IEEE Transactions on Nuclear Science最新文献

{"title":"A High Precision Time Measurement Method Based on Frequency-Domain Phase-Fitting for Nuclear Pulse Detection","authors":"Jianjun Wang;Zhaohui Bu;Zhao Wang;Jincheng Xu;Liguo Zhou;Qibin Zheng","doi":"10.1109/TNS.2025.3554967","DOIUrl":"https://doi.org/10.1109/TNS.2025.3554967","url":null,"abstract":"This article proposes a high-precision time measurement method based on digital frequency-domain phase-fitting (DFPF) by using digitized nuclear pulses. The averaging effect inherent in the frequency-domain cross correlation and phase-fitting processes effectively minimizes measurement errors, thereby ensuring high precision and resolution in time interval measurements. In this article, the theory of this DFPF-based time measurement method is analyzed, and an electronics prototype is designed to validate the feasibility of the proposed method by utilizing analog-to-digital converters (ADCs) for pulse digitization and a field-progammable gate array for phase fitting implementation. The test results indicate that under ideal conditions with a signal-to-noise ratio (SNR) of 64 dB, this method achieves time measurement precisions of 50-, 18-, and 2.9-ps rms, corresponding to different Gaussian pulse widths and sampling rates of 118 ns at 40 MSPS, 10 ns at 100 MSPS, and 3 ns at 500 MSPS, respectively. The precision improves with increasing pulse bandwidth. Furthermore, in practical cosmic ray tests, the method achieved favorable timing performance with a precision of 1.7-ns rms. These results demonstrate that this proposed method has the potential to be a high-precision time measurement for particle detection and is equally applicable to other advanced time measurement scenarios.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 5","pages":"1819-1827"},"PeriodicalIF":1.9,"publicationDate":"2025-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144073296","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Iterative Reconstruction for Multimodal Neutron Tomography","authors":"Jens Gregor;Matthew R. Heath;Timothy Deller;Matthew A. Blackston;Paul Hausladen","doi":"10.1109/TNS.2025.3554218","DOIUrl":"https://doi.org/10.1109/TNS.2025.3554218","url":null,"abstract":"We describe a unified framework for model-based iterative 3-D reconstruction of multimodal neutron transmission, hydrogen-scatter, and induced-fission images from low resolution data recorded using <inline-formula> <tex-math>$mathrm {14.1~!!text {-}text{MeV} }$ </tex-math></inline-formula> neutrons and the associated-particle imaging (API) technique. The framework, which was developed to facilitate use in challenging field-deployment scenarios, is centered around physics-based system models and a total variation (TV) constrained implementation of the simultaneous iterative reconstruction technique (SIRT). Modified to solve a statistically weighted least squares (WLS) problem, the SIRT algorithm is accelerated using ordered subsets and Nesterov’s momentum for which we derive a near-optimal value of the governing Lipschitz constant. The approach enables the reconstruction of images that are high resolution compared to the acquired data and is robust to both limited statistics and a limited number of projection angles. Moreover, the framework is fast enough to be practical. Example images are provided that demonstrate both the ability to perform fast-neutron imaging of high-atomic-number materials with low radiation dose and the benefit of multimodal neutron imaging to identify key materials.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 5","pages":"1686-1697"},"PeriodicalIF":1.9,"publicationDate":"2025-03-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144073293","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Understanding Inductor-Originated Single-Event Frequency Transients in CMOS LC -Tank Oscillators: Causes, Effects, and System Impacts","authors":"Gideon Adom-Bamfi;Qichao Ma;Stefan Biereigel;Paul Leroux;Jeffrey Prinzie","doi":"10.1109/TNS.2025.3572895","DOIUrl":"https://doi.org/10.1109/TNS.2025.3572895","url":null,"abstract":"Single-event frequency transients (SEFTs) in integrated complementary metal oxide semiconductor (CMOS) LC-tank voltage-controlled oscillator (VCO) and digitally-controlled oscillator (DCO), widely used in frequency synthesizer circuits, have recently been observed and linked to single-event effects (SEEs) in on-chip planar spiral inductors. This work provides an explanation of the underlying causes of these transients, presenting, for the first time, a general model to characterize their behavior and examine their system-level impact. Previously reported experimental observations are validated through heavy-ion microbeam irradiation experiments on two- and four-turn spiral inductor test structures, supported by theoretical analysis and simulations. The study highlights that both the patterned ground shield (PGS) and the inductor geometry significantly influence the polarity and magnitude of SEFT peak deviations. In addition, the results confirm that these deviations are frequency-dependent, with their magnitude increasing at higher operating frequencies. At the system level, SEFTs are demonstrated to induce phase errors in phase-locked loops (PLLs), potentially causing data transmission errors in high-speed communication links. The experimental results are obtained from test circuits fabricated using a 65-nm CMOS process, operating at a nominal frequency of 2.56 GHz with a supply voltage of 1.2 V.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 6","pages":"1876-1888"},"PeriodicalIF":1.9,"publicationDate":"2025-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144314825","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Investigation of Dynamic Space Charge Effects in Pulse-Dilation Framing Camera Utilizing Dilation Pulses","authors":"Yanli Bai;Songchun Li;Guochun Huang;Wenlong Lv;Yi Jiang;Xingguo Qin","doi":"10.1109/TNS.2025.3553523","DOIUrl":"https://doi.org/10.1109/TNS.2025.3553523","url":null,"abstract":"The dilation pulse (DP) is a critical factor influencing the temporal performance of a magnetic focusing pulse-dilation framing camera (PDFC). As the DP propagates along the photocathode (PC), it not only induces variations in acceleration voltage but also results in different drift times, dilated ratios, and motion radii for the electron pulse (EP) at various PC positions. This significantly affects spatiotemporal dispersion (STD) of the dynamic space charge effect (SCE) during the EP drift process. To address the issue, the drift step recovery diodes (DSRDs) are employed to design the DP. By establishing a connection with the dynamic spatiotemporal characteristics of the EP, the impact on the dynamic SCE is analyzed. Research results indicate that the DSRD circuit can generate four DPs with peak voltages ranging from −3.508 to −1.819 kV, rise times between 236 and 288 ps, average amplitude change rates from 22.36% to 35.0%, and slope change rates from 40.07% to 62.80%. When a specific DP is applied to the 50 mm PC, the transient temporal dispersion (TTD) of the SCE during the EP drift process is inversely proportional to the electron density and drift velocity. The transient spatial dispersion (TSD) is significantly influenced by the EP’s radius and its ratio to the axial width, decreasing as both factors increase. When the four DPs are individually applied to the PC, during the EP drift process, the DP with the smallest amplitude change rate and the largest slope change rate reduces the average temporal dispersion (TD) along the PC from 0.764 to 0.590 ps and decreases non-uniformity from 40.69% to 27.73%. The average spatial dispersion (SD) is reduced from 21.87 to <inline-formula> <tex-math>$15.21~mu $ </tex-math></inline-formula> m, and non-uniformity drops from 39.94% to 26.13%. These findings provide the basis for analyzing and improving the STD and uniformity of the dynamic SCE. Additionally, they offer research insights into integrating high-power pulse technology into ultrafast diagnostic applications.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 5","pages":"1672-1679"},"PeriodicalIF":1.9,"publicationDate":"2025-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144073289","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"IEEE Transactions on Nuclear Science publication information","authors":"","doi":"10.1109/TNS.2025.3548740","DOIUrl":"https://doi.org/10.1109/TNS.2025.3548740","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 3","pages":"C2-C2"},"PeriodicalIF":1.9,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10930345","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143637869","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"IEEE Transactions on Nuclear Science information for authors","authors":"","doi":"10.1109/TNS.2025.3549806","DOIUrl":"https://doi.org/10.1109/TNS.2025.3549806","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 3","pages":"C3-C3"},"PeriodicalIF":1.9,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10930343","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143645203","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A Parallelized Neutron Radiation Testing Technique to Understand Failures Within a Complex SoC","authors":"Jeffrey Goeders;Weston Smith;Maria Kastriotou;Michael Wirthlin","doi":"10.1109/TNS.2025.3551657","DOIUrl":"https://doi.org/10.1109/TNS.2025.3551657","url":null,"abstract":"Complex system on chip (SoC) is increasingly used in embedded applications where both high computing performance and low power consumption are required. These devices are especially important in embedded environments where safety and reliability are critical, such as advanced driver assistance systems (ADASs) and space applications. The failure modes and failure rates of these devices due to single-event effects are not well understood, and methods for testing these devices are tedious and time-consuming. This work introduces a methodology for simultaneously testing multiple components of an SoC device. This methodology is used to evaluate the failure modes of several components within an AMD UltraScale+ multiprocessor SoC (MPSoC) device under neutron radiation. The results from two neutron beam tests are described and compared.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 4","pages":"1059-1067"},"PeriodicalIF":1.9,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143860809","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Context-Dependent Outlier Detection Technique for Analysis of Single Event Frequency Transients in CMOS LC-Tank Oscillators","authors":"W. Rombouts;P. Karsmakers;G. Adom-Bamfi;S. Biereigel;J. Prinzie","doi":"10.1109/TNS.2025.3551881","DOIUrl":"https://doi.org/10.1109/TNS.2025.3551881","url":null,"abstract":"This article presents a contextual outlier detection technique employing machine learning (ML) method to improve the quality of experimentally obtained data from heavy-ion irradiation campaigns. Artifacts arising from the experimental setup often compromise the integrity and representativeness of the measured data. These artifacts, also known as outliers, can be removed to ensure a consistent dataset that accurately represents the device under test (DUT). Due to the dynamic and variable nature of the DUT properties, outliers may manifest in various forms, rendering conventional outlier detection techniques inadequate. To address this challenge, we present a contextual outlier removal technique that incorporates spatial context by segmenting the tested area and using the isolation forest (iForest) algorithm for localized outlier detection. As a case study, this technique is applied to single-event frequency transient (SEFT) data obtained during heavy-ion microbeam irradiation of a planar spiral inductor within an integrated 65-nm CMOS LC-tank digitally controlled oscillator (DCO) circuit. A graphical side-by-side comparison demonstrates significant improvements in data quality, validated by a proposed metric that shows an average enhancement of <inline-formula> <tex-math>$4.4times $ </tex-math></inline-formula>.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 4","pages":"1086-1093"},"PeriodicalIF":1.9,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143860903","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"IEEE Transactions on Nuclear Science publication information","authors":"","doi":"10.1109/TNS.2025.3549911","DOIUrl":"https://doi.org/10.1109/TNS.2025.3549911","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 3","pages":"C2-C2"},"PeriodicalIF":1.9,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10930350","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143645210","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"IEEE Transactions on Nuclear Science information for authors","authors":"","doi":"10.1109/TNS.2025.3548741","DOIUrl":"https://doi.org/10.1109/TNS.2025.3548741","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 3","pages":"C3-C3"},"PeriodicalIF":1.9,"publicationDate":"2025-03-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10930342","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143637857","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}