{"title":"A prognostic maintenance policy - effect on component lifetimes","authors":"A. Van Horenbeek, L. Pintelon","doi":"10.1109/RAMS.2013.6517761","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517761","url":null,"abstract":"Industrial manufacturing systems are becoming more complex; this complexity introduces additional interdependencies between components and systems. To cope with this, new maintenance policies like condition monitoring and prognostics are developed to predict the remaining useful life (RUL) of components. However, decision making based on these predictions is a still underexplored area of maintenance management. The objective of this paper is to quantify the added value of prognostic information (RUL) in maintenance decision making for multi-component systems considering different levels of inter-component dependence (i.e. economic, structural and stochastic). Furthermore, the effect of implementation of the prognostic maintenance policy on the component lifetimes is investigated, as generally in literature the use of prognostics in maintenance scheduling is perceived as to increase component lifetimes. A dynamic prognostic maintenance policy is developed, which takes into account the real component degradation and inter-component dependencies to optimally plan maintenance while minimizing the long-term average maintenance cost per unit time. The added-value of scheduling maintenance actions based on prognostic information is determined by comparing it to two other conventional maintenance policies, these are: age-based preventive maintenance without grouping and age-based preventive maintenance with grouping of maintenance activities. The ability of the prognostic maintenance policy to react to different and changing deterioration patterns and dependencies between all considered components is validated and illustrated by a real life case study on a multi-component manufacturing system. The results show that the developed dynamic prognostic maintenance policy reduces the long-term maintenance costs. Moreover, it is shown that the magnitude of this cost reduction and increase or decrease in component lifetimes depends on the component dependencies.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121545261","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A novel risk assessment technology based on ALARP criterion","authors":"Liang Guan, J. Jiao","doi":"10.1109/RAMS.2013.6517633","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517633","url":null,"abstract":"Risk assessment is a comprehensive evaluation process for a system's total risk level, and an important part of system safety management and risk decision. In order to select the best risk countermeasures and ensure the rationality and feasibility of the project objectives, the risk assessment criterion should be selected carefully to comprehend the risk and make an objective decision correctly. There exist several criterions for risk assessment currently, which consider different aspects respectively, such as quality, feasibility and cost effectiveness, etc. Different criterions adapt to different ranges of applications and need different application conditions. Therefore, the risk assessment criterion should be chosen carefully according to the assessment objects and purposes to be achieved.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131355490","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"What reliability engineers should know about space radiation effects","authors":"R. DiBari","doi":"10.1109/RAMS.2013.6517723","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517723","url":null,"abstract":"Radiation induced failure and degradation modes depend critically on the application as well as the component technology, so it is essential that radiation, component, design, and system engineers work together, preferably starting early in a program, to ensure critical applications are addressed in time to maximize the probability of mission success. Reliability engineers should work with the radiation effects engineer to incorporate radiation induced failure modes into their analysis. The TID and displacement damage testing and analysis can be incorporated into the parts stress derating analysis as a parameter shift by the percentage determined by testing. There are several destructive single event modes (SEL, SEGR, SEB) that need to be included in an FMEA, see table 1. For susceptible components in your design as well as specific failure modes, consult the radiation Effects Engineer on your project.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130258811","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Availability maximization and cost study in multi-state systems","authors":"I. Maatouk, E. Châtelet, N. Chebbo","doi":"10.1109/RAMS.2013.6517661","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517661","url":null,"abstract":"The paper presents a method for determining an optimal loading in series-parallel systems. The optimal loading is aimed at achieving the greatest possible expected system availability subject to required demand constraint. Then the corresponding system cost is deduced. We consider that system cost is a combination of downtime cost (loss of productivity), and repair cost (supposed proportional to repair time). The former is affected by a penalty value which reflects the importance of downtime cost with respect to repair cost. The model takes into account the relationship between the element failure rate and its corresponding load (element capacity). The universal generating function model is used to assess the performance distribution of the entire system and the system availability (knowing the probability of each performance level). Then, the unavailability and the repair time are estimated in order to study the system cost. The optimization is done for different values of required demand. The effect of required demand on the system availability and system cost is studied. The optimization technique is based on the genetic algorithm in order to determine the optimal load distribution. An illustrative example is presented.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134309615","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Remaining useful life prediction of MEMS sensors used in automotive under random vibration loading","authors":"Yue Liu, Bo Sun","doi":"10.1109/RAMS.2013.6517655","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517655","url":null,"abstract":"The Micro-Electro-Mechanical Systems (MEMS, such as gyros or accelerometers) applied in modern automotive usually work in relatively critical environmental conditions, such as random vibration, shock/high impact, and extreme temperature. The package and interconnection of MEMS are critical concerns that influence the reliability and performance of MEMS sensors. This paper focuses on a prediction methodology based on finite element analysis and random vibration simulation to study the reliability and the remaining useful life prediction of package and interconnection of MEMS. The results show that solder joint is the weakest link which is subject to fatigue failures. Damage accumulation for multiple vibration loadings was calculated using Miner's rule. The method for remaining useful life prediction is discussed.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"77 2 Suppl 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134463634","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"On some properties of a reliability growth planning model","authors":"P. Ellner, N. Herbert","doi":"10.1109/RAMS.2013.6517728","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517728","url":null,"abstract":"DoD Directive-Type Memorandum (DTM) 11-003-Reliability Analysis, Planning, Tracking, and Reporting, March 21, 2011 [1], applies to all major DoD developmental acquisition programs. This DTM requires that reliability growth curves (RGC) for such programs be included in the Systems Engineering Plan (SEP) at Milestone A, and be updated in the Test and Evaluation Master Plan (TEMP) beginning at Milestone B. The RGC is to “reflect the reliability growth strategy and be employed to plan, illustrate, and report reliability growth.” Additionally, the Office of the Assistant Secretary of the Army for Acquisition, Logistics, and Technology (ASA(ALT)) issued a Memorandum dated June 26, 2011[2], addressing the subject “Improving the Reliability of U.S. Army Materiel Systems.” This document states that “Program Managers (PMs) of all Acquisition Category I (ACAT I) systems and for ACAT II systems where the sponsor has determined reliability to be an attribute of operational importance shall place reliability growth planning curves in the SEP, TEMP, and Engineering and Manufacturing (EMD) contracts and ensure that U.S. Army systems are resourced to accomplish this requirement.” The ASA(ALT) document stipulates that “Reliability growth planning is quantified and reflected through a reliability growth planning curve using the Planning Model based on Projection Methodology (PM2).” The document also states “Where warranted by unique system characteristics, the Army Test and Evaluation Command (ATEC), in consultation with the Project Manager (PM), may specify an alternative reliability growth planning method.”","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"148 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133826986","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Redundancy modeling for the X-Sat microsatellite system","authors":"Yin-Liong Mok, C. Goh, R. C. Segaran","doi":"10.1109/RAMS.2013.6517756","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517756","url":null,"abstract":"X-Sat, the first microsatellite indigenously developed in Singapore, was launched in April 2011. Following a series of checkouts, the satellite was declared operational mid Jun 2011. From then on, X-Sat was expected to go on operating for up to three years, totally unattended in the vacuum and temperature extremes of the space environment. Its isolation in space imposed a high reliability requirement for X-Sat. Redundancy to deal with single-point-failure was implemented throughout the X-Sat microsatellite system, whether it was hot, cold or k/n redundancies. If redundancy was not possible at the subsystem or unit level, then some form of redundancy was implemented at the component or parts level.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124171104","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Practical applications of mixture models to complex time-to-failure data","authors":"Ke Zhao, D. Steffey","doi":"10.1109/RAMS.2013.6517714","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517714","url":null,"abstract":"Statistical time-to-failure analysis is a very powerful and versatile analytical tool available to reliability engineers and statisticians for understanding and communicating the failure risk and reliability of a component, device, or system. The typical approach to characterizing time to failure involves fitting a parametric distribution, such as a Weibull probability function, using historical data on sales and records of failure incidents since the launch of a product. However, such modeling assumes that each deployed unit has an equal chance of failing by any specified age. Such assumptions are often violated when two or more subpopulations exist but cannot be identified and analyzed separately. For example, production process changes, defects generated during component manufacturing, errors in the assembly process, variation of consumer behavior, and variation of operating environmental conditions can all result in significant heterogeneity in performance best described by multiple time-to-failure distributions. Available information does not always exist to separate such subpopulations. Neglecting to account for differences in time-to-failure distributions can lead to erroneous interpretations and predictions. Weibull mixture models can characterize such complex reliability data in situations when segregating subpopulations is impractical. This paper presents three case studies that successfully applied mixture modeling to field reliability data that could not be adequately modeled by standard time-to-failure distributions for homogeneous product populations.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124305225","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Models and methods for determining storage reliability","authors":"L. Gullo, A. Mense, J. Thomas, P. Shedlock","doi":"10.1109/RAMS.2013.6517704","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517704","url":null,"abstract":"Current dormant storage reliabiliy prediction methods are out dated and may not represent current technology. Some customers are concerned the data supporting the storage reliability prediction method are too old and not reflective of the current technology capability. This paper provides an approach and documents the results of an ongoing case study that uses a binary logistic regression (BLR) model (both classical and Bayesian) to assess recent system failures during non-operating storage and non-operating transportation. Both non-operational and operational system failures were considered in the analysis to determine presence of wear-out mechanisms and degradation, which may cause operational failures. As described in IEEE Std 1413 [1], the usefulness of a reliability prediction is based on how the prediction is developed and how well the prediction is prepared, interpreted, and applied. Reliability predictions are affected by the accuracy and completeness of the information provided to perform the prediction and the methods used to complete the prediction. The benefit of the BLR model is that it provides consistent and repeatable results that provide increased customer confidence in products.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"276 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124447022","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
B. O’Halloran, D. Jensen, I. Tumer, T. Kurtoglu, R. Stone
{"title":"A framework to generate fault-based behavior models for complex systems design","authors":"B. O’Halloran, D. Jensen, I. Tumer, T. Kurtoglu, R. Stone","doi":"10.1109/RAMS.2013.6517658","DOIUrl":"https://doi.org/10.1109/RAMS.2013.6517658","url":null,"abstract":"Fault analysis has been identified as a crucial step during the design process. Any complex design problem requires careful consideration of fault modes, fault mechanisms, propagation of faults, etc. The verification and validation efforts in complex systems design can be improved by modeling faulty behavior. This can be done by using a library of pre-constructed faulty behavior models. Currently, a major limitation for modeling performance in complex systems design is that libraries only use nominal component behavior. Strictly using nominal behavior, as opposed to faulty behavior, leads to design uncertainty and poor verification and validation. In a reliability sense, the traditional method for dealing with uncertainty is to over-design the system. While this leads to a workable solution, it is not optimized in terms of design attributes and leads to wasted resources. This paper proposes an alternative method to capture faulty behavior by developing a framework to create component behavior models, with the goal of ultimately increasing design verification and validation during complex systems design. An example shows the implementation of the frictional wear fault mechanism for a gear component. While the results can be trivial for an individual component, the purpose of these models is to tackle complex systems design where the change in performance is measured at the system level.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124590642","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}