How X-ray dark-field imaging relates to small-angle X-ray scattering measurements.

IF 2.8 3区 材料科学 Q1 Biochemistry, Genetics and Molecular Biology
Journal of Applied Crystallography Pub Date : 2025-06-20 eCollection Date: 2025-08-01 DOI:10.1107/S1600576725004017
Clara Magnin, Manuel Fernández Martínez, Dan Mihai Cenda, Blandine Lantz, Scott Barton, Bertrand Faure, Emmanuel Brun
{"title":"How X-ray dark-field imaging relates to small-angle X-ray scattering measurements.","authors":"Clara Magnin, Manuel Fernández Martínez, Dan Mihai Cenda, Blandine Lantz, Scott Barton, Bertrand Faure, Emmanuel Brun","doi":"10.1107/S1600576725004017","DOIUrl":null,"url":null,"abstract":"<p><p>Dark-field (DF) imaging is a recent X-ray imaging modality which is promising because it gives access to information not resolved in conventional transmission X-ray imaging. The DF technique was first introduced as a loss of visibility of the grating interferometry modulations. DF signal is now measured with all the different X-ray phase contrast setups such as beam tracking or modulation-based imaging. Using a dedicated setup [Magnin <i>et al.</i> (2023). <i>Opt. Lett.</i> <b>48</b>, 5839-5842], we present in the present article combined measurements of small-angle X-ray scattering and DF signal on the same material. We confirm that DF imaging is sensitive to multiple refraction from a sample, as can be found in the literature on lung imaging, but we show that the DF signal is also sensitive to scattering events. Finally, we measure a porous membrane that creates both types of signal (scattering and refraction), showing that, contrary to existing models, it is difficult to be quantitative about DF.</p>","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"58 Pt 4","pages":"1347-1354"},"PeriodicalIF":2.8000,"publicationDate":"2025-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12321030/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Applied Crystallography","FirstCategoryId":"88","ListUrlMain":"https://doi.org/10.1107/S1600576725004017","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"2025/8/1 0:00:00","PubModel":"eCollection","JCR":"Q1","JCRName":"Biochemistry, Genetics and Molecular Biology","Score":null,"Total":0}
引用次数: 0

Abstract

Dark-field (DF) imaging is a recent X-ray imaging modality which is promising because it gives access to information not resolved in conventional transmission X-ray imaging. The DF technique was first introduced as a loss of visibility of the grating interferometry modulations. DF signal is now measured with all the different X-ray phase contrast setups such as beam tracking or modulation-based imaging. Using a dedicated setup [Magnin et al. (2023). Opt. Lett. 48, 5839-5842], we present in the present article combined measurements of small-angle X-ray scattering and DF signal on the same material. We confirm that DF imaging is sensitive to multiple refraction from a sample, as can be found in the literature on lung imaging, but we show that the DF signal is also sensitive to scattering events. Finally, we measure a porous membrane that creates both types of signal (scattering and refraction), showing that, contrary to existing models, it is difficult to be quantitative about DF.

x射线暗场成像与小角度x射线散射测量的关系。
暗场成像(DF)是一种新兴的x射线成像方式,因为它可以获得传统透射x射线成像无法解决的信息,因此具有广阔的应用前景。DF技术最初是作为光栅干涉调制的可见性损失而引入的。DF信号现在用所有不同的x射线相位对比装置测量,如光束跟踪或基于调制的成像。使用专用设置[Magnin et al.(2023)]。光学学报,48,5839-5842],我们在本文中提出了对同一材料的小角x射线散射和DF信号的综合测量。我们证实DF成像对样本的多次折射敏感,这可以在肺成像的文献中找到,但我们表明DF信号对散射事件也很敏感。最后,我们测量了一种产生两种类型信号(散射和折射)的多孔膜,表明与现有模型相反,很难对DF进行定量。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
CiteScore
10.00
自引率
3.30%
发文量
178
审稿时长
4.7 months
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信