Journal of Electron Spectroscopy and Related Phenomena最新文献_第10页

SPADExp: A photoemission angular distribution simulator directly linked to first-principles calculations SPADExp:与第一性原理计算直接相关的光电发射角分布模拟器

IF 1.9 4区物理与天体物理

Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2023-04-01 DOI: 10.1016/j.elspec.2023.147297

Hiroaki Tanaka , Kenta Kuroda , Tomohiro Matsushita

{"title":"SPADExp: A photoemission angular distribution simulator directly linked to first-principles calculations","authors":"Hiroaki Tanaka , Kenta Kuroda , Tomohiro Matsushita","doi":"10.1016/j.elspec.2023.147297","DOIUrl":"10.1016/j.elspec.2023.147297","url":null,"abstract":"<div>We develop a software package SPADExp (simulator of photoemission angular distribution for experiments) to calculate the photoemission angular distribution (PAD), which is the momentum dependence of spectrum intensity in angle-resolved photoemission spectroscopy (ARPES). The software can directly load the output of the first-principles software package OpenMX, so users do not need to construct tight-binding models as previous studies did for PAD calculations. As a result, we can calculate the PADs of large systems such as quasicrystals and slab systems. We calculate the PADs of sublattice systems (graphene and graphite) to reproduce characteristic intensity distributions, which ARPES has experimentally observed. After that, we investigate twisted bilayer graphene, a quasicrystal showing 12-fold rotational symmetric spectra in ARPES, and the surface states of the topological insulator <math><mrow><msub><mrow><mi>Bi</mi></mrow><mrow><mn>2</mn></mrow></msub><msub><mrow><mi>Se</mi></mrow><mrow><mn>3</mn></mrow></msub></mrow></math>. Our calculations show good agreement with previous ARPES measurements, showing the correctness of our calculation software and further potential to investigate the photoemission spectra of novel quantum materials.</div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"264 ","pages":"Article 147297"},"PeriodicalIF":1.9,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42273827","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Near-edge X-ray absorption fine structure spectroscopy in studies of self-assembled monomolecular films 近边x射线吸收精细结构光谱在自组装单分子薄膜研究中的应用

IF 1.9 4区物理与天体物理

Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2023-04-01 DOI: 10.1016/j.elspec.2023.147322

Michael Zharnikov

{"title":"Near-edge X-ray absorption fine structure spectroscopy in studies of self-assembled monomolecular films","authors":"Michael Zharnikov","doi":"10.1016/j.elspec.2023.147322","DOIUrl":"10.1016/j.elspec.2023.147322","url":null,"abstract":"<div>This article reviews the application of near-edge X-ray absorption fine structure (NEXAFS) spectroscopy to characterization of self-assembled monolayers (SAMs) which are an important part of modern nanotechnology, being particular useful in context of surface and interface engineering. NEXAFS spectroscopy provides information about the electronic structure of the SAMs, which allows to recognize specific functional groups and building blocks of the SAM-forming molecules. Due to the linear dichroism effects in X-ray absorption, this technique is also capable to give insight into orientational order and molecular orientation in the SAMs, both overall and building-block-specific. To illustrate the above points, a variety of representative examples for different classes of SAMs is provided, accompanied by the information about the general aspects of the technique and the description of suitable data evaluation procedures. Finally, it is shown that the application of NEXAFS spectroscopy to SAMs is not only limited by their characterization but is also useful to monitor chemical and physical processes involving these systems.</div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"264 ","pages":"Article 147322"},"PeriodicalIF":1.9,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45209929","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 2

Multiple-site Ag doping in Bi2Se 多位点Ag掺杂Bi2Se<mml:math xmlns:mml="http://www.w3.org/1998/Math/MathML" altimg="si30.svg"显示

IF 1.9 4区物理与天体物理

Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2023-04-01 DOI: 10.1016/j.elspec.2023.147295

Fumihiko Matsui, H. Ota, R. Eguchi, H. Goto, K. Kobayashi, Jun Akimitsu, H. Ozaki, Takumi Nishioka, K. Kimura, K. Hayashi, T. Shimano, N. Happo, Y. Kubozono

引用次数: 0

Removing Gas-phase Features in Near Ambient Pressure Partial Auger-meitner Yield Oxygen K-edge NEXAFS Spectra 去除近环境压力部分俄歇-迈特纳产率氧k边NEXAFS光谱中的气相特征

IF 1.9 4区物理与天体物理

Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2023-04-01 DOI: 10.1016/j.elspec.2023.147320

T. Bartels-Rausch, J. Gabathuler, Huanyu Yang, Yanisha Manoharan, L. Artiglia, M. Ammann

引用次数: 0

Removing gas-phase features in near ambient pressure partial Auger-Meitner electron yield oxygen K-edge NEXAFS spectra 去除近环境压力部分奥格-迈特纳电子产率氧k边NEXAFS谱中的气相特征

IF 1.9 4区物理与天体物理

Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2023-04-01 DOI: 10.1016/j.elspec.2023.147320

Thorsten Bartels-Rausch, Jérôme Philippe Gabathuler, Huanyu Yang, Yanisha Manoharan, Luca Artiglia, Markus Ammann

{"title":"Removing gas-phase features in near ambient pressure partial Auger-Meitner electron yield oxygen K-edge NEXAFS spectra","authors":"Thorsten Bartels-Rausch, Jérôme Philippe Gabathuler, Huanyu Yang, Yanisha Manoharan, Luca Artiglia, Markus Ammann","doi":"10.1016/j.elspec.2023.147320","DOIUrl":"https://doi.org/10.1016/j.elspec.2023.147320","url":null,"abstract":"<div>With the advent of ambient pressure X-ray excited electron spectroscopy, near-edge X-ray absorption fine structure spectroscopy is widely used to investigate the hydrogen-bonding environment in aqueous solutions, ice, and adsorbed water. When Auger-Meitner electrons are detected, the method becomes inherently surface-sensitive because of the limited escape depth of electrons. In such X-ray absorption experiments with aqueous samples, gas-phase water is inevitably present. It impacts the acquired spectra in two ways: (1) Absorption along the X-ray path upstream of the sample reduces the photon flux reaching the condensed phase. (2) Spectra originating from gas-phase water in front of the analyzer contribute to the recorded spectra. Here, we develop and discuss a procedure to disentangle the gas-phase and condensed-phase contribution in the acquired spectra. A novel approach to quantify and remove the gas-phase contribution allows receiving condensed-phase near-edge X-ray absorption fine structure spectra at high water vapor pressure free of gas-phase artifacts.</div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"264 ","pages":"Article 147320"},"PeriodicalIF":1.9,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49866396","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Data analysis in spectroscopic STXM 光谱STXM中的数据分析

IF 1.9 4区物理与天体物理

Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2023-04-01 DOI: 10.1016/j.elspec.2023.147310

Matthew A. Marcus

引用次数: 2

UV-enhanced environmental charge compensation in near ambient pressure XPS 紫外增强环境电荷补偿近环境压力XPS

IF 1.9 4区物理与天体物理

Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2023-04-01 DOI: 10.1016/j.elspec.2023.147317

Teresa de los Arcos , Hendrik Müller , Christian Weinberger , Guido Grundmeier

{"title":"UV-enhanced environmental charge compensation in near ambient pressure XPS","authors":"Teresa de los Arcos , Hendrik Müller , Christian Weinberger , Guido Grundmeier","doi":"10.1016/j.elspec.2023.147317","DOIUrl":"10.1016/j.elspec.2023.147317","url":null,"abstract":"<div>In this work, we discuss the possibility of improving charge neutralization in near ambient pressure X-ray photoelectron spectroscopy by co-irradiating the sample with He I photons of 21.2 eV. This UV-enhanced neutralization of charges is a variation of the so-called environmental charge compensation, which uses the electrons produced by the photoionization of the ambient gas to neutralize the positive charges built at the sample surface. Adding an additional ionization source generates more charges at the sample but also larger amounts of electrons available for neutralization. The final surface charge equilibrium depends on different aspects of the experiment, such as the sample composition and geometry, the total ionization cross sections of the gas compared to the surface materials, the gas used, the luminosity and spot size of the sources used for photoionization, and the energy of the electrons present in the gas phase. Here we illustrate the efficiency of the UV-enhanced neutralization using three different dielectric samples with different geometries (a porous SiO2 monolith with an irregular surface, a flat mica sample, and a thin SiO2 film deposited onto a Si substrate), different X-ray spot sizes, and two different gases (N2 and Ar). The effect of biasing on the efficiency of the sample surface to attract electrons produced in the gas phase is also discussed.</div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"264 ","pages":"Article 147317"},"PeriodicalIF":1.9,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47467283","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Single-atom cobalt-incorporating carbon nitride for photocatalytic solar hydrogen conversion: An X-ray spectromicroscopy study 光催化太阳能氢转化的单原子含钴氮化碳:x射线光谱显微镜研究

IF 1.9 4区物理与天体物理

Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2023-04-01 DOI: 10.1016/j.elspec.2023.147319

Yu-Cheng Huang , Jie Chen , Ying-Rui Lu , K. Thanigai Arul , Takuji Ohigashi , Jeng-Lung Chen , Chi-Liang Chen , Shaohua Shen , Wu-Ching Chou , Way-Faung Pong , Chung-Li Dong

{"title":"Single-atom cobalt-incorporating carbon nitride for photocatalytic solar hydrogen conversion: An X-ray spectromicroscopy study","authors":"Yu-Cheng Huang , Jie Chen , Ying-Rui Lu , K. Thanigai Arul , Takuji Ohigashi , Jeng-Lung Chen , Chi-Liang Chen , Shaohua Shen , Wu-Ching Chou , Way-Faung Pong , Chung-Li Dong","doi":"10.1016/j.elspec.2023.147319","DOIUrl":"10.1016/j.elspec.2023.147319","url":null,"abstract":"<div>The use of carbon nitride-based materials and light to drive catalytic water splitting has enormous potential for the production of hydrogen. Revealing the processes of molecular conjugation, nucleation, and crystallization in crystalline carbon nitride is expected to enhance the photocatalytic activity through the creation of isotype heterojunctions and active sites. In this work, the addition of cobalt salts in ionothermal synthesis was found to promote the phase transition of heptazine-based crystalline carbon nitride (CCN) to triazine-based poly (triazine imide) (PTI), resulting in the formation of a single-atom cobalt-doped coordinated isotype CCN/PTI heterojunction. The new hybrid orbital modulates the atomic/electronic structure and the band gap of the CCN/PTI heterojunction, and synergistically increases the absorption of visible light, accelerating the separation and transfer of photoexcited electrons and holes. Synchrotron-based X-ray spectroscopy and microscopy are used to identify the origin of the improved performance of the single-atom cobalt-doped CCN/PTI heterojunction in the photocatalytic hydrogen evolution reaction. This work demonstrates that synchrotron X-ray spectroscopy is a promising tool for designing materials aimed at enhancing photocatalytic activity in solar energy conversion applications.</div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"264 ","pages":"Article 147319"},"PeriodicalIF":1.9,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42129202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

Development of in situ characterization of two-dimensional materials grown on insulator substrates with spectroscopic photoemission and low energy electron microscopy 用光谱光电发射和低能电子显微镜原位表征绝缘体衬底上生长的二维材料的研究进展

IF 1.9 4区物理与天体物理

Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2023-04-01 DOI: 10.1016/j.elspec.2023.147318

Guanhua Zhang , Lina Liu , Shengxue Zhou , Yu Liang , Julong Sun , Lei Liu , Chuanyao Zhou , Liying Jiao , Xueming Yang , Zefeng Ren

{"title":"Development of in situ characterization of two-dimensional materials grown on insulator substrates with spectroscopic photoemission and low energy electron microscopy","authors":"Guanhua Zhang , Lina Liu , Shengxue Zhou , Yu Liang , Julong Sun , Lei Liu , Chuanyao Zhou , Liying Jiao , Xueming Yang , Zefeng Ren","doi":"10.1016/j.elspec.2023.147318","DOIUrl":"10.1016/j.elspec.2023.147318","url":null,"abstract":"<div>Ultrathin two-dimensional (2D) materials offer great potential for next-generation integrated circuit and optoelectronic devices. Chemical vapor deposition (CVD)-grown 2D materials provide a way to mass production in industry. However, how to in situ characterize their intrinsic electric/photoelectric properties and carrier dynamics with electron/photoelectron probes is still a problem due to the interference from the conducting substrate. Here, we present a grounding Au grids method to realize in situ characterization of the CVD-grown MoS2 on the insulating thick SiO2 layer covered Si substrate with spectroscopic photoemission and low energy electron microscopy (SPELEEM). Through depositing Au grids afterwards, we have achieved good grounding of MoS2 flakes in the photoemission electron microscopy (PEEM), mirror electron microscopy (MEM), and micro-area low energy electron diffraction (µ-LEED) measurements. We have clarified the false signal caused by stray photoelectrons originated from the Au stripes, and as well as the space charge effects induced by intense photoemission. We have also confirmed that time-resolved PEEM results are not affected by the stray signal, and by adopting a small light spot, both static and time-resolved micro-area photoelectron spectroscopy (µ-PES) can be unaffected by space charge effects. Our results provide a reliable way to in situ investigate 2D materials grown on insulating substrates by probing photoelectrons or backscattered electrons.</div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"264 ","pages":"Article 147318"},"PeriodicalIF":1.9,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49301995","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Magic angle HAXPES 魔角HAXPES

IF 1.9 4区物理与天体物理

Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2023-04-01 DOI: 10.1016/j.elspec.2023.147311

David J.H. Cant , Benjamen P. Reed , Ben F. Spencer , Wendy R. Flavell , Alexander G. Shard

{"title":"Magic angle HAXPES","authors":"David J.H. Cant , Benjamen P. Reed , Ben F. Spencer , Wendy R. Flavell , Alexander G. Shard","doi":"10.1016/j.elspec.2023.147311","DOIUrl":"https://doi.org/10.1016/j.elspec.2023.147311","url":null,"abstract":"<div>The use of higher energy X-ray sources for photoelectron spectroscopy is receiving considerable attention due to the increased availability of laboratory-based instrumentation and an improved insight into the structures and interfacial properties of technological materials. In traditional X-ray photoelectron spectroscopy the design of the instrument often compensates for anisotropy in photoelectron emission through consideration of the angles between the X-ray source and the electron analyser. X-ray polarisation and non-dipole effects in photoemission are usually assumed to be negligible. However, for high energy XPS (HAXPES) both may be significant. Polarisation at synchrotron sources is an important consideration and non-dipole effects are generally more significant at higher photon energies. In this article we demonstrate that, for certain polarisations, ‘magic angle’ geometries exist that minimise the effects of both dipole and non-dipole contributions in photoemission. However, it is not possible to find such geometries for unpolarised X-rays; achieving a ‘magic angle’ geometry in HAXPES requires the X-rays to have a degree of linear polarisation of 1/3 or greater.</div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"264 ","pages":"Article 147311"},"PeriodicalIF":1.9,"publicationDate":"2023-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49866397","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0