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Journal of Applied Crystallography最新文献

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Millisecond X-ray reflectometry and neural network analysis: unveiling fast processes in spin coating 毫秒级 X 射线反射测量和神经网络分析：揭示旋涂中的快速过程
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-03-15 DOI: 10.1107/s1600576724001171
Schumi-Mareček, D., Bertram, F., Mikulík, P., Varshney, D., Novák, J., Kowarik, S.
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引用次数: 0
Convolutional neural network approach for the automated identification of in cellulo crystals 卷积神经网络自动识别胞内晶体的方法
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-02-23 DOI: 10.1107/s1600576724000682
Kardoost, A., Schönherr, R., Deiter, C., Redecke, L., Lorenzen, K., Schulz, J., de Diego, I.
{"title":"Convolutional neural network approach for the automated identification of in cellulo crystals","authors":"Kardoost, A., Schönherr, R., Deiter, C., Redecke, L., Lorenzen, K., Schulz, J., de Diego, I.","doi":"10.1107/s1600576724000682","DOIUrl":"https://doi.org/10.1107/s1600576724000682","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"2 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139968155","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
X-ray diffraction from dislocation half-loops in epitaxial films 外延薄膜中位错半环的 X 射线衍射
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-02-23 DOI: 10.1107/s160057672400089x
Kaganer, V.M.
{"title":"X-ray diffraction from dislocation half-loops in epitaxial films","authors":"Kaganer, V.M.","doi":"10.1107/s160057672400089x","DOIUrl":"https://doi.org/10.1107/s160057672400089x","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"34 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139967821","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
A note on the Hendrickson–Lattman phase probability distribution and its equivalence to the generalized von Mises distribution 关于亨德里克森-拉特曼相位概率分布及其与广义冯-米塞斯分布等价性的说明
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-02-16 DOI: 10.1107/s1600576724000311
Barnett, M.J., Kingston, R.L.
{"title":"A note on the Hendrickson–Lattman phase probability distribution and its equivalence to the generalized von Mises distribution","authors":"Barnett, M.J., Kingston, R.L.","doi":"10.1107/s1600576724000311","DOIUrl":"https://doi.org/10.1107/s1600576724000311","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"51 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139921654","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Revisiting the hydrogenation behavior of NdGa and its hydride phases 重新审视钕镓及其氢化物相的氢化行为
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-02-16 DOI: 10.1107/s1600576724000554
Shtender, V., Cedervall, J., Ek, G., Zlotea, C., Andersson, M.S., Manuel, P., Sahlberg, M., Häussermann, U.
{"title":"Revisiting the hydrogenation behavior of NdGa and its hydride phases","authors":"Shtender, V., Cedervall, J., Ek, G., Zlotea, C., Andersson, M.S., Manuel, P., Sahlberg, M., Häussermann, U.","doi":"10.1107/s1600576724000554","DOIUrl":"https://doi.org/10.1107/s1600576724000554","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"19 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139921846","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Tripling of the scattering vector range of X-ray reflectivity on liquid surfaces using a double-crystal deflector 利用双晶偏转器将液体表面 X 射线反射率的散射矢量范围扩大两倍
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-02-16 DOI: 10.1107/s1600576724000657
Konovalov, O., Rein, V., Saedi, M., Groot, I.M.N., Renaud, G., Jankowski, M.
{"title":"Tripling of the scattering vector range of X-ray reflectivity on liquid surfaces using a double-crystal deflector","authors":"Konovalov, O., Rein, V., Saedi, M., Groot, I.M.N., Renaud, G., Jankowski, M.","doi":"10.1107/s1600576724000657","DOIUrl":"https://doi.org/10.1107/s1600576724000657","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"141 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139921764","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Visualizing the fibre texture of satin spar using laboratory 2D X-ray diffraction 利用实验室二维 X 射线衍射技术观察缎面麻花的纤维纹理
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-02-12 DOI: 10.1107/s1600576724000529
Wang, X., Schrank, C., Jones, M.
{"title":"Visualizing the fibre texture of satin spar using laboratory 2D X-ray diffraction","authors":"Wang, X., Schrank, C., Jones, M.","doi":"10.1107/s1600576724000529","DOIUrl":"https://doi.org/10.1107/s1600576724000529","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"74 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139751539","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Pixel Anomaly Detection Tool: a user-friendly GUI for classifying detector frames using machine-learning approaches 像素异常检测工具：使用机器学习方法对检测帧进行分类的用户友好型图形用户界面
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-02-12 DOI: 10.1107/s1600576724000116
Ketawala, G., Reiter, C.M., Fromme, P., Botha, S.
{"title":"The Pixel Anomaly Detection Tool: a user-friendly GUI for classifying detector frames using machine-learning approaches","authors":"Ketawala, G., Reiter, C.M., Fromme, P., Botha, S.","doi":"10.1107/s1600576724000116","DOIUrl":"https://doi.org/10.1107/s1600576724000116","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"51 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139751563","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Fast nanoscale imaging of strain in a multi-segment heterostructured nanowire with 2D Bragg ptychography 利用二维布拉格层析成像技术对多段异质结构纳米线中的应变进行快速纳米级成像
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-02-01 DOI: 10.1107/s1600576723010403
Hammarberg, S., Dzhigaev, D., Marcal, L.A.B., Dagyte, V., Björling, A., Borgström, M.T., Wallentin, J.
{"title":"Fast nanoscale imaging of strain in a multi-segment heterostructured nanowire with 2D Bragg ptychography","authors":"Hammarberg, S., Dzhigaev, D., Marcal, L.A.B., Dagyte, V., Björling, A., Borgström, M.T., Wallentin, J.","doi":"10.1107/s1600576723010403","DOIUrl":"https://doi.org/10.1107/s1600576723010403","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"6 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139458965","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
ProLEED Studio: software for modeling low-energy electron diffraction patterns ProLEED Studio：低能电子衍射图案建模软件
IF 6.1 3区 材料科学
Journal of Applied Crystallography Pub Date : 2024-02-01 DOI: 10.1107/s1600576723010312
Procházka, P., Čechal, J.
{"title":"ProLEED Studio: software for modeling low-energy electron diffraction patterns","authors":"Procházka, P., Čechal, J.","doi":"10.1107/s1600576723010312","DOIUrl":"https://doi.org/10.1107/s1600576723010312","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"6 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139036338","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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