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Leakage-induced signal degradation in VLSI interconnection for buffered bus line & logic

2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) Pub Date : 1900-01-01 DOI:10.1109/ICICDT.2004.1309892
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VLSI缓冲母线与逻辑互连中泄漏引起的信号退化
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2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)
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