{"title":"Comparison of numerical aperture increasing lens and standard subsurface microscopy","authors":"S. Ippolito, B. Goldberg, M. Unlu","doi":"10.1109/LEOS.2001.969044","DOIUrl":"https://doi.org/10.1109/LEOS.2001.969044","url":null,"abstract":"Subsurface inspection of a Si integrated circuit (IC) by a Numerical Aperture Increasing Lens (NAIL) microscope has yielded a lateral spatial resolution of better than 0.23 /spl mu/m. We compare NAIL microscopy to standard subsurface microscopy using the Hamamatsu /spl mu/AMOS-200, IC Failure Analysis System. The NAIL improves the microscope's lateral spatial resolution from /spl sim/1.7 /spl mu/m to /spl sim/0.3 /spl mu/m. It is difficult to obtain the longitudinal spatial resolution because the sample has multiple longitudinal dielectric interfaces.","PeriodicalId":18008,"journal":{"name":"LEOS 2001. 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society (Cat. No.01CH37242)","volume":"52 1","pages":"774-775 vol.2"},"PeriodicalIF":0.0,"publicationDate":"2001-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75185816","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Residual stress in silica optical fiber preforms with various core dopants, and post mechanical processes","authors":"W. Shin, K. Oh","doi":"10.1109/LEOS.2001.969108","DOIUrl":"https://doi.org/10.1109/LEOS.2001.969108","url":null,"abstract":"We report the analysis and measurement on the residual stress in various types of optical fiber preforms to investigate stress variation due to dopant type, their distribution in the cores and post mechanical processes such as preform elongation and over jacketing. To analyze the preform residual stress, an automated residual stress measurement system was also developed based on modified polariscope.","PeriodicalId":18008,"journal":{"name":"LEOS 2001. 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society (Cat. No.01CH37242)","volume":"26 1","pages":"901-902 vol.2"},"PeriodicalIF":0.0,"publicationDate":"2001-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89257307","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Far- and near-field observation of whispering gallery modes in 1.7-2.9 /spl mu/m microdisk lasers","authors":"D. J. Shin, H. Ryu, S. Kim, H. Park, Y.H. Lee","doi":"10.1109/LEOS.2001.968987","DOIUrl":"https://doi.org/10.1109/LEOS.2001.968987","url":null,"abstract":"Summary form only given. We present novel measurements on the lasing modes in microdisk lasers, which provide comprehensive features on out-coupling of WGMs in far- and near-field regimes. The far-field emission patterns are analyzed in polarization-resolved two-dimensional(2-D) angular distribution measurements in the full half space. The near-field emission patterns are analyzed in spectrally resolved near-field scanning optical microscopy (NSOM). Our microdisk lasers are built on a thin InGaAsP slab waveguide structure high index (n=3.4) with an active layer containing a compressively strained multiple quantum well (QW).","PeriodicalId":18008,"journal":{"name":"LEOS 2001. 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society (Cat. No.01CH37242)","volume":"142 1","pages":"661-662 vol.2"},"PeriodicalIF":0.0,"publicationDate":"2001-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85376122","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Widely tunable fiber ring laser with EDFA/SOA","authors":"Lei Xu, B.C. Wang, V. Baby, I. Glesk, P. Prucnal","doi":"10.1109/LEOS.2001.968852","DOIUrl":"https://doi.org/10.1109/LEOS.2001.968852","url":null,"abstract":"We compared the performance of the EDFA and the SOA in a wavelength tunable fiber ring structure. Wide tuning ranges of 25 nm and 35 nm are achieved with a fiber ring laser using EDFA and SOA, respectively. The laser using the SOA has a broader wavelength tuning range and a stronger red shift to L-band.","PeriodicalId":18008,"journal":{"name":"LEOS 2001. 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society (Cat. No.01CH37242)","volume":"199 1","pages":"421-422 vol.2"},"PeriodicalIF":0.0,"publicationDate":"2001-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80076020","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
M. Hofmann, N. Gerhardt, A. Wagner, W. Stolz, S. Koch, W. Ruhle, J. Hader, J. Moloney, H. Schneider, W. Chow
{"title":"Physics of 1.3 /spl mu/m (GaIn)(NAs)/GaAs semiconductor lasers","authors":"M. Hofmann, N. Gerhardt, A. Wagner, W. Stolz, S. Koch, W. Ruhle, J. Hader, J. Moloney, H. Schneider, W. Chow","doi":"10.1109/LEOS.2001.969307","DOIUrl":"https://doi.org/10.1109/LEOS.2001.969307","url":null,"abstract":"Summary form only given. We study experimentally the emission dynamics of an optically pumped MOCVD grown 1.3 /spl mu/m (GaIn)(NAs)/GaAs VCSEL with a particular focus on the temperature dependence of the emission. We use optical excitation with a 100 fs Ti:sapphire laser to measure the emission dynamics of our VCSEL. The dynamics at room temperature are in the picosecond range (peak delay-time of 15.5 ps after excitation and pulse width of 10.5 ps). Moreover, we find laser emission with picosecond dynamics for temperatures between 30 K and 388 K.","PeriodicalId":18008,"journal":{"name":"LEOS 2001. 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society (Cat. No.01CH37242)","volume":"8 1","pages":"326-327 vol.1"},"PeriodicalIF":0.0,"publicationDate":"2001-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91244130","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Wavelength-tunable optical spectral bistability in a ring laser using a semiconductor optical amplifier","authors":"B. Wang, Lei Xu, V. Baby, I. Glesk, P. Prucnal","doi":"10.1109/LEOS.2001.969031","DOIUrl":"https://doi.org/10.1109/LEOS.2001.969031","url":null,"abstract":"Optical bistability at different wavelengths in a semiconductor fiber ring laser has been demonstrated. Changing the SOA bias current shows two stable optical outputs for any given current within the operating range. The laser can also be switched from one bistable state to another using optical control methods. Different wavelengths are selected by tuning the polarizer or the polarization controller in the laser cavity. These features will make the laser very promising for all-optical wavelength routing networking applications.","PeriodicalId":18008,"journal":{"name":"LEOS 2001. 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society (Cat. No.01CH37242)","volume":"10 1","pages":"748-749 vol.2"},"PeriodicalIF":0.0,"publicationDate":"2001-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87606964","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
L. J. Sargent, A. Massara, M. Gioannini, J. Yong, P. Heard, R. Penty, I. White
{"title":"Investigation of 2D-lattice distributed reflector lasers","authors":"L. J. Sargent, A. Massara, M. Gioannini, J. Yong, P. Heard, R. Penty, I. White","doi":"10.1109/LEOS.2001.969281","DOIUrl":"https://doi.org/10.1109/LEOS.2001.969281","url":null,"abstract":"A detailed study of the InGaAsP-InP 2D-lattice MQW laser has been undertaken. Characterisation of the optical field intensity as a function of distance along the device cavity has shown that etching significantly alters the optical properties of the waveguide. A high value of coupling coefficient is obtained, with K/sub g/ >250cm/sup -1/. Modelling suggests that this high value is consistent with the mode-hop free single-mode emission found to hold in the etched device even under large-signal modulation at 10 Gb/s.","PeriodicalId":18008,"journal":{"name":"LEOS 2001. 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society (Cat. No.01CH37242)","volume":"10 1","pages":"275-276 vol.1"},"PeriodicalIF":0.0,"publicationDate":"2001-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72952145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Thermally invariant all-dielectric micromirrors","authors":"W. Liu, J. Talghader","doi":"10.1109/LEOS.2001.969178","DOIUrl":"https://doi.org/10.1109/LEOS.2001.969178","url":null,"abstract":"All-dielectric micromirrors are reported that maintain their shape to within /spl lambda//60 at 633 nm over a range of 30 C, limited by the measurement apparatus. In tandem with the experimental results, thermally invariant coating design is discussed along with thermal expansion results from some common dielectric coating materials.","PeriodicalId":18008,"journal":{"name":"LEOS 2001. 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society (Cat. No.01CH37242)","volume":"43 1","pages":"72-73 vol.1"},"PeriodicalIF":0.0,"publicationDate":"2001-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80764003","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Optical coherence tomography of living and fabricated microfluidic systems","authors":"S. Boppart","doi":"10.1109/LEOS.2001.969237","DOIUrl":"https://doi.org/10.1109/LEOS.2001.969237","url":null,"abstract":"Optical coherence tomography provides high-resolution, real-time data acquisition of both microstructure and function in living and fabricated microfluidic systems. As fabricated microfluidic devices become more complex 3D systems with active and passive components, OCT has the potential to non-invasively assess performance, thus enabling improved design. In this post-genomic period of research, OCT has the potential to aid in the identification of not only morphological mutations, but also functional mutations in developmental biology.","PeriodicalId":18008,"journal":{"name":"LEOS 2001. 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society (Cat. No.01CH37242)","volume":"27 8 1","pages":"190-191 vol.1"},"PeriodicalIF":0.0,"publicationDate":"2001-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75478196","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Semi-leaky optical isolator fabricated by wafer bonding of magneto-optic garnet and LiNbO/sub 3/","authors":"T. Mizumoto, H. Yokoi, M. Shimizu, S. Narikawa","doi":"10.1109/LEOS.2001.968948","DOIUrl":"https://doi.org/10.1109/LEOS.2001.968948","url":null,"abstract":"A semi-leaky isolator was fabricated by bonding LiNbO/sub 3/ onto a magneto-optic garnet waveguide. Directional mode conversion between TE guided and TM radiation modes enables isolator operation. Characteristics of the semi-leaky isolator were investigated.","PeriodicalId":18008,"journal":{"name":"LEOS 2001. 14th Annual Meeting of the IEEE Lasers and Electro-Optics Society (Cat. No.01CH37242)","volume":"2 1","pages":"580-581 vol.2"},"PeriodicalIF":0.0,"publicationDate":"2001-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80244061","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}