Three-point bending behavior of individual ZnO nanowires studied by in situ Laue microdiffraction.

Abstract

The mechanical behavior of piezoelectric semiconductor ZnO nanowires was studied in three-point bending configuration using the custom-built atomic force microscope SFINX coupled with in situ Laue microdiffraction. Besides bending, torsion of the nanowires was shown during mechanical loading. A fracture strength of up to 3 GPa was demonstrated, which is about one order of magnitude higher than that for bulk ZnO. In the case of a piezoelectric material like ZnO, this fracture strength represents the maximum elastic strain that could eventually be converted into electrical energy by the piezoelectric effect. The significantly increased fracture strength found for nanowires compared with bulk ZnO thus offers increased energy-harvesting potential from material flexing. While bulk ZnO is a brittle material, plasticity with the storage of dislocations in the basal plane was shown in the three-point bent ZnO nanowires.