Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's最新文献_第5页

Test pattern generation for current testable faults in static CMOS circuits 静态CMOS电路中电流可测试故障的测试模式生成

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI: 10.1109/VTEST.1991.208174

F. Ferguson, T. Larrabee

引用次数: 5

Circuit-level classification and testability analysis for CMOS faults CMOS故障的电路级分类与可测试性分析

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI: 10.1109/VTEST.1991.208157

S. Midkiff, S. Bollinger

引用次数: 7

Automated diagnosis of VLSI failures VLSI故障的自动诊断

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI: 10.1109/VTEST.1991.208156

P. Ryan, S. Rawat, W. Fuchs

引用次数: 12

Efficient test generation for built-in self-test boundary-scan template 有效的测试生成内置自检边界扫描模板

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI: 10.1109/VTEST.1991.208171

P. Nagvajara, M. Karpovsky, L. Levitin

引用次数: 0

Enhancement of resolution in supply current based testing for large ICs 提高大型集成电路供电电流测试的分辨率

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI: 10.1109/VTEST.1991.208173

Y. Malaiya, A. Jayasumana, C. Tong, S. Menon

引用次数: 30

Recent progress in synthesis for testability 可测试性合成的最新进展

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI: 10.1109/VTEST.1991.208127

S. Devadas, K. Keutzer, Abhijit Ghosh

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引用次数: 2

Use of CrossCheck test technology in practical applications 在实际应用中使用CrossCheck测试技术

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI: 10.1109/VTEST.1991.208126

S. Chandra, T. Gheewala, H. Sucar, G. Swan

引用次数: 1

VLSI procurement and qualification: NASA/GSFC experience, issues and concerns 超大规模集成电路采购和认证:NASA/GSFC经验，问题和关注

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI: 10.1109/VTEST.1991.208143

Ashok K. Sharma

引用次数: 0

Enhanced fault modeling for DRAM test and analysis 增强了对DRAM测试和分析的故障建模

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI: 10.1109/VTEST.1991.208150

H.-D. Oberle, M. Maue, P. Muhmenthaler

引用次数: 27

Testing of VLSI CMOS System/390 processor at card and system level VLSI CMOS System/390处理器在卡级和系统级的测试

Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's Pub Date : 1991-04-15 DOI: 10.1109/VTEST.1991.208169

W. Hartmann, C. Starke

引用次数: 0