","url":null,"abstract":"Failure Reporting Analysis and Corrective Action System (FRACAS) process and procedures provide long-term corrective actions and short-term directives that reduce the cost of rework, increase production throughput and reduce lost material. Each failure mode adds a Failure Period (FP) to the normal build operation process cost, involving cost for troubleshooting and rework activities, which increases the Unit Production Costs (UPC). Long-term corrective actions eliminate failure modes, which reduce their inter-arrival rate, thereby reducing the number of tested units that deviate from the normal production process flow and enter an FP. Short-term directives characterize failure modes in such a manner as to provide a deterministic set of troubleshooting and rework procedures to restore the Unit Under Test (UUT) to performance acceptability and therefore reduce the FP cost and the number of tested units that enter a troubleshooting backlog.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128335275","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Sensitivity testing and logit analysis: Two recent armaments engineering case-studies","authors":"D. Ray, E. Golden, C. Drake","doi":"10.1109/RAMS.2013.6517643","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517643","url":null,"abstract":"Efficient statistical techniques for designing and analyzing experiments are often misunderstood or underutilized, despite possessing great potential when well-informed decision-making and significant cost-savings are desired. Destructive testing with binary response data is a `worst-case' scenario with regards to cost and efficiency; however, in armaments engineering (especially with explosives, energetic mixes, propellants, pyrotechnics, and other one-shot devices) binary response data is often all that is available. This paper illustrates modern methods and best-practices to employ when dealing with these types of analyses, and contrasts two very different types of testing strategies applied to the munitions used in training and battle by the Warfighter. First, we introduce the topic of test design and experimentation. To motivate the subject and illustrate some basic aspects of sensitivity testing, we present an example common to the general public: impact-resistant cases for smart-phones. Next, we elaborate on some of the finer details of Logit Analysis/Binary Logistic Regression and Generalized Linear Models (GLM), while highlighting some of the mathematical underpinnings inherent in these methods. An overview of testing strategies follows, which compares some of the different methods available for data generation. These methods can be roughly divided into two groups - those dealing with pre-manufactured test samples, and those where sequential testing is an option. Sequential tests are generally applicable when the stress level of interest is adjustable during the test's execution, which, with regard to sample size, allows for a more efficient test. Then we detail two recent successful examples in armament munitions testing: one where sequential testing was not possible (9mm ammunition propellant critical threshold development), and one where sequential testing was utilized (NMT - Networked Munition Technology). Finally, we discuss some best-practices, limitations, and rules-of-thumb to be mindful of when considering these methods for different applications.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124963052","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Superior reliability prediction in design and development phase","authors":"R. Kanapady, R. Adib","doi":"10.1109/RAMS.2013.6517621","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517621","url":null,"abstract":"High demanded reliable components or systems projects necessitate reliability prediction in early design and development phase. Historically reliability predictions are performed using standardization of the technique such as MIL-HDBK-217 or similar handbook, which in many cases has produced inaccurate reliability results. Today's complex designs, which have intricate interfaces and boundaries, cannot rely on these methods to predict reliability. This paper presents superior reliability prediction approach for design and development of projects that demands high reliability where traditional prediction approach has failed to do the job. The effectiveness of the proposed approach is illustrated with a suitable example of solder ball failures on a silicon chip and circuit board. Reliability of solder ball has been accurately predicted. Sensitivity analysis, which determines factors that can mitigate or eliminate the failure mode(s) has been performed. Probabilistic analysis such as the burden capability method is employed for assessing the probability of failure mode occurrences, which provides a structured approach to ranking of the failure modes, based on a combination of their probability of occurrence and severity of their effects. The effective number of simulation runs for various random variables and how to compute the life is also presented.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130556765","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Exposing software security and availability risks for commercial mobile devices","authors":"Ryan V. Johnson, Zhaohui Wang, A. Stavrou, J. Voas","doi":"10.1109/RAMS.2013.6517735","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517735","url":null,"abstract":"The advent of smaller, faster, and always connected handheld devices along with the ever-increasing reliance on technology for our everyday activities have introduced novel threats and risks. Beyond hardware security another primary factor that affects the reliability of the device is mobile applications. Indeed, the shift to smart commercially available mobile devices has created a pressing need for understanding the risks in using third-party mobile code running on the mobile devices. This new generation of smart devices and systems, including iPhone and Google Android, are powerful enough to accomplish most of the user tasks previously requiring a personal computer. In our paper, we discuss the cyber threats that stem from these new smart device capabilities and the on-line application markets for mobile devices. These threats include malware, data exfiltration, exploitation through USB, and user and data tracking. In this manuscript, we present our efforts towards a framework for exposing the functionality of a mobile application through a combination of static and dynamic program analysis that attempts to explore all available execution paths including libraries. We verified our approach by testing a large number of Android applications with our dynamic analysis framework to exhibit its functionality and viability. The framework allows complete automation of the execution process so that no user input is required. We also discuss how our static analysis output can be used to inform the execution of the dynamic analysis. Our approach can serve as an extensible basis to fulfill other useful purposes such as symbolic execution, program verification, interactive debugger, and other approaches that require deep inspection of an Android application. In summary, we believe that our efforts are the beginning of a long journey to asserting and exposing the risks of commercially available mobile devices. Our future work will include non-Android platforms.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129073312","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Reliability analysis of a direct-liquid cooling system of direct drive permanent magnet synchronous generator","authors":"M. Polikarpova, S. Semken, J. Pyrhonen","doi":"10.1109/RAMS.2013.6517682","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517682","url":null,"abstract":"Wind turbines intended for electricity production are growing in power capacity with each new generation. At the same time, wind farm economics is demanding increased reliability to minimize costs and maximize productivity. These trends are driving a need for more powerful and more reliable energy conversion, and the DD-PMSG is quickly becoming the standard wind turbine generator. Larger DD-PMSGs must be liquid cooled to meet upcoming power capacity demands without exceeding practical limits for size, weight, and capital cost. However, liquid cooling is a new technology for wind turbines and its impact on reliability must be evaluated. This paper presents a reliability analysis for a liquid-cooled 8 MW DD-PMSG coupled with primary and secondary liquid coolant systems. Reliability has been calculated analytically and assessed based on the following reliability metrics: MTBF, MDT, MTTF, failure intensity, and availability.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123729253","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}