{"title":"Pseudoduplication of floating-point addition. A method of compiler generated checking of permanent hardware faults","authors":"W. Hahn, M. Gössel","doi":"10.1109/VTEST.1991.208152","DOIUrl":"https://doi.org/10.1109/VTEST.1991.208152","url":null,"abstract":"A method of compiler generated checkpoints for the detection of permanent hardware faults is offered. Some of the floating point addition instructions of a program are used as checkpoints. The compiler automatically generates a diverse execution on different data paths (pseudo-duplication). Rounding-modes and fault coverage are investigated. The method can be implemented without additional hardware and with a tolerable reduction in performance.<<ETX>>","PeriodicalId":157539,"journal":{"name":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126684242","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Design for diagnosable multiple-output digital systems","authors":"Hede Ma, Y. Liu","doi":"10.1109/VTEST.1991.208159","DOIUrl":"https://doi.org/10.1109/VTEST.1991.208159","url":null,"abstract":"A design for diagnosable multiple-output digital systems is presented, in which not only error detection is implemented by the minimum number of checkers but also fault isolation is realized by minimal additional hardware instead of traditional software diagnostic procedures such that the computation time and memory space for fault isolation are eliminated. A partition algorithm is utilized for partitioning a digital system specially into subsystems with each subsystem containing only one primary output. With the aid of this partition algorithm, an algorithm for automatic fault isolation is presented. The algorithm is suitable for computer implementation so that faults in large size digital systems can be isolated automatically. The overhead of the additional hardware to isolate faults automatically is less than 2.1%.<<ETX>>","PeriodicalId":157539,"journal":{"name":"Digest of Papers 1991 VLSI Test Symposium 'Chip-to-System Test Concerns for the 90's","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-04-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121562771","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}