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1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)最新文献

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Total dose induced increase in input offset voltage in JFET input operational amplifiers JFET输入运算放大器中总剂量引起的输入偏置电压增加
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858649
R. Pease, J. Krieg, M. Gehlhausen, D. Platteter, J. Black
{"title":"Total dose induced increase in input offset voltage in JFET input operational amplifiers","authors":"R. Pease, J. Krieg, M. Gehlhausen, D. Platteter, J. Black","doi":"10.1109/RADECS.1999.858649","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858649","url":null,"abstract":"Four different types of commercial JFET input operational amplifiers were irradiated with ionizing radiation under a variety of test conditions. All experienced significant increases in input offset voltage (V/sub os/) for the worst-case irradiation bias. Microprobe measurement of the electrical characteristics of the de-coupled input JFETs on both non-irradiated and irradiated circuits demonstrates that the increase in V/sub os/ is a result of the mismatch of the pinchoff voltage of the degraded JFETs.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125858407","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Review of the radiation effects at the ESRF 对ESRF辐射效应的回顾
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858588
P. Van Vaerenbergh, L. Hardy, J. M. Hasselsweiler
{"title":"Review of the radiation effects at the ESRF","authors":"P. Van Vaerenbergh, L. Hardy, J. M. Hasselsweiler","doi":"10.1109/RADECS.1999.858588","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858588","url":null,"abstract":"This paper presents the effects of synchrotron radiation (i.e. X-rays of high energies), combined with the associated parasitic radiation, on equipment of a third generation Synchrotron Light Source after seven years of X-ray beam delivery. Dose measurement data is associated with the observed radiation damage. The future ID6 beamline experiment is described. This irradiation bench will be dedicated to test the behaviour of standard materials (mainly electric cables and cooling hoses) with hard X-rays. The aim is to identify more radio-resistant components to replace the damaged ones. Various ways to reduce the electron beam losses are also presented, with their associated effects.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126097741","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Sensitivity of the SREM RADFET dosimeters for STRV-1C to various proton and gamma radiation environments STRV-1C的SREM RADFET剂量计对不同质子和伽马辐射环境的敏感性
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858557
W. Hajdas, J. Bialkowski, U. Wyser, L. Adams, A. Mohammadazdeh, R. Nickson, B. O'Connell
{"title":"Sensitivity of the SREM RADFET dosimeters for STRV-1C to various proton and gamma radiation environments","authors":"W. Hajdas, J. Bialkowski, U. Wyser, L. Adams, A. Mohammadazdeh, R. Nickson, B. O'Connell","doi":"10.1109/RADECS.1999.858557","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858557","url":null,"abstract":"The Standard Radiation Environment Monitor (SREM) was designed in a cooperation between ESA-ESTEC, PSI and Contraves Space-the manufacturer. The monitor detects cosmic particles using 3 direction sensitive Si detectors. Total dose measurement is performed with internal and external RADFETs located at selected positions on the satellite. Their sensitivity towards protons and gammas was characterised for various energies, dose rates and exposure geometry.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126764210","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
On-line gamma dosimetry with phosphorous and germanium co-doped optical fibres 磷锗共掺光纤的在线伽马剂量测定
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858628
P. Borgermans, B. Brichard, F. Berghmans, F. Vos, M. Decréton, K. Golant, A. Thomashuk, L.V. Nikolin
{"title":"On-line gamma dosimetry with phosphorous and germanium co-doped optical fibres","authors":"P. Borgermans, B. Brichard, F. Berghmans, F. Vos, M. Decréton, K. Golant, A. Thomashuk, L.V. Nikolin","doi":"10.1109/RADECS.1999.858628","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858628","url":null,"abstract":"We measured the gamma radiation-induced attenuation in custom made phosphorous and germanium-phosphorous doped fibres at different temperatures for doses up to 360 Gy. Two different components in the recovery kinetics were evidenced. For dosimetry, the phosphorous doped fibre may be interrogated at a single wavelength within an optimal wavelength region of 1200 nm to 1400 nm. Alternatively, we studied the possibility of reconstructing the dose using attenuation data at different wavelengths. The necessary condition for this to work is that enough independent information can be obtained from the attenuation data with respect to the disturbing parameters like temperature, varying dose-rates and recovery. This was only the case for the phosphorous doped fibre and low total doses.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114300065","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 19
Radiation environment of the microelectronics and photonics test bed as measured by CREDO-3 CREDO-3测量的微电子与光子学试验台辐射环境
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858535
C. Dyer, C. Sanderson, R. Mugford, C. Watson, C. Peerless
{"title":"Radiation environment of the microelectronics and photonics test bed as measured by CREDO-3","authors":"C. Dyer, C. Sanderson, R. Mugford, C. Watson, C. Peerless","doi":"10.1109/RADECS.1999.858535","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858535","url":null,"abstract":"The Cosmic Radiation Environment Dosimetry experiment is providing data on particle fluxes and linear energy transfer spectra for inner belt protons, cosmic rays and solar particles in order to correlate with device behaviour in the MPTB experiments and to provide tests of environment models. Particle fluxes are related to geomagnetic co-ordinates in order to explain the observed time variations around the orbit and the differences between odd and even orbits. Cosmic-ray fluxes are slowly decreasing as solar maximum is approached. Outer-belt electrons show large variations and are particularly enhanced during late August to November 1998. Several solar particle events have been observed. Integral linear energy transfer (LET) spectra for these show both lower intensities and a lack of enhancement at high values of LET when compared with the October 1989 event which is commonly used as a worst case.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122109580","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 12
Relationship between single-event upset immunity and fabrication processes of recent memories 单一事件干扰免疫与近期记忆制造过程的关系
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858579
N. Nemoto, H. Shindou, S. Kuboyama, H. Itoh, S. Matsuda, S. Okada, I. Nashiyama
{"title":"Relationship between single-event upset immunity and fabrication processes of recent memories","authors":"N. Nemoto, H. Shindou, S. Kuboyama, H. Itoh, S. Matsuda, S. Okada, I. Nashiyama","doi":"10.1109/RADECS.1999.858579","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858579","url":null,"abstract":"Single-Event Upset (SEU) immunity for commercial devices were evaluated by irradiation tests using high-energy heavy ions. We show test results and describe the relationship between observed SEU rate and structures/fabrication processes. In this experiment, single-ion Multiple-Bit Upsets (MBUs) in 4 Mbit SRAM, 16 Mbit DRAM and 64 Mbit DRAM were observed. These MBUs were also discussed.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117319791","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Radiation evaluation method of commercial off-the-shelf (COTS) electronic printed circuit boards (PCBs) 商用现货(COTS)电子印刷电路板(pcb)辐射评价方法
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858637
K. Label, P. Marshall, T. Gruner, R. Reed, Beverly A. Settles, J. Wilmot, L. Dougherty, A. Russo, M.G. Foster, William Yuknis, A. Garrison-Darrin
{"title":"Radiation evaluation method of commercial off-the-shelf (COTS) electronic printed circuit boards (PCBs)","authors":"K. Label, P. Marshall, T. Gruner, R. Reed, Beverly A. Settles, J. Wilmot, L. Dougherty, A. Russo, M.G. Foster, William Yuknis, A. Garrison-Darrin","doi":"10.1109/RADECS.1999.858637","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858637","url":null,"abstract":"We present a radiation evaluation methodology and proton ground test results for candidate COTS PCBs and their associated electronics for low-altitude, low-inclination orbits. We also discuss the implications associated with mission orbit and duration.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114329560","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
Radiation test facilities in the new PS East Hall at CERN 欧洲核子研究中心新PS东大厅的辐射测试设施
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858562
M. Glaser, M. Huhtinen, F. Lemeilleur, C. Leroy, P. Roy, M. Tavlet
{"title":"Radiation test facilities in the new PS East Hall at CERN","authors":"M. Glaser, M. Huhtinen, F. Lemeilleur, C. Leroy, P. Roy, M. Tavlet","doi":"10.1109/RADECS.1999.858562","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858562","url":null,"abstract":"At the CERN Proton Synchrotron (PS), the 24 GeV/c primary beam allows the operation of two new irradiation facilities. One is using directly the primary proton beam and the other one is using secondary particles (mainly /spl sim/1 MeV neutrons) produced in a cavity after a beam stopper. For both facilities, samples to be irradiated are brought to the irradiation positions by means of automatic shuttles. Designs, Monte Carlo simulations of particle spectra and background are presented as well as the performance achieved.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129966112","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Experimental analysis of recombination and neutralization of radiation-induced charges, using isochronal annealing 用等时退火方法对辐射诱导电荷的复合和中和进行实验分析
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858634
O. Quittard, C. Brisset, F. Joffre, C. Oudéa, F. Saigné, L. Dusseau, J. Fesquet, J. Gasiot
{"title":"Experimental analysis of recombination and neutralization of radiation-induced charges, using isochronal annealing","authors":"O. Quittard, C. Brisset, F. Joffre, C. Oudéa, F. Saigné, L. Dusseau, J. Fesquet, J. Gasiot","doi":"10.1109/RADECS.1999.858634","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858634","url":null,"abstract":"Use of isochronal annealing enabled us to elucidate the recombination and compensation processes that contribute to the radiation-induced charge neutralization (RICN) mechanism.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131474677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Proton transport, an examination of model and experimental data for space environment protons 质子输运:对空间环境质子的模型和实验数据的检验
1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471) Pub Date : 1999-09-13 DOI: 10.1109/RADECS.1999.858608
P. Layton, L. Adams, D. Krawzsenek, B. Passenheim, J. Pickel
{"title":"Proton transport, an examination of model and experimental data for space environment protons","authors":"P. Layton, L. Adams, D. Krawzsenek, B. Passenheim, J. Pickel","doi":"10.1109/RADECS.1999.858608","DOIUrl":"https://doi.org/10.1109/RADECS.1999.858608","url":null,"abstract":"We will examine modeling data for various orbits using modeling software and compare this with actual satellite flight results. In particular, we will discuss the effectiveness of shielding components from total ionizing dose due to trapped protons.","PeriodicalId":135784,"journal":{"name":"1999 Fifth European Conference on Radiation and Its Effects on Components and Systems. RADECS 99 (Cat. No.99TH8471)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-09-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117190653","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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