Clara Magnin, Manuel Fernández Martínez, Dan Mihai Cenda, Blandine Lantz, Scott Barton, Bertrand Faure, Emmanuel Brun
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引用次数: 0
Abstract
Dark-field (DF) imaging is a recent X-ray imaging modality which is promising because it gives access to information not resolved in conventional transmission X-ray imaging. The DF technique was first introduced as a loss of visibility of the grating interferometry modulations. DF signal is now measured with all the different X-ray phase contrast setups such as beam tracking or modulation-based imaging. Using a dedicated setup [Magnin et al. (2023). Opt. Lett.48, 5839-5842], we present in the present article combined measurements of small-angle X-ray scattering and DF signal on the same material. We confirm that DF imaging is sensitive to multiple refraction from a sample, as can be found in the literature on lung imaging, but we show that the DF signal is also sensitive to scattering events. Finally, we measure a porous membrane that creates both types of signal (scattering and refraction), showing that, contrary to existing models, it is difficult to be quantitative about DF.
暗场成像(DF)是一种新兴的x射线成像方式,因为它可以获得传统透射x射线成像无法解决的信息,因此具有广阔的应用前景。DF技术最初是作为光栅干涉调制的可见性损失而引入的。DF信号现在用所有不同的x射线相位对比装置测量,如光束跟踪或基于调制的成像。使用专用设置[Magnin et al.(2023)]。光学学报,48,5839-5842],我们在本文中提出了对同一材料的小角x射线散射和DF信号的综合测量。我们证实DF成像对样本的多次折射敏感,这可以在肺成像的文献中找到,但我们表明DF信号对散射事件也很敏感。最后,我们测量了一种产生两种类型信号(散射和折射)的多孔膜,表明与现有模型相反,很难对DF进行定量。
期刊介绍:
Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.