{"title":"VLSI procurement and qualification: NASA/GSFC experience, issues and concerns","authors":"Ashok K. Sharma","doi":"10.1109/VTEST.1991.208143","DOIUrl":null,"url":null,"abstract":"Describes the VLSI parts quality and reliability issued for NASA space flight use, particularly from a NASA/Goddard Space Flight Center (GSFC) perspective. A case history of four chip set gate arrays planned for use on a high speed flight data recorder, qualification effort based on MIL-M-38510 requirements, is discussed.<<ETX>>","PeriodicalId":157539,"journal":{"name":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","volume":"239 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1991-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/VTEST.1991.208143","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Describes the VLSI parts quality and reliability issued for NASA space flight use, particularly from a NASA/Goddard Space Flight Center (GSFC) perspective. A case history of four chip set gate arrays planned for use on a high speed flight data recorder, qualification effort based on MIL-M-38510 requirements, is discussed.<>