Improving product's reliability by stress derating and Design Rules Check

Y. Bot
{"title":"Improving product's reliability by stress derating and Design Rules Check","authors":"Y. Bot","doi":"10.1109/RAMS.2013.6517745","DOIUrl":null,"url":null,"abstract":"Electronic Systems Reliability Analysis is based on Failure Rates (FR), which is mostly predicted using physics of failures techniques. In fact, we assume that the “electronic design” is near to perfect, and that the FR is based only on the physical materials. However, based on field failures analysis, we have found that many failures actually occur due in large part to a poor design, and that this poor design is mostly caused by common mistakes. In this article, a new method will be introduced, which will provide guidelines to understanding the root cause of common design mistakes and eliminating them. These common design mistakes will then be transformed into a set of rules that we call a \"rule check,\" which will ensure that these very same mistakes will be detected and eliminated in new designs. Thousands of electronic board failures were collected for the duration of one year. The data was analyzed statistically, and for the 100 most important failures a root cause analysis was performed. It was found that 50 out of the 100 mistakes occurred due to errors in the design and these errors were based on common mistakes. To avoid these mistakes from reoccurring, a dictionary of rules was created which we call \"Good Design Reliability Practice\" (GDRP). The statistics show that the field failures are categorized as: - 25% are overstressed components and need to be up rated, - 35% are mistakes which increase the power dissipation and if we correct the mistake the power will be reduced, - 10% are mistakes which looks as if they are software failures but actually are hardware failures. - 30% are pure GDRP mistakes, such as pull-up /pull-down resistors, technology match, resistance/ capacitance values, power supply match etc. As of today we have successfully collected over 200 design rules, which have been grouped into five categories. These rules are used in the scanning of new designs, and significantly help eliminate the mistakes from reoccurring. Doing so dramatically increases the product's reliability (power dissipation and stress will be reduced) and robustness (design will be free from design errors). The innovation of the method is that by analyzing field failure data analysis we can setup rules which are checked in new designs.","PeriodicalId":189714,"journal":{"name":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-05-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2013 Proceedings Annual Reliability and Maintainability Symposium (RAMS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/RAMS.2013.6517745","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

Electronic Systems Reliability Analysis is based on Failure Rates (FR), which is mostly predicted using physics of failures techniques. In fact, we assume that the “electronic design” is near to perfect, and that the FR is based only on the physical materials. However, based on field failures analysis, we have found that many failures actually occur due in large part to a poor design, and that this poor design is mostly caused by common mistakes. In this article, a new method will be introduced, which will provide guidelines to understanding the root cause of common design mistakes and eliminating them. These common design mistakes will then be transformed into a set of rules that we call a "rule check," which will ensure that these very same mistakes will be detected and eliminated in new designs. Thousands of electronic board failures were collected for the duration of one year. The data was analyzed statistically, and for the 100 most important failures a root cause analysis was performed. It was found that 50 out of the 100 mistakes occurred due to errors in the design and these errors were based on common mistakes. To avoid these mistakes from reoccurring, a dictionary of rules was created which we call "Good Design Reliability Practice" (GDRP). The statistics show that the field failures are categorized as: - 25% are overstressed components and need to be up rated, - 35% are mistakes which increase the power dissipation and if we correct the mistake the power will be reduced, - 10% are mistakes which looks as if they are software failures but actually are hardware failures. - 30% are pure GDRP mistakes, such as pull-up /pull-down resistors, technology match, resistance/ capacitance values, power supply match etc. As of today we have successfully collected over 200 design rules, which have been grouped into five categories. These rules are used in the scanning of new designs, and significantly help eliminate the mistakes from reoccurring. Doing so dramatically increases the product's reliability (power dissipation and stress will be reduced) and robustness (design will be free from design errors). The innovation of the method is that by analyzing field failure data analysis we can setup rules which are checked in new designs.
通过应力降额和设计规则校核提高产品的可靠性
电子系统可靠性分析是基于故障率(FR)的,而故障率大多是利用物理故障技术来预测的。事实上,我们假设“电子设计”接近完美,而FR仅基于物理材料。然而,通过对现场故障的分析,我们发现很多故障实际上很大程度上是由于设计不良造成的,而这种设计不良大多是由常见的错误造成的。在本文中,将介绍一种新的方法,它将为理解常见设计错误的根本原因并消除它们提供指导。然后将这些常见的设计错误转化为一组我们称之为“规则检查”的规则,这些规则将确保在新设计中检测并消除这些相同的错误。在一年的时间里收集了数千个电子电路板故障。对数据进行统计分析,并对100个最重要的故障进行根本原因分析。结果发现,100个错误中有50个是由于设计错误造成的,这些错误是基于常见错误。为了避免这些错误再次发生,我们创建了一个规则字典,我们称之为“良好设计可靠性实践”(GDRP)。统计数据表明,现场故障被分类为:- 25%是压力过大的组件,需要提高额定,- 35%是增加功耗的错误,如果我们纠正错误,功率将降低,- 10%是错误,看起来好像是软件故障,但实际上是硬件故障。- 30%是纯粹的GDRP错误,例如上拉/下拉电阻,技术匹配,电阻/电容值,电源匹配等。到目前为止,我们已经成功收集了200多条设计规则,并将其分为五大类。这些规则用于新设计的扫描,并显著地帮助消除重复出现的错误。这样做极大地提高了产品的可靠性(功耗和应力将减少)和健壮性(设计将免于设计错误)。该方法的创新之处在于,通过对现场故障数据的分析,我们可以建立规则,并在新的设计中进行校核。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信