Benchmarking deep learning for automated peak detection on GIWAXS data.

IF 6.1 3区 材料科学 Q1 Biochemistry, Genetics and Molecular Biology
Journal of Applied Crystallography Pub Date : 2025-02-28 eCollection Date: 2025-04-01 DOI:10.1107/S1600576725000974
Constantin Völter, Vladimir Starostin, Dmitry Lapkin, Valentin Munteanu, Mikhail Romodin, Maik Hylinski, Alexander Gerlach, Alexander Hinderhofer, Frank Schreiber
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引用次数: 0

Abstract

Recent advancements in X-ray sources and detectors have dramatically increased data generation, leading to a greater demand for automated data processing. This is particularly relevant for real-time grazing-incidence wide-angle X-ray scattering (GIWAXS) experiments which can produce hundreds of thousands of diffraction images in a single day at a synchrotron beamline. Deep learning (DL)-based peak-detection techniques are becoming prominent in this field, but rigorous benchmarking is essential to evaluate their reliability, identify potential problems, explore avenues for improvement and build confidence among researchers for seamless integration into their workflows. However, the systematic evaluation of these techniques has been hampered by the lack of annotated GIWAXS datasets, standardized metrics and baseline models. To address these challenges, we introduce a comprehensive framework comprising an annotated experimental dataset, physics-informed metrics adapted to the GIWAXS geometry and a competitive baseline - a classical, non-DL peak-detection algorithm optimized on our dataset. Furthermore, we apply our framework to benchmark a recent DL solution trained on simulated data and discover its superior performance compared with our baseline. This analysis not only highlights the effectiveness of DL methods for identifying diffraction peaks but also provides insights for further development of these solutions.

对深度学习在GIWAXS数据上的自动峰值检测进行基准测试。
x射线源和探测器的最新进展大大增加了数据生成,导致对自动化数据处理的更大需求。这对于实时掠射广角x射线散射(GIWAXS)实验尤其重要,该实验可以在一天内在同步加速器光束线上产生数十万张衍射图像。基于深度学习(DL)的峰值检测技术在这一领域正变得越来越突出,但严格的基准测试对于评估其可靠性、识别潜在问题、探索改进途径以及在研究人员之间建立信心以无缝集成到他们的工作流程中至关重要。然而,由于缺乏带注释的GIWAXS数据集、标准化指标和基线模型,这些技术的系统评估受到了阻碍。为了应对这些挑战,我们引入了一个全面的框架,该框架包括一个带注释的实验数据集、适应GIWAXS几何形状的物理指标和一个竞争性基线——一种经典的、非深度学习的峰值检测算法,该算法在我们的数据集上进行了优化。此外,我们将我们的框架应用于最近在模拟数据上训练的深度学习解决方案的基准测试,并发现其性能优于我们的基线。该分析不仅突出了DL方法识别衍射峰的有效性,而且为这些解决方案的进一步发展提供了见解。
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来源期刊
CiteScore
10.00
自引率
3.30%
发文量
178
审稿时长
4.7 months
期刊介绍: Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.
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