Erik Biehler, Silvina Pagola, Daniel Stam, Johannes Merkelbach, Christian Jandl, Tarek M Abdel-Fattah
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引用次数: 0
摘要
本研究成功地利用微晶电子衍射(microED)和x射线粉末衍射(XRPD)测定了新相TAF-CNU-1, Ni(C8H4O4)·3H2O的晶体结构,用微晶电子衍射(microED)从粉末中的单个微晶中求解,并在运动和动态电子衍射理论水平上进行了细化。该镍金属有机骨架(MOF)及其类似物(M (C8H4O4)·2H2O, M = MnII或CoII)以相应的水合金属氯化物和对苯二甲酸钠为原料,在水介质中以一锅法制备,作为一种有前途的“绿色”合成湿稳定性MOF的途径。后两种材料的晶体结构先前已由x射线粉末衍射从头确定。简要总结了两种结构表征技术的优缺点。利用热重分析、扫描电镜和傅里叶变换红外光谱对其进行了固态性能表征。
A comparison of microcrystal electron diffraction and X-ray powder diffraction for the structural analysis of metal-organic frameworks.
This study successfully implemented microcrystal electron diffraction (microED) and X-ray powder diffraction (XRPD) for the crystal structure determination of a new phase, TAF-CNU-1, Ni(C8H4O4)·3H2O, solved by microED from single microcrystals in the powder and refined at the kinematic and dynamic electron diffraction theory levels. This nickel metal-organic framework (MOF), together with its cobalt and manganese analogues with formula M(C8H4O4)·2H2O with M = MnII or CoII, were synthesized in aqueous media as one-pot preparations from the corresponding hydrated metal chlorides and sodium terephthalate, as a promising 'green' synthetic route to moisture-stable MOFs. The crystal structures of the two latter materials have been previously determined ab initio from X-ray powder diffraction. The advantages and disadvantages of both structural characterization techniques are briefly summarized. Additional solid-state property characterization was carried out using thermogravimetric analysis, scanning electron microscopy and Fourier transform infrared spectroscopy.
期刊介绍:
Many research topics in condensed matter research, materials science and the life sciences make use of crystallographic methods to study crystalline and non-crystalline matter with neutrons, X-rays and electrons. Articles published in the Journal of Applied Crystallography focus on these methods and their use in identifying structural and diffusion-controlled phase transformations, structure-property relationships, structural changes of defects, interfaces and surfaces, etc. Developments of instrumentation and crystallographic apparatus, theory and interpretation, numerical analysis and other related subjects are also covered. The journal is the primary place where crystallographic computer program information is published.