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Journal of Applied Crystallography最新文献

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Operation model of a skew-symmetric split-crystal neutron interferometer 偏斜对称分晶中子干涉仪的运行模型
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-02-01 DOI: 10.1107/s1600576723010245
Sasso, C.P., Mana, G., Massa, E.
{"title":"Operation model of a skew-symmetric split-crystal neutron interferometer","authors":"Sasso, C.P., Mana, G., Massa, E.","doi":"10.1107/s1600576723010245","DOIUrl":"https://doi.org/10.1107/s1600576723010245","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"11 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139459101","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Using XAS to monitor radiation damage in real time and post-analysis, and investigation of systematic errors of fluorescence XAS for Cu-bound amyloid-β 利用 XAS 对辐射损伤进行实时监测和后期分析，以及对铜结合淀粉样蛋白-β的荧光 XAS 系统误差的研究
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-02-01 DOI: 10.1107/s1600576723010890
Ekanayake, R.S.K., Streltsov, V.A., Best, S.P., Chantler, C.T.
{"title":"Using XAS to monitor radiation damage in real time and post-analysis, and investigation of systematic errors of fluorescence XAS for Cu-bound amyloid-β","authors":"Ekanayake, R.S.K., Streltsov, V.A., Best, S.P., Chantler, C.T.","doi":"10.1107/s1600576723010890","DOIUrl":"https://doi.org/10.1107/s1600576723010890","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"96 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139518530","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Refinement of X-ray and electron diffraction crystal structures using analytical Fourier transforms of Slater-type atomic wavefunctions in Olex2 利用 Olex2 中斯莱特型原子波函数的分析傅里叶变换完善 X 射线和电子衍射晶体结构
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-02-01 DOI: 10.1107/s1600576723010981
Kleemiss, F., Peyerimhoff, N., Bodensteiner, M.
{"title":"Refinement of X-ray and electron diffraction crystal structures using analytical Fourier transforms of Slater-type atomic wavefunctions in Olex2","authors":"Kleemiss, F., Peyerimhoff, N., Bodensteiner, M.","doi":"10.1107/s1600576723010981","DOIUrl":"https://doi.org/10.1107/s1600576723010981","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"179 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139579087","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Introduction to the virtual collection of papers on Artificial neural networks: applications in X-ray photon science and crystallography 人工神经网络：X 射线光子科学和晶体学中的应用》虚拟论文集简介
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-02-01 DOI: 10.1107/s1600576723010476
Ekeberg, T.
{"title":"Introduction to the virtual collection of papers on Artificial neural networks: applications in X-ray photon science and crystallography","authors":"Ekeberg, T.","doi":"10.1107/s1600576723010476","DOIUrl":"https://doi.org/10.1107/s1600576723010476","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"52 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139459243","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
An electropneumatic cleaning device for piezo-actuator-driven picolitre-droplet dispensers 用于压电致动器驱动的皮升液滴分配器的电气动清洁装置
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-02-01 DOI: 10.1107/s1600576723009573
Berkes, A., Kleine-Doepke, S., Leimkohl, J.-P., Schikora, H., Mehrabi, P., Tellkamp, F., Schulz, E.C.
{"title":"An electropneumatic cleaning device for piezo-actuator-driven picolitre-droplet dispensers","authors":"Berkes, A., Kleine-Doepke, S., Leimkohl, J.-P., Schikora, H., Mehrabi, P., Tellkamp, F., Schulz, E.C.","doi":"10.1107/s1600576723009573","DOIUrl":"https://doi.org/10.1107/s1600576723009573","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"49 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139036479","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A simple solution to the Rietveld refinement recipe problem 里特维尔德精炼配方问题的简单解决方案
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-02-01 DOI: 10.1107/s1600576723011032
Toby, B.H.
{"title":"A simple solution to the Rietveld refinement recipe problem","authors":"Toby, B.H.","doi":"10.1107/s1600576723011032","DOIUrl":"https://doi.org/10.1107/s1600576723011032","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"78 3 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139579089","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Introduction to the special issue related to the 18th International Small Angle Scattering Conference (SAS2022) 第十八届国际小角散射会议(SAS2022)专刊简介
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2023-12-01 DOI: 10.1107/s1600576723010348
Florian Meneau, Jill Trewhella, Jan Ilavsky
{"title":"Introduction to the special issue related to the 18th International Small Angle Scattering Conference (SAS2022)","authors":"Florian Meneau, Jill Trewhella, Jan Ilavsky","doi":"10.1107/s1600576723010348","DOIUrl":"https://doi.org/10.1107/s1600576723010348","url":null,"abstract":"A new virtual special issue highlights some of the most exciting work presented at the 18th International Small Angle Scattering Conference (SAS2022), which took place in Campinas, Brazil. The articles included here were originally published in recent regular issues of <i>Journal of Applied Crystallography</i> and <i>Acta Crystallographica Section D</i>. The SAS2022 special issue is available at http://journals.iucr.org/special_issues/2023/sas2022/.","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"6 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2023-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138535899","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Time-resolved high-energy X-ray diffraction studies of ultrathin Ni ferrite films on MgO(001) MgO(001)表面超薄Ni铁氧体膜的时间分辨高能x射线衍射研究
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2023-11-29 DOI: 10.1107/s1600576723009287
Alexander, A., Pohlmann, T., Hoppe, M., Röh, J., Gutowski, O., Küpper, K., Bertram, F., Wollschläger, J.
{"title":"Time-resolved high-energy X-ray diffraction studies of ultrathin Ni ferrite films on MgO(001)","authors":"Alexander, A., Pohlmann, T., Hoppe, M., Röh, J., Gutowski, O., Küpper, K., Bertram, F., Wollschläger, J.","doi":"10.1107/s1600576723009287","DOIUrl":"https://doi.org/10.1107/s1600576723009287","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"41 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2023-11-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138535900","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The International Tables Symmetry Database 国际表对称数据库
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2023-11-29 DOI: 10.1107/s1600576723009068
de la Flor, G., Kroumova, E., Hanson, R.M., Aroyo, M.I.
{"title":"The International Tables Symmetry Database","authors":"de la Flor, G., Kroumova, E., Hanson, R.M., Aroyo, M.I.","doi":"10.1107/s1600576723009068","DOIUrl":"https://doi.org/10.1107/s1600576723009068","url":null,"abstract":"The International Tables Symmetry Database (https://symmdb.iucr.org/), which is part of International Tables for Crystallography, is a collection of individual databases of crystallographic space-group and point-group information with associated programs. The programs let the user access and in some cases interactively visualize the data, and some also allow new data to be calculated `on the fly'. Together these databases and programs expand upon and complement the symmetry information provided in International Tables for Crystallography Volume A, Space-Group Symmetry, and Volume A1, Symmetry Relations between Space Groups. The Symmetry Database allows users to learn about and explore the space and point groups, and facilitates the study of group–subgroup relations between space groups, with applications in determining crystal-structure relationships, in studying phase transitions and in domain-structure analysis. The use of the International Tables Symmetry Database in all these areas is demonstrated using several examples.","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"7 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2023-11-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138535901","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Texture measurements on quartz single crystals to validate coordinate systems for neutron time-of-flight texture analysis 石英单晶的织构测量以验证中子飞行时间织构分析的坐标系统
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2023-11-24 DOI: 10.1107/s1600576723009275
Schmitt, M.M., Savage, D.J., Yeager, J.D., Wenk, H.-R., Lutterotti, L., Vogel, S.C.
{"title":"Texture measurements on quartz single crystals to validate coordinate systems for neutron time-of-flight texture analysis","authors":"Schmitt, M.M., Savage, D.J., Yeager, J.D., Wenk, H.-R., Lutterotti, L., Vogel, S.C.","doi":"10.1107/s1600576723009275","DOIUrl":"https://doi.org/10.1107/s1600576723009275","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"166 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2023-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138535985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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