用于放射性样品表征的屏蔽磁小角中子散射。

IF 6.1 3区 材料科学 Q1 Biochemistry, Genetics and Molecular Biology
Journal of Applied Crystallography Pub Date : 2025-05-31 eCollection Date: 2025-06-01 DOI:10.1107/S1600576725003176
Kevin G Field, Caleb P Massey, Kurt R Smith, Samuel A Briggs, Dalong Zhang, Kenneth C Littrell
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引用次数: 0

摘要

开发了一种用于执行小角中子散射(SANS)工作流程的铅屏蔽夹具,用于高辐照核材料的讯问。铅屏蔽是专门设计用于减少SANS实验中从样品中检测到的放射性,总体结构称为屏蔽磁性SANS (SM-SANS)。采用SM-SANS技术对C35M和125YF两种feral基合金在接收和辐照状态下的自由形状尺寸分布局部单分散模型进行了检测。由自由形状尺寸分布得到的定量值与原子探针层析实验进行了比较。使用两种表征技术确定的显微结构和成分参数是互补的。结果表明,SM-SANS技术是表征辐照材料体系中纳米级聚类的有效手段,为研究放射性材料微结构提供了新的途径。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
Shielded magnetic small-angle neutron scattering for characterization of radioactive samples.

The development of a Pb-shielded fixture for the execution of a small-angle neutron scattering (SANS)-based workflow for interrogation of highly irradiated nuclear materials has been explored. The Pb shielding was specially designed to reduce the detected radioactivity from the specimen during SANS experiments, and the overall configuration is termed shielded magnetic SANS (SM-SANS). Two FeCrAl-based alloys, C35M and 125YF, were examined with the SM-SANS technique using a free-form size distribution locally monodisperse model in both the as-received and irradiated states. Quantitative values derived from the free-form size distribution were compared with atom probe tomography experiments. Microstructural and compositional parameters determined using the two characterization techniques were complements of each other. The results demonstrate that the SM-SANS technique is an effective means of characterizing nanoscale clustering in irradiated material systems and provides new avenues for investigating radioactive material microstructures.

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来源期刊
CiteScore
10.00
自引率
3.30%
发文量
178
审稿时长
4.7 months
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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