2023 IEEE Applied Power Electronics Conference and Exposition (APEC)最新文献_第3页

Closed-Loop Current Control of a Buck Converter via Sensing of Optical Emission from a GaN PN Freewheeling Diode 基于GaN - PN自由旋转二极管光发射传感的Buck变换器闭环电流控制

2023 IEEE Applied Power Electronics Conference and Exposition (APEC) Pub Date : 2023-03-19 DOI: 10.1109/APEC43580.2023.10131525

Justin D. Johnston, M. Porter, K. Corzine, T. Weatherford

引用次数: 0

Coupled Inductor Based Non-Isolated High Conversion Ratio Boost Extender 基于耦合电感的非隔离高转换比升压扩展器

2023 IEEE Applied Power Electronics Conference and Exposition (APEC) Pub Date : 2023-03-19 DOI: 10.1109/APEC43580.2023.10131533

Vikas Kumar Rathore, M. Evzelman, M. Peretz

引用次数: 1

Battery Aging Behavior Evaluation Under Variable and Constant Temperatures with Real Loading Profiles 电池在变温和恒温条件下的老化性能评估

2023 IEEE Applied Power Electronics Conference and Exposition (APEC) Pub Date : 2023-03-19 DOI: 10.1109/APEC43580.2023.10131534

Yunhong Che, D. Stroe, Xin Sui, Sϕren Byg Vilsen, Xiaosong Hu, R. Teodorescu

{"title":"Battery Aging Behavior Evaluation Under Variable and Constant Temperatures with Real Loading Profiles","authors":"Yunhong Che, D. Stroe, Xin Sui, Sϕren Byg Vilsen, Xiaosong Hu, R. Teodorescu","doi":"10.1109/APEC43580.2023.10131534","DOIUrl":"https://doi.org/10.1109/APEC43580.2023.10131534","url":null,"abstract":"Studying and analyzing battery aging behavior is crucial in battery health prognostic and management. This paper conducts novel and comprehensive experiments to evaluate battery aging under variable external stresses, including different dynamic load profiles and variable environmental temperatures. Respond analysis in the time and frequency domain is performed to account for the different aging rates under different current loadings, where the statistic calculation and fast Fourier transform are used for the analysis. The empirical model is used to fit the fade curve for the comparisons between constant and variable temperatures. The capacity decrease and internal resistance increase are extracted to evaluate capacity and power fade, respectively. The experimental results show that the urban dynamic operating conditions help to prolong the service life compared to the constant current aging case. In contrast, the aging under the highway profile accelerates the aging process. Although the average temperature is the same as under constant temperature conditions, variable temperature conditions accelerate battery aging.","PeriodicalId":151216,"journal":{"name":"2023 IEEE Applied Power Electronics Conference and Exposition (APEC)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122797041","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 1

400V-to-48V Transformer-Isolated Stacked Active Bridge Converter with Integrated Magnetics 400v至48v变压器隔离堆叠有源桥变换器集成磁

2023 IEEE Applied Power Electronics Conference and Exposition (APEC) Pub Date : 2023-03-19 DOI: 10.1109/APEC43580.2023.10131498

Branko Majmunović, Yucheng Gao, Inder Kumar Vedula, S. Khandelwal, D. Maksimović

引用次数: 0

Physics-based Modeling of Packaging-related Degradation of IGBT Modules IGBT模块封装相关退化的物理建模

2023 IEEE Applied Power Electronics Conference and Exposition (APEC) Pub Date : 2023-03-19 DOI: 10.1109/APEC43580.2023.10131229

Yichi Zhang, Yi Zhang, Shuai Zhao, Bo Yao, Huai Wang

{"title":"Physics-based Modeling of Packaging-related Degradation of IGBT Modules","authors":"Yichi Zhang, Yi Zhang, Shuai Zhao, Bo Yao, Huai Wang","doi":"10.1109/APEC43580.2023.10131229","DOIUrl":"https://doi.org/10.1109/APEC43580.2023.10131229","url":null,"abstract":"This paper proposes an analytical model to fit degradation data of insulated gate bipolar transistor (IGBT), based on physics understandings. Different from the empirical and data-driven modeling, the revealed failure mechanism, crack propagation and metallization reconstruction leading to the smaller bond contact area and the increased resistivity respectively, have been fully considered. With the help of elaborate geometry equivalence for topside interconnection, an analytical equation is established to quantify the contact resistance, and its variation corresponds to the change of on-state voltage. Consequently, the equation build the bridge between these directly degradation-related indicators (crack, resistivity) and accessible data (on-state voltage, current). Moreover, a concise equation is formulated to analyze the crack propagation while fully considering the existing fracture mechanics theory. And another flexible equation is tailored to quantify the influence of the evolution of metallization reconstruction on resistivity. Finally, power cycling testings are conducted with different test conditions, these data verify the improved performance of the proposed model compared to the existing ones.","PeriodicalId":151216,"journal":{"name":"2023 IEEE Applied Power Electronics Conference and Exposition (APEC)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121876760","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Analytical Modelling and Optimization of DC-Link Voltage Harmonic Spectra of Full-Bridge Modular Multilevel Converters for Buck and Boost Operation 降压和升压全桥模块化多电平变换器直流链路电压谐波谱的分析建模与优化

2023 IEEE Applied Power Electronics Conference and Exposition (APEC) Pub Date : 2023-03-19 DOI: 10.1109/APEC43580.2023.10131298

Thabet Alzahrani, M. Odavic, S. Thakur, K. Atallah

引用次数: 0

A Gallium Nitride Intelligent Power Module Based on Bonding Wire Interconnection 基于键合线互连的氮化镓智能电源模块

2023 IEEE Applied Power Electronics Conference and Exposition (APEC) Pub Date : 2023-03-19 DOI: 10.1109/APEC43580.2023.10131222

Yilong Yao, Hong Zhang, Fengtao Yang, Hang Kong, Yan Wang, Xiaobo Dong, Laili Wang, Kangping Wang

引用次数: 0

Thermal Mapping of Power Modules Using Optical Fibers during AC Power Cycling Tests 交流电源循环测试中使用光纤的电源模块热图

2023 IEEE Applied Power Electronics Conference and Exposition (APEC) Pub Date : 2023-03-19 DOI: 10.1109/APEC43580.2023.10131209

Kaichen Zhang, F. Iannuzzo

{"title":"Thermal Mapping of Power Modules Using Optical Fibers during AC Power Cycling Tests","authors":"Kaichen Zhang, F. Iannuzzo","doi":"10.1109/APEC43580.2023.10131209","DOIUrl":"https://doi.org/10.1109/APEC43580.2023.10131209","url":null,"abstract":"The power cycling withstand capability of power semiconductors is of great interest in determining the component's qualification and reliability performance. Compared to the traditional DC Power cycling test, the AC power cycling test can accelerate the component to fail under more realistic operating conditions. The wear process in the AC power cycling test depends on many parameters, among which the maximum junction temperature $T_{J}$, and temperature swing $Delta T_{j}$ are crucial to be determined. The traditional way in DC power cycling test is to measure the $T_{j}$ indirectly using the temperature-sensitive electrical parameter (TSEP) method, which is not very applicable during the AC power cycling test as it will increase the circuit complicity and may interrupt the PWM operation. The purpose of this paper is to evaluate a direct junction temperature measurement in an IGBT power module through silicone gel using optical fibers, which enables a fast and accurate $T_{j}$ determination during AC power cycling. For this purpose, junction temperatures have been measured for both gel-filled modules and gel-removed modules under different experimental conditions. The experimental results presented concern about: the presence of silicone gel's impact on the $T_{J}$ measurement accuracy, the temperature difference inside the silicone gel while the optical fiber is being instrumented at different positions, and the spatial temperature distributions of the IGBT chip. Future work will also include the comparison of the $T_{J}$ measurements of a gel-filled power module between using the optical fibers and the well-established TSEP method.","PeriodicalId":151216,"journal":{"name":"2023 IEEE Applied Power Electronics Conference and Exposition (APEC)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128756389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Design of a Multi-Chemistry Battery Pack System for Behind-the-meter Storage Applications 用于表后存储应用的多化学电池组系统的设计

2023 IEEE Applied Power Electronics Conference and Exposition (APEC) Pub Date : 2023-03-19 DOI: 10.1109/APEC43580.2023.10131167

Anik Chowdhury, Ashraf Siddiquee, Partha P. Mishra, M. Haque, Mithat J. Kisacikoglu, Alastair P. Thurlbeck, Edward Watt, Mohammad Arifur Rahman, Y. Sozer, Jeff Holt

{"title":"Design of a Multi-Chemistry Battery Pack System for Behind-the-meter Storage Applications","authors":"Anik Chowdhury, Ashraf Siddiquee, Partha P. Mishra, M. Haque, Mithat J. Kisacikoglu, Alastair P. Thurlbeck, Edward Watt, Mohammad Arifur Rahman, Y. Sozer, Jeff Holt","doi":"10.1109/APEC43580.2023.10131167","DOIUrl":"https://doi.org/10.1109/APEC43580.2023.10131167","url":null,"abstract":"Battery management systems (BMS) are essential for a battery pack's safe operation and longevity. This paper presents an active balancing method-based BMS for different cell chemistry structures to be used in behind-the-meter storage (BTMS) applications. The proposed system utilizes modular isolated dual active bridge (DAB) DC/DC converters to actively balance the battery pack through a low voltage (LV) bus. A supervisory controller monitors all the cell voltage, current, and state of charge (SOC) values. Based on the estimation of the SOCs, reference currents for the DAB converters are generated by the supervisory controller. Detailed modeling and the control approach of the modular DAB converters are presented in the paper. Moreover, the control strategy of the supervisory control is also analyzed. The proposed method and structure can be extended to any combination of the number of cells to design the battery pack. Simulation results are provided for a system consisting of three cells in parallel to form a cell block and three cell blocks in series to form the battery module. Experimental results are provided for three modular DAB converters operating with a LiFeMnPO4 prismatic cell with 3.2V, 20Ah rated values.","PeriodicalId":151216,"journal":{"name":"2023 IEEE Applied Power Electronics Conference and Exposition (APEC)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128791142","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0

Superimposed Quadratic Buck Converter for High-Efficiency Direct 48V/1V Applications 用于高效率直接48V/1V应用的叠加二次降压变换器

2023 IEEE Applied Power Electronics Conference and Exposition (APEC) Pub Date : 2023-03-19 DOI: 10.1109/APEC43580.2023.10131201

Jin Woong Kwak, D. Ma

{"title":"Superimposed Quadratic Buck Converter for High-Efficiency Direct 48V/1V Applications","authors":"Jin Woong Kwak, D. Ma","doi":"10.1109/APEC43580.2023.10131201","DOIUrl":"https://doi.org/10.1109/APEC43580.2023.10131201","url":null,"abstract":"In the search for high-density and high-efficiency large step-down DC-DC power converters, numerous hybrid converter topologies are reported recently, in which distinct power stages are merged in series to achieve a high step-down voltage conversion ratio. However, these topologies face immediate performance challenges due to the method of series topology combination, which not only increases power device count but also requires well-orchestrated timing control between these devices. To overcome such challenges, this paper presents a new quadratic step-down converter using an unorthodox method of topology superimposition. The resulting superimposed quadratic buck (SQB) converter requires the lowest power device count compared to prior arts. Thanks to the quadratic conversion ratio, the ON-time of the converter is substantially relaxed. It delivers power in parallel paths with minimized RMS current for high efficiency. Meanwhile, the output voltage ripples are largely reduced owing to the inherent inductor current ripple cancellation and the proposed inductor sizing scheme. An experimental prototype of this design achieves direct 48V-to-1V power conversion with a maximum load of 20A and a peak efficiency of 94.5%.","PeriodicalId":151216,"journal":{"name":"2023 IEEE Applied Power Electronics Conference and Exposition (APEC)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-03-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128793751","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

引用次数: 0