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Journal of Applied Crystallography最新文献

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Design and fabrication of 3D-printed in situ crystallization plates for probing microcrystals in an external electric field 设计和制造用于探测外部电场中微晶体的三维打印原位结晶板
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-04-15 DOI: 10.1107/s1600576724002140
Khakurel, K.P., Nemergut, M., Džupponová, V., Kropielnicki, K., Savko, M., Žoldák, G., Andreasson, J.
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引用次数: 0
Applications of the Clifford torus to material textures 克利福德环应用于材料纹理
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-04-15 DOI: 10.1107/s160057672400219x
De Graef, M.
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引用次数: 0
FLEXR GUI: a graphical user interface for multi-conformer modeling of proteins FLEXR GUI：用于蛋白质多构型建模的图形用户界面
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-03-27 DOI: 10.1107/s1600576724001523
Stachowski, T.R., Fischer, M.
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引用次数: 0
From solution to structure: empowering inclusive cryo-EM with a pre-characterization pipeline for biological samples 从溶液到结构：利用生物样本预表征管道增强包容性冷冻电镜技术
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-03-26 DOI: 10.1107/s1600576724001717
Mueller-Dieckmann, C., Grinzato, A., Effantin, G., Fenel, D., Flot, D., Schoehn, G., Leonard, G., Kandiah, E.
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引用次数: 0
Robust image descriptor for machine learning based data reduction in serial crystallography 用于基于机器学习的序列晶体学数据缩减的稳健图像描述符
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-03-26 DOI: 10.1107/s160057672400147x
Rahmani, V., Nawaz, S., Pennicard, D., Graafsma, H.
{"title":"Robust image descriptor for machine learning based data reduction in serial crystallography","authors":"Rahmani, V., Nawaz, S., Pennicard, D., Graafsma, H.","doi":"10.1107/s160057672400147x","DOIUrl":"https://doi.org/10.1107/s160057672400147x","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"25 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140315767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Observations of specimen morphology effects on near-zone-axis convergent-beam electron diffraction patterns 观察试样形态对近区轴汇聚束电子衍射图谱的影响
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-03-21 DOI: 10.1107/s1600576724001614
Tan, X., Bourgeois, L., Nakashima, P.N.H.
{"title":"Observations of specimen morphology effects on near-zone-axis convergent-beam electron diffraction patterns","authors":"Tan, X., Bourgeois, L., Nakashima, P.N.H.","doi":"10.1107/s1600576724001614","DOIUrl":"https://doi.org/10.1107/s1600576724001614","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"66 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140198153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Simulations of dislocation contrast in dark-field X-ray microscopy 暗场 X 射线显微镜中的位错对比模拟
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-03-21 DOI: 10.1107/s1600576724001183
Borgi, S., Ræder, T.M., Carlsen, M.A., Detlefs, C., Winther, G., Poulsen, H.F.
{"title":"Simulations of dislocation contrast in dark-field X-ray microscopy","authors":"Borgi, S., Ræder, T.M., Carlsen, M.A., Detlefs, C., Winther, G., Poulsen, H.F.","doi":"10.1107/s1600576724001183","DOIUrl":"https://doi.org/10.1107/s1600576724001183","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"30 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140198321","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The multi-slit very small angle neutron scattering instrument at the China Spallation Neutron Source 中国溅射中子源的多缝隙极小角中子散射仪
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-03-21 DOI: 10.1107/s1600576724000815
Zuo, T., Han, Z., Ma, C., Xiao, S., Lin, X., Li, Y., Wang, F., He, Y., He, Z., Zhang, J., Wang, G., Cheng, H.
{"title":"The multi-slit very small angle neutron scattering instrument at the China Spallation Neutron Source","authors":"Zuo, T., Han, Z., Ma, C., Xiao, S., Lin, X., Li, Y., Wang, F., He, Y., He, Z., Zhang, J., Wang, G., Cheng, H.","doi":"10.1107/s1600576724000815","DOIUrl":"https://doi.org/10.1107/s1600576724000815","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"25 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140198281","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
DLSIA: Deep Learning for Scientific Image Analysis DLSIA：用于科学图像分析的深度学习
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-03-21 DOI: 10.1107/s1600576724001390
Roberts, E.J., Chavez, T., Hexemer, A., Zwart, P.H.
{"title":"DLSIA: Deep Learning for Scientific Image Analysis","authors":"Roberts, E.J., Chavez, T., Hexemer, A., Zwart, P.H.","doi":"10.1107/s1600576724001390","DOIUrl":"https://doi.org/10.1107/s1600576724001390","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"34 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140198284","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
FlɛX: a computer vision program to evaluate strain in flexible crystals FlɛX：评估柔性晶体应变的计算机视觉程序
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-03-15 DOI: 10.1107/s1600576723008282
Hsieh, B., Wu, L.-C., Grosjean, A.
{"title":"FlɛX: a computer vision program to evaluate strain in flexible crystals","authors":"Hsieh, B., Wu, L.-C., Grosjean, A.","doi":"10.1107/s1600576723008282","DOIUrl":"https://doi.org/10.1107/s1600576723008282","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"23 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140153183","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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