2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)最新文献_第6页

Statistical estimation of circuit timing vulnerability due to leakage-induced power grid voltage drop 电网电压降漏电引起的电路时序脆弱性的统计估计

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) Pub Date : 2004-10-04 DOI: 10.1109/ICICDT.2004.1309896

I. A. Ferzli, F. Najm

引用次数: 3

Impact of elevated oxygen concentration on in-situ doped sub-50 nm SiGe and SiGeC base strained layer NPN HBT 氧浓度升高对原位掺杂亚50 nm SiGe和SiGeC基应变层NPN HBT的影响

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) Pub Date : 2004-10-04 DOI: 10.1109/ICICDT.2004.1309956

G. Oleszek, D. Enicks

引用次数: 0

Atmospheric neutron effects in advanced microelectronics, standards and applications 大气中子效应在先进微电子中的应用

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) Pub Date : 2004-10-04 DOI: 10.1109/ICICDT.2004.1309974

J. Leray, J. Baggio, V. Ferlet-Cavrois, O. Flament

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引用次数: 14

Design and implementation of the POWER5/spl trade/ microprocessor POWER5/spl交易微处理器的设计与实现

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) Pub Date : 2004-09-13 DOI: 10.1109/ISSCC.2004.1332591

J. Clabes, J. Friedrich, M. Sweet, Jack DiLullo, S. Chu, D. Plass, James Dawson, P. Muench, Larry Powell, Michael Floyd, B. Sinharoy, Mike Lee, Michael Goulet, J. Wagoner, N. Schwartz, S. Runyon, Gary Gorman, Phillip Restle, R. Kalla, J. McGill, S. Dodson

引用次数: 25

The double-gate FinFET: device and impact on IC design automation 双栅FinFET:器件及其对IC设计自动化的影响

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) Pub Date : 2004-05-17 DOI: 10.1109/ICICDT.2004.1309928

I. Aller, J. Clabes

引用次数: 0

Leakage-induced signal degradation in VLSI interconnection for buffered bus line & logic VLSI缓冲母线与逻辑互连中泄漏引起的信号退化

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) Pub Date : 1900-01-01 DOI: 10.1109/ICICDT.2004.1309892

P. Aum

引用次数: 0