Design and simulation of GaN devices and integrated circuits using ASM compact HEMT model for mixed-signal applications

Shenkai Lu, Kaiwen Chen, Jiabao Liu, Pengju Cui, Ang Li, Wen Liu
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引用次数: 1

Abstract

This paper introduces the usability of the GaN advanced spice model (ASM) structure in simulating the performance of the device and circuits. The GaN high electron mobility transistor (HEMT) model of the E-mode and the D-mode could be obtained by fitting the GaN metal-insulator-semiconductor (MIS) HEMT experimental characteristics. Then these two symbols are utilized for basic logic gates as NOT and NAND. Two drivers, direct-coupled FET logic (DCFL) and pseudo-complementary FET logic (PCFL) are designed in the GaN integrated circuits. This model can also work well in achieving the digital function of the shift register. The results show the convergence and accuracy of the models while demonstrating the potential of an all-GaN mixed-signal power conversion system.
使用ASM紧凑型HEMT模型设计和模拟混合信号应用的GaN器件和集成电路
本文介绍了GaN高级香料模型(ASM)结构在模拟器件和电路性能方面的可用性。通过拟合GaN金属-绝缘体-半导体(MIS) HEMT实验特性,得到了GaN高电子迁移率晶体管(HEMT)的e模和d模模型。然后将这两个符号用于基本逻辑门,如非门和非与门。在GaN集成电路中设计了直接耦合FET逻辑(DCFL)和伪互补FET逻辑(PCFL)两个驱动器。该模型还可以很好地实现移位寄存器的数字化功能。结果表明了模型的收敛性和准确性,同时展示了全氮化镓混合信号功率转换系统的潜力。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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