2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866)

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2004 International Conference on Integrated Circuit Design and Technology (IEEE Cat. No.04EX866) - 最新文献

Optimization and scaling limit forecast of nitrided gate oxide using an equivalent nitride/oxide (N/O) stack model

Pub Date : 2004-10-04 DOI: 10.1109/ICICDT.2004.1309983 V. Chang, C. Chen, Y. Jin, C. Chen, T. Lee, S. Chen, M. Liang

PRAM process technology

Pub Date : 2004-10-04 DOI: 10.1109/ICICDT.2004.1309906 G. Koh, Y. Hwang, Sun-Ghil Lee, Suyoun Lee, K. Ryoo, Joon-Min Park, Yun-Heub Song, Soomin Ahn, Changwook Jeong, F. Yeung, Y. Kim, J.-B. Park, G. Jeong, H. Jeong, Keunnam Kim

Analysis of plasma damage on phase change memory cells

Pub Date : 2004-10-04 DOI: 10.1109/ICICDT.2004.1309950 F. Pellizzer, A. Spandre, S. Alba, A. Pirovano

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