{"title":"IEEE Transactions on Nuclear Science information for authors","authors":"","doi":"10.1109/TNS.2025.3586533","DOIUrl":"https://doi.org/10.1109/TNS.2025.3586533","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 7","pages":"C3-C3"},"PeriodicalIF":1.9,"publicationDate":"2025-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11087430","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144671160","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"TechRxiv: Share Your Preprint Research With the World!","authors":"","doi":"10.1109/TNS.2025.3588364","DOIUrl":"https://doi.org/10.1109/TNS.2025.3588364","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 7","pages":"2106-2106"},"PeriodicalIF":1.9,"publicationDate":"2025-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11087460","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144671264","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
James M. Trippe;Brian D. Sierawski;Grant Mayberry;Hannah M. Dattilo;Sokrates T. Pantelides;Daniel M. Fleetwood;Ronald D. Schrimpf;Lloyd W. Massengill;Robert A. Reed
{"title":"Errata to “Effectiveness of NIEL as a Predictor of Single-Event Displacement Damage Effects in CMOS Circuits”","authors":"James M. Trippe;Brian D. Sierawski;Grant Mayberry;Hannah M. Dattilo;Sokrates T. Pantelides;Daniel M. Fleetwood;Ronald D. Schrimpf;Lloyd W. Massengill;Robert A. Reed","doi":"10.1109/TNS.2025.3581485","DOIUrl":"https://doi.org/10.1109/TNS.2025.3581485","url":null,"abstract":"This erratum corrects inadvertent errors in Fig. 4 and associated text in <xref>[1]</xref>. No conclusions of the original article change due to correction of these errors.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 7","pages":"2254-2254"},"PeriodicalIF":1.9,"publicationDate":"2025-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11087461","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144671111","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Transactions on Nuclear Science information for authors","authors":"","doi":"10.1109/TNS.2025.3586581","DOIUrl":"https://doi.org/10.1109/TNS.2025.3586581","url":null,"abstract":"","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 7","pages":"C3-C3"},"PeriodicalIF":1.9,"publicationDate":"2025-07-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11087451","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144671219","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"A 32-Channel High-Speed High-Spatial-Resolution Front-End ASIC Prototype for the High Current Intensity Beam Positioning Detector","authors":"Chaosong Gao;Xiaobing Liu;Yichen Yang;Xiangming Sun;Shiqiang Zhou;Zhen Wang;Hantao Hu;Yujie Li;Qianjun Chen;Xu Wang;Qingpeng Xing;Junshuai Liu;Jingyun Feng;Xin Luo;Zhike Feng;Ping Xu;Hong Zhu","doi":"10.1109/TNS.2025.3583185","DOIUrl":"https://doi.org/10.1109/TNS.2025.3583185","url":null,"abstract":"This article presents the design and test results of a high speed and high spatial resolution front-end application-specific integrated circuit (ASIC) prototype for the high current intensity beam positioning detector. An ionization chamber is proposed as the beam position detector. For these applications, ionization chambers are normally used, but to improve spatial resolution, we propose to integrate charge collection electrodes (CCEs) in the front-end ASIC prototype. The proposed ASIC prototype has been designed and manufactured in a <inline-formula> <tex-math>$0.18~mu $ </tex-math></inline-formula>m CMOS process. It features 32 channels with a pitch of <inline-formula> <tex-math>$50~mu $ </tex-math></inline-formula>m. Each channel consists of a 1 cm long CCE, an analog front-end (AFE), an analog buffer, and a shift register. Test results show that the AFE has a shaping time of less than 200 ns, a power consumption of about <inline-formula> <tex-math>$473~mu $ </tex-math></inline-formula>W at a 1.8 V power supply, and an equivalent noise charge (ENC) of less than 180 <inline-formula> <tex-math>${mathrm {e}}^{-}$ </tex-math></inline-formula>.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"72 7","pages":"2222-2228"},"PeriodicalIF":1.9,"publicationDate":"2025-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144671215","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}