Guang-Xiang Fan, D. Jin, Wanrong Zhang, Xin Lei, Yu-Xin Zhou, Yuanda Liu
{"title":"Thermal design of circular VCSEL arrays for optical output performance improvement","authors":"Guang-Xiang Fan, D. Jin, Wanrong Zhang, Xin Lei, Yu-Xin Zhou, Yuanda Liu","doi":"10.1109/SSLChinaIFWS57942.2023.10071014","DOIUrl":"https://doi.org/10.1109/SSLChinaIFWS57942.2023.10071014","url":null,"abstract":"With the aid of the thermo-electro-optical model of two-dimensional vertical-cavity surface-emitting laser (VCSEL) arrays, the layout of circular VCSEL array is optimized to improve the optical output performance. Taking a circular VCSEL array with 19 cells (including 2 circles) for example, the impact of circle radius (r) and deviated angle from the symmetry center of the array (θ) on the non-uniformity of junction temperature profile are studied in detail. It is shown that increasing the inner circle radius r could decrease the peak junction temperature difference effectively. At the same time, the outer circle diameter is unchanged to keep the total area of the array remains the same. Moreover, the deviated angle θ could be designed carefully to further improve the non-uniformity of junction temperature profile. As a result, a novel circular VCSEL array with inner circle radius r of 42μm and deviated angle θ of 23° is proposed, where the non-uniformity of junction temperature profile and bias current distribution is improved by 43.66% and 44.07%, respectively, and hence enhance the optical output power, when compared with that of the conventional circular VCSEL array.","PeriodicalId":145298,"journal":{"name":"2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133013157","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Shenkai Lu, Kaiwen Chen, Jiabao Liu, Pengju Cui, Ang Li, Wen Liu
{"title":"Design and simulation of GaN devices and integrated circuits using ASM compact HEMT model for mixed-signal applications","authors":"Shenkai Lu, Kaiwen Chen, Jiabao Liu, Pengju Cui, Ang Li, Wen Liu","doi":"10.1109/SSLChinaIFWS57942.2023.10071042","DOIUrl":"https://doi.org/10.1109/SSLChinaIFWS57942.2023.10071042","url":null,"abstract":"This paper introduces the usability of the GaN advanced spice model (ASM) structure in simulating the performance of the device and circuits. The GaN high electron mobility transistor (HEMT) model of the E-mode and the D-mode could be obtained by fitting the GaN metal-insulator-semiconductor (MIS) HEMT experimental characteristics. Then these two symbols are utilized for basic logic gates as NOT and NAND. Two drivers, direct-coupled FET logic (DCFL) and pseudo-complementary FET logic (PCFL) are designed in the GaN integrated circuits. This model can also work well in achieving the digital function of the shift register. The results show the convergence and accuracy of the models while demonstrating the potential of an all-GaN mixed-signal power conversion system.","PeriodicalId":145298,"journal":{"name":"2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114530766","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A Simulation Study of Multi-Channel AlInN/GaN Schottky Barrier Diodes and Experimental Comparison with Low On-resistance of 1.9 Ω•mm","authors":"Yongxin Li, Ang Li, Chong Wang","doi":"10.1109/SSLChinaIFWS57942.2023.10070934","DOIUrl":"https://doi.org/10.1109/SSLChinaIFWS57942.2023.10070934","url":null,"abstract":"In this work, a five channel lattice-matched AlInN/GaN heterostructure SBD is presented to improve the DC characteristics based on Silvaco-Atlas software and the simulation results. The influences of the number of channels, the thickness of the barrier layer, the In composition of the barrier layer, and the anode-cathode distance (Lac) are theoretically investigated. For an Al0.83In0.17N diode, compared with single channel devices, it offers a reduction of 68% in on-resistance, RON (from 6.25 to 1.98 Ω•mm), and 28% (from 1.25 to 0.91 V) in forward voltage, VF. The 2DEG sheet density increases significantly as the In composition decreases and the Al composition increases. When the thickness of the barrier layer increases, the confinement effect of the quantum well will strengthen, and the performance of SBD will be optimized. Finally, we demonstrated a five-channel AlInN/GaN heterojunction SBD sample with VF of 0.81 V and RON of 1.9 Ω•mm which is in high agreement with simulation results and is much better than those conventional AlGaN/GaN heterojunction SBDs with the same device area.","PeriodicalId":145298,"journal":{"name":"2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117217692","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Yixu Yao, Q. Jiang, Sen Huang, Xinhua Wang, Hao Jin, Xinyue Dai, Jie Fan, H. Yin, K. Wei, Xinyu Liu
{"title":"Dynamic-QGD of Enhancement-mode AlGaN/GaN MIS-HEMTs Induced by Bulk/Interface States in SiNx Passivation Dielectric","authors":"Yixu Yao, Q. Jiang, Sen Huang, Xinhua Wang, Hao Jin, Xinyue Dai, Jie Fan, H. Yin, K. Wei, Xinyu Liu","doi":"10.1109/SSLChinaIFWS57942.2023.10071109","DOIUrl":"https://doi.org/10.1109/SSLChinaIFWS57942.2023.10071109","url":null,"abstract":"Effect of bulk/interface states in passivation dielectrics on dynamic gate-drain capacitance (CGD) and QGD of GaN-based power devices, was systematically investigated by inductive-load switching, voltage/temperature-dependent capacitance-voltage (C-V) and deep level transient spectroscopy (DLTS). DLTS measurements confirm that a continuous distributed bulk state with activation energy (EC-ET) higher than 1.1 ± 0.05 eV, presents in SiNx passivation dielectric grown by low-pressure chemical vapor deposition (LPCVD). It is revealed that the trapping/de-trapping of these bulk states will give rise to QGD instability in T-shape gate enhancement-mode (E-mode) AlGaN/GaN MIS-HEMTs (metal-insulator-semiconductor high-electron-mobility transistors), leading to undesirable degradation of switching characteristics.","PeriodicalId":145298,"journal":{"name":"2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129454710","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Strain related degradation of highly tensile-strained multi-quantum well laser diodes","authors":"Bin Chen, Chentao Cao, Xianghui Che, Yulong Fang","doi":"10.1109/SSLChinaIFWS57942.2023.10071021","DOIUrl":"https://doi.org/10.1109/SSLChinaIFWS57942.2023.10071021","url":null,"abstract":"Incorporating strain in AlGaInAs multi-quantum well (MQW) active region is one of the key factors for achieving high performance laser diode for optical communication system. However, incorporating strain in thin film material may degrade the lattice or interface quality, which not only makes the crystal growth process challenging but also lead to gradual degradation behavior of optical device. In this work, four 1.3 um AlGaInAs laser diode epitaxial layers with different MQW strain compensation or growth parameter were fabricated by MOCVD. They were processed into ridge waveguide (RWG) laser diodes and burn-in test was carried out. By comparing the degradation behavior of the devices from the four wafers, it was concluded that strain compensation was the most important factor for achieving high reliability optical devices.","PeriodicalId":145298,"journal":{"name":"2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131320260","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Xiu Zhang, Baoxing Wang, Shuqi Li, H. Guo, Rui Yue, Y. Cai
{"title":"High-voltage Linear LED for Three-phase AC Power Applications","authors":"Xiu Zhang, Baoxing Wang, Shuqi Li, H. Guo, Rui Yue, Y. Cai","doi":"10.1109/SSLChinaIFWS57942.2023.10070980","DOIUrl":"https://doi.org/10.1109/SSLChinaIFWS57942.2023.10070980","url":null,"abstract":"This paper investigates high-voltage light emitting diodes (LEDs) driven linearly by three-phase AC power, which features high reliability, cost effectiveness, all-solid-state components, and a minimum number of driving elements. To verify the optical and electrical properties of high-voltage LED, a high-voltage LED lighting system driven linearly by three-phase AC power was built as a prototype in this paper. At the rated voltage of 380V, the LED lighting system has input power of 145W, total luminance flux of 18500lm, luminous efficacy of 127lm/W, correlated color temperature (CCT) of 5617K, and color rendering index (Ra) of 70.6, power factor (PF) of 0.95. Further, the experimental results show that stable output luminance, high luminous efficacy, high PF, and flicker-free are achieved within 380V±10% voltage fluctuation.","PeriodicalId":145298,"journal":{"name":"2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)","volume":"630 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131842237","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Research on monolithic integrated driver of Micro LED","authors":"Fang Aoqi, G. Weiling, Xu Hao, Liu Jixin","doi":"10.1109/SSLChinaIFWS57942.2023.10071104","DOIUrl":"https://doi.org/10.1109/SSLChinaIFWS57942.2023.10071104","url":null,"abstract":"Micro LED (light-emitting diode) is maturely used in the fields of space display, medical detection and visible light communication due to its unique features of miniaturization, low power consumption, fast response speed and high resolution. However, since the driver circuits are usually composed of Si devices, a large number of Micro LED pixels must be transferred from their GaN substrates to bond with Si field-effect transistors (FETs) by mass transfer techniques. Since there are certain technical bottlenecks in the mass transfer technology of Micro LED, relevant scholars at home and abroad have successively put forward the idea of integrating LED and field effect transistor driving circuit on the same substrate, so as to avoid the issues of low yield and poor accuracy. This paper summarizes the research on monolithic integrated active driving of LEDs and Micro LEDs at home and abroad in recent years. These researches include: monolithic integration of high mobility field effect transistors (HEMTs) and LEDs, metal oxide field effect transistors (MOSFET) and LED monolithic integration and thin film field effect transistor (TFT) monolithic integration with Micro LED.","PeriodicalId":145298,"journal":{"name":"2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)","volume":"143 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123342285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Design and Simulation of Quasi-Vertical GaN Based Junction Barrier Schottky Diode","authors":"Yalong Qin, Haijuan Cheng, Weiling Guo, Aoqi Fang, Jing Li, Haoran Guo","doi":"10.1109/SSLChinaIFWS57942.2023.10071124","DOIUrl":"https://doi.org/10.1109/SSLChinaIFWS57942.2023.10071124","url":null,"abstract":"In order to improve the reverse breakdown characteristics of quasi-vertical GaN-based Schottky barrier diode (SBD), a junction barrier Schottky diode (JBS) is designed in this paper, and device modeling and characteristic simulation are carried out. Comparing the SBD and JBS devices with the same epitaxial structure, the breakdown voltages of the devices are 310V and 1145V, respectively. Compared to SBD devices, JBS has a higher breakdown voltage. In order to continue to improve the performance of the device, after optimizing the thickness of the N-GaN drift layer of the JBS device, it is found that increasing the thickness of the N-GaN drift layer can effectively improve the breakdown voltage of the JBS, but the on-resistance of the device also increases slightly. The breakdown voltage of the optimized JBS device is 1812V; the ratio of the area of the Schottky contact area to the area of the PiN area will also affect the performance of the vertical JBS device, and the area ratio of the Schottky contact area is increased from 0.379 to 0.67, the on-resistance of the device is reduced from 1.097mΩ•cm2 to 0.747 mΩ•cm2, and the reverse breakdown voltage is slightly reduced. The research results provide a theoretical reference for device structure design and process fabrication.","PeriodicalId":145298,"journal":{"name":"2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127972979","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Design of low-noise multi-channel active surface electromyography acquisition equipment","authors":"Nan Jiang, A. Guo, Qiang Lei, Zhigan Wang","doi":"10.1109/SSLChinaIFWS57942.2023.10071075","DOIUrl":"https://doi.org/10.1109/SSLChinaIFWS57942.2023.10071075","url":null,"abstract":"The vast majority of sEMG acquisition systems use wired transmission, which makes the signal highly susceptible to power-frequency interference. In addition, the sEMG signal is relatively weak, and preprocessing such as amplification, filtering, and denoising is crucial. In this paper, a low-noise and high-precision multi-channel active surface electromyography acquisition device that supports up to 16 channels of acquisition is designed and developed, which is used to collect muscle signals of various upper limb movements. The system uses active electrodes to achieve a higher signal-to-noise ratio (SNR), which can be improved by 64.04% compared to passive electrodes. And the integrated functions of active electrode array drive, weak signal acquisition and right leg drive create hardware conditions for the subsequent research on surface EMG signal processing.","PeriodicalId":145298,"journal":{"name":"2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126982683","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Enhanced Performance of a Metal-insulator-semiconductor Structured p/n-Electrode for InGaN-based Green LEDs","authors":"Huang Wenjun, Miao Xiangyu, Liu Zhaojun","doi":"10.1109/SSLChinaIFWS57942.2023.10071078","DOIUrl":"https://doi.org/10.1109/SSLChinaIFWS57942.2023.10071078","url":null,"abstract":"The effect of inserting an insulating layer between the p/n-electrode and the semiconductor are fabricated and investigated for gallium nitride (GaN)-based Micro light-emitting-diodes (µ-LEDs). The 2-nm Al2O3 insulator layer is inserted to form the MIS structure by using an atomic deposition system, which improves the interband tunneling efficiency and the corresponding hole injection efficiency somehow. Therefore, the current-voltage characteristic is increased when compared with a traditional GaN-LED.","PeriodicalId":145298,"journal":{"name":"2022 19th China International Forum on Solid State Lighting & 2022 8th International Forum on Wide Bandgap Semiconductors (SSLCHINA: IFWS)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129465371","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}