在BESSY II型电子存储环的软、嫩x射线范围内,使用全场x射线显微镜进行纳米光谱显微镜

IF 1.8 4区 物理与天体物理 Q2 SPECTROSCOPY
Peter Guttmann , Carla Bittencourt , Stephan Werner , Stefan Rehbein , Christoph Pratsch , Gerd Schneider
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引用次数: 0

摘要

本文综述了利用全视场x射线显微镜在BESSY II型电子存储环上进行的纳米尺度光谱显微镜研究。我们不考虑在其他同步加速器源操作的x射线显微镜进行的光谱显微镜研究。这样的研究可以在文献中找到。据我们所知,BESSY II存储环上的全视野x射线显微镜是第一个同时使用平面光栅单色仪(PGM)光束线的显微镜,该光束线配备了用于软x射线范围的多层光学元件,以及用于软x射线范围的标准光学元件。我们讨论了该仪器如何在各种已发表的NEXAFS-TXM研究中用于探测低维纳米结构。这项研究工作为理解接近原子尺度的电子结构铺平了道路,并将有助于定制功能系统的设计。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Nanoscale spectromicroscopy with the full-field X-ray microscope at the BESSY II electron storage ring in the soft and tender X-ray range

In this paper, we give an overview of the nanoscale spectromicroscopy studies performed with the full-field X-ray microscope at the BESSY II electron storage ring. We do not consider spectromicroscopy studies performed with X-ray microscopes operated at other synchrotron sources. Such studies can be found in the literature. To our knowledge, the full-field X-ray microscope at the BESSY II storage ring is the first one operating with both a plane-grating-monochromator (PGM) beamline equipped with multi-layer optics for the tender X-ray range, as well as with standard optical elements for the soft X-ray range. We discuss how this instrument has been used in various published NEXAFS-TXM studies to probe low dimensional nanostructures. This research work paves the way for understanding electronic structures approaching the atomic scale, and will thereby help in the design of tailored functional systems.

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来源期刊
CiteScore
3.30
自引率
5.30%
发文量
64
审稿时长
60 days
期刊介绍: The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.
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