UVSOR-III同步加速器扫描透射x射线显微镜样品环境研究进展

IF 1.8 4区物理与天体物理 Q2 SPECTROSCOPY

Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2023-07-01 DOI:10.1016/j.elspec.2023.147356

Takuji Ohigashi , Nobuhiro Kosugi

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引用次数: 1

摘要

UVSOR-III同步加速器中的光束线BL4U专用于基于二维软x射线吸收的扫描透射x射线显微镜(STXM)，自2013年以来一直在运行，使学术和工业用户能够在各种样品环境下进行先进的化学分析。在本文中，我们总结了我们在过去十年中的主要发展;特别是光子能量范围扩展到Li k边缘(55 eV)，样品低温冷却以减少辐射损伤，三维计算机断层扫描和无空气样品转移。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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Developments in sample environment for a scanning transmission X-ray microscope at UVSOR-III synchrotron

The beamline, BL4U, in UVSOR-III Synchrotron is dedicated to scanning transmission X-ray microscopy (STXM) based on 2-dimensional soft X-ray absorption and has been in operation since 2013, to enable both academic and industrial users to carry out advanced chemical analysis under various sample environments. In this paper, we have summarized our major developments for the last decade; especially, expansion of the photon energy range down to the Li K-edge (55 eV), sample cryo-cooling to reduce radiation damage, 3-dimensional computer tomography, and air-free sample transfer.

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来源期刊

Journal of Electron Spectroscopy and Related Phenomena 物理-光谱学

CiteScore

3.30

自引率

5.30%

发文量

审稿时长

60 days

期刊介绍： The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.