Characteristic instantaneous relevant reversible failures and reliability of modern mass-produced electronics

Abstract

Typical instantaneous relevant reversible failures (IRRF) of modern electronics and their role are defined and classified. Characteristic prevalent IRRF are exemplified and analyzed across technologies and applications. Matching interactions of parametric shifts and anomalies, imbalanced tight tolerance and low resilience system under complex stresses are shown to cause most characteristic IRRF. Their relation with project-relevant features, functions, factors and faults are discussed, as are their links with isentropic phenomena. Systemic early failure analysis (FA) is again shown to be a vital part of modern responsible and profitable quality and reliability assurance. Practical recommendations resulted in concurrent improvement of customer satisfaction and yield, as well as facilitation of operations and R&D.