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1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)最新文献

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Ageing tests of radiation damaged lasers and photodiodes for the CMS experiment at CERN 欧洲核子研究中心CMS实验中辐射损坏激光器和光电二极管的老化测试
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858620
K. Gill, C. Azevedo, J. Batten, G. Cervelli, R. Grabit, F. Jensen, J. Troska, F. Vasey
{"title":"Ageing tests of radiation damaged lasers and photodiodes for the CMS experiment at CERN","authors":"K. Gill, C. Azevedo, J. Batten, G. Cervelli, R. Grabit, F. Jensen, J. Troska, F. Vasey","doi":"10.1109/RADECS.1999.858620","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858620","url":null,"abstract":"The effects of thermally accelerated ageing in irradiated and unirradiated 1310 nm InGaAsP edge-emitting lasers and InGaAs p-i-n photodiodes are presented. 40 lasers (20 irradiated) and 30 photodiodes (19 irradiated) were aged for 4000 hours at 80/spl deg/C. Periodic measurements were made of laser threshold and efficiency, and p-i-n leakage current and photocurrent. There were no sudden failures and there was very little wearout related degradation in either unirradiated or irradiated sample groups. The results suggest that the tested devices have a sufficiently long lifetime to operate for at least 10 years inside the Compact Muon Solenoid experiment despite being exposed to a harsh radiation environment.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133043635","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Vulnerability analysis of DT fusion diagnostics for laser megajoule facility a new tool: Diacad 激光兆焦耳设施DT聚变诊断的漏洞分析新工具:Diacad
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858543
C. D'hose, J. Baggio, O. Musseau, Y.M. Coie
{"title":"Vulnerability analysis of DT fusion diagnostics for laser megajoule facility a new tool: Diacad","authors":"C. D'hose, J. Baggio, O. Musseau, Y.M. Coie","doi":"10.1109/RADECS.1999.858543","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858543","url":null,"abstract":"The development of huge laser facilities for inertial confinement fusion pushes the design of new nuclear diagnostic links to study the DT fusion. The electronic and optoelectronic equipments of these links are facing high radiative constraints due to the very short neutron and gamma pulses. We have developed a new computer-based tool to address the sensitivity to this type of environment of nuclear diagnostic links. This tool takes into account the vulnerability of individual parts and the global structure of the link. It allows to identify the weakest elements of the link, and then to feedback with hardening and/or shielding actions.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132349592","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
SOFTI: intermediate results of long term irradiation and thermal ageing tests of photonic components SOFTI:光子元件长期辐照和热老化试验的中间结果
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858631
A. Nowodzinski, M. Van Uffelen, P. Jucker, J. Calmet, G. Gauthier
{"title":"SOFTI: intermediate results of long term irradiation and thermal ageing tests of photonic components","authors":"A. Nowodzinski, M. Van Uffelen, P. Jucker, J. Calmet, G. Gauthier","doi":"10.1109/RADECS.1999.858631","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858631","url":null,"abstract":"This paper presents the first results of long term experiments conducted within the SOFTI (Study of Optical Fibres and components under Thermal ageing and Irradiation) project. This on-going 6-years study is intended to determine the effects of ageing on the behaviour of optical fibres and their fibre-end components submitted to harsh environments, with respect to the safety of nuclear facilities. The test program consists of irradiations at low dose rates with different thermal constraints and spool radius. After completion, these tests will enable us to write a guideline for qualification procedures related to future fibre-optic systems, for their applications in nuclear facilities. The observations of these first results show a clear dependence of the radius of curvature for the radiation induced loss. To our knowledge, it is the first time that this was experimentally verified for a radius of curvature superior to 6 cm.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131560297","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Single event transient characterisation of analog IC's for ESA's satellites 欧空局卫星模拟集成电路的单事件瞬态特性
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858650
R. Harboe-Sørensen, F. Guerre, H. Constans, J. van Dooren, G. Berger, W. Hajdas
{"title":"Single event transient characterisation of analog IC's for ESA's satellites","authors":"R. Harboe-Sørensen, F. Guerre, H. Constans, J. van Dooren, G. Berger, W. Hajdas","doi":"10.1109/RADECS.1999.858650","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858650","url":null,"abstract":"The analysis of four self switch-off events in the power supply on-board ESA's SOHO satellite point strongly in the direction of being cosmic ray or proton induced. Detailed analysis of the relevant power supply schematics identified a number of analog IC's capable of causing or contributing to such events. This paper details the effort taken in order to characterise the upset sensitivity of the various analog IC's flown. Testing aspects and Single Event Transient (SET) results are presented. Ground testing, simulating the flight conditions, were carried out at both heavy ion and proton accelerators.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123009381","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 35
Oxide charge modeling with CEA-TRAPPOX code version 4. Comparison of trapping models on desktop computer 氧化电荷建模与CEA-TRAPPOX代码版本4。台式计算机上捕获模型的比较
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858546
J. Leray, P. Paillet, O. Flament, A. Torres
{"title":"Oxide charge modeling with CEA-TRAPPOX code version 4. Comparison of trapping models on desktop computer","authors":"J. Leray, P. Paillet, O. Flament, A. Torres","doi":"10.1109/RADECS.1999.858546","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858546","url":null,"abstract":"The charge trapped in oxides depends on a large number of parameters (spatial and energetic distributions of traps, voltage and dose-rate profiles, internal space-charge effect, etc.). We demonstrate that 1D simulations with personal computers can be effective in extracting oxide parameters from experimental data, thus enabling prediction of MOS degradation in various mission profiles.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123328366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Radiation effects on active pixel sensors 辐射对有源像素传感器的影响
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858623
M. Cohen, J. David
{"title":"Radiation effects on active pixel sensors","authors":"M. Cohen, J. David","doi":"10.1109/RADECS.1999.858623","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858623","url":null,"abstract":"An active pixel sensor (APS) is defined as a CMOS detector array that has at least one active transistor integrated into the pixel. Two kinds of detector arrays were used: one photodiode and one photogate. Their tolerance against total dose and proton irradiations are evaluated.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"81 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124838590","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
Using a carbon beam as a probe to extract the thickness of sensitive volumes 利用碳束作为探针提取敏感体积的厚度
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858573
C. Inguimbert, S. Duzellier, R. Ecoffet, L. Guibert, J. Barak, M. Chabot
{"title":"Using a carbon beam as a probe to extract the thickness of sensitive volumes","authors":"C. Inguimbert, S. Duzellier, R. Ecoffet, L. Guibert, J. Barak, M. Chabot","doi":"10.1109/RADECS.1999.858573","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858573","url":null,"abstract":"The upset rate calculation depends on the energy deposited along the secondaries paths in a sensitive volume (Sv) of thickness d. We have developed a new extraction method in order to get d from experimental data. It is based upon the deconvolution of the heavy ion upset cross section function /spl sigma//sub seu/(r) with LET(r) (r is the range of the incident ion).","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125367595","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 16
Tests of the wire ageing induced by radiation in the barrel muon chambers of the CMS experiment at LHC 大型强子对撞机管状介子室辐射诱导导线老化试验
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858586
E. Conti, R. Ballerini, F. Gasparini
{"title":"Tests of the wire ageing induced by radiation in the barrel muon chambers of the CMS experiment at LHC","authors":"E. Conti, R. Ballerini, F. Gasparini","doi":"10.1109/RADECS.1999.858586","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858586","url":null,"abstract":"We show experimental results about the wire ageing induced by pollutants in Ar/CO/sub 2/ gas irradiated by X-rays. The tests are important for the barrel muon chambers of the CMS experiment at the LHC, because they should operate for 10 years in a radiation field (muons, neutrons, gamma's).","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127235511","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Electromagnetic and radiation environment effects on pacemakers 电磁和辐射环境对心脏起搏器的影响
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858541
J. Mouton, R. Trochet, J. Vicrey, M. Sauvage, B. Chauvenet, A. Ostrovski, E. Leroy, R. Haug, B. Dodinot, F. Joffre
{"title":"Electromagnetic and radiation environment effects on pacemakers","authors":"J. Mouton, R. Trochet, J. Vicrey, M. Sauvage, B. Chauvenet, A. Ostrovski, E. Leroy, R. Haug, B. Dodinot, F. Joffre","doi":"10.1109/RADECS.1999.858541","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858541","url":null,"abstract":"The increase, on one hand, of patients bearing pacemakers for cardiac deficiencies and on the other hand, of the number of cancer patients, increases the probability of several simultaneous therapy needs. Cancer radiation therapy involves specific damages to sensitive electronic devices such as pacemakers. Oncologists demand risk evaluation and rules for applying radiation therapy to cancer patients bearing pacemakers. Pacemaker manufacturers assess maximum radiation dose for secure running at 5 Gy level. Our experiments show that this security level must be lowered to 2 Gy.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128402137","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Nanocontrollers characterization under radiation 辐射下纳米控制器的表征
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858653
F. Bezerra, S. Barde, J. Carayon, M. Sarthou
{"title":"Nanocontrollers characterization under radiation","authors":"F. Bezerra, S. Barde, J. Carayon, M. Sarthou","doi":"10.1109/RADECS.1999.858653","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858653","url":null,"abstract":"Within the framework of the MICROSAT and ROSETTA projects, CNES (French National Agency) has characterized the behavior of 4 nanocontrollers under heavy ions, protons and total dose. These products are frequently used in industrial and commercial applications. They have been chosen for ROSETTA (S-band transmitter/receiver and TM/TC) and MICROSAT (OBC and payload management unit) for the following reasons : easy use, numerous I/Os; 12C link, USART, timer, ADC, internal RAM and PROM; low consumption (a few mA at 5 V); and low mass and dimension (SOIC 28). The aim of this work was to determine the best candidate for MICROSAT application within the whole market offer.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114412538","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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