IEEE Transactions on Nuclear Science最新文献

{"title":"Effect of Boron Coating on the Compensation Characteristics of Parallel-Plate Compensated Ionization Chambers","authors":"Peng Tang;Chaoyang Zhu;Jiahao Chang;Jian Zheng;Litao Li;Xincheng Xiang;Zhentao Wang","doi":"10.1109/TNS.2026.3735212","DOIUrl":"https://doi.org/10.1109/TNS.2026.3735212","url":null,"abstract":"Compensated ionization chambers (CICs) are widely used for reactor neutron flux monitoring, particularly in the intermediate range, where effective suppression of the gamma-ray response is crucial for reliable neutron measurement. However, although the compensation factor has been extensively characterized at the macroscopic level, the mechanism by which boron coatings affect compensation behavior remains unclear. In this work, parallel-plate CICs were investigated experimentally and numerically to clarify the role of the boron coating in gamma-compensation performance. Systematic measurements were performed on boron-coated CICs, B₄C-coated CICs, and uncoated chambers under Co-60 gamma irradiation and X-ray irradiation using both the conventional compensation readout and several modified wiring configurations. The voltage dependence and dose-rate dependence of the compensation factor were examined, together with the saturation behavior of different material systems and the signal partition between the signal electrode and the chamber housing. The results show that boron-coated CICs exhibit pronounced overcompensation in gamma fields, which becomes more severe at lower bias voltages and higher dose rates. The boron coating also enhances the voltage dependence of signal collection and leads to significantly slower saturation. At a low voltage, a substantial fraction of the signal is diverted to the housing and gradually redistributes back to the electrode as the voltage increases. These observations are most consistent with the hypothesis that surface charge accumulation on the boron coating, together with its slow leakage, may generate an additional local surface potential and thereby disturb the originally symmetric electric field. COMSOL–Garfield++ coupled simulations provide qualitative support for this interpretation, showing that an imposed surface potential difference can lead to a larger compensation factor and stronger overcompensation.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"73 10","pages":"4045-4058"},"PeriodicalIF":2.4,"publicationDate":"2026-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149219387","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Research on Quasi-in-Situ Calibration Method for Multi-Channel Mismatches in Beam Signal Processors","authors":"An Wang;Youming Deng;Xing Yang;Yongbin Leng","doi":"10.1109/TNS.2026.3730092","DOIUrl":"https://doi.org/10.1109/TNS.2026.3730092","url":null,"abstract":"The multi-channel beam signal acquisition and processing system is a core component of beam position monitoring (BPM) systems and their related diagnostics in particle accelerators. Its channel mismatches directly affect the measurement accuracy of key parameters such as beam position, bunch length, and charge. To address the challenge that existing calibration methods struggle to achieve calibration results consistent with online operation, this article proposes a quasi-in-situ calibration method for multi-channel mismatches based on the beam signal itself. Using the quasi-periodic characteristic of the beam signal, this method employs equivalent-time sampling combined with a waveform reconstruction algorithm to reconstruct the complete waveform for each channel with sufficient time resolution. It precisely calibrates the amplitude gains, time delays, and DC offsets between channels, enabling a correction for the entire analog signal processing chain, including the beam pickups, the signal cables, and the analog front-end (FE) electronics. Numerical simulations are performed to systematically analyze the influence of channel mismatches on the measured beam parameters, and an experimental verification is conducted at Hefei Light Source II (HLS-II) storage ring. The results demonstrate that this method significantly enhances the channel matching of the BPM signal processors in the time and frequency domains, providing a practical and reliable quasi-in-situ calibration method for high-accuracy beam measurements.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"73 10","pages":"3800-3810"},"PeriodicalIF":2.4,"publicationDate":"2026-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149219306","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Study of Proton-Induced Defects in PIN Diodes and LGADs by DLTS","authors":"Wei Li;Yunyun Fan;Yuan Feng;Xiang Li;Rui Zhang;Xiayu Duan;Hourun Wang;Ximeng Qiao;Chaohui He","doi":"10.1109/TNS.2026.3711286","DOIUrl":"https://doi.org/10.1109/TNS.2026.3711286","url":null,"abstract":"Understanding radiation-induced defects in Low Gain Avalanche Detectors (LGADs) is critical to explaining gain layer degradation after intense radiation. Previous studies using thermally stimulated current (TSC) cannot distinguish defect signals originating from the gain layer versus from the bulk region, while deep-level transient spectroscopy (DLTS) investigations have not extracted defect energy levels in LGAD gain layers. This work enables DLTS to selectively probe defects in the gain layer by partially depleting the gain layer through controlling the bias voltage. Proton-irradiated (<inline-formula> <tex-math>$1times 10^{11}$ </tex-math></inline-formula>–<inline-formula> <tex-math>$1times 10^{13}$ </tex-math></inline-formula> p<inline-formula> <tex-math>$cdot $ </tex-math></inline-formula>cm⁻²) p-type Si epitaxial PIN diodes and LGADs, the latter both with and without shallow carbon doping, at bulk resistivities of 350 and <inline-formula> <tex-math>$1000~Omega cdot $ </tex-math></inline-formula>cm, are studied. The same deep-level defects (V_n/V_nO, C_iO_i, H250 K, and B_iO<inline-formula> <tex-math>${}_{mathrm {i}}$ </tex-math></inline-formula>) are identified in both PIN diodes and LGAD gain layers. In the non-carbon-doped LGAD gain layer, the concentrations of all identified defects show an overall decreasing trend with increasing depletion depth. In the shallow-carbon-doped LGAD gain layer, the B_iO_i concentration extracted from DLTS (~<inline-formula> <tex-math>$10^{15}$ </tex-math></inline-formula> cm⁻³) is about an order of magnitude higher than that independently inferred from the measured gain-layer depletion-voltage decrease (~<inline-formula> <tex-math>$10^{14}$ </tex-math></inline-formula> cm⁻³). Compared with the non-carbon-doped LGAD, the I₂O and V₂ signals in the shallow-carbon-doped LGAD both fall below the detection limit. These results provide a defect-resolved experimental baseline for developing radiation-hard LGADs.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"73 10","pages":"3981-3990"},"PeriodicalIF":2.4,"publicationDate":"2026-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149219308","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Analytical Cascade Modeling of Charge Sharing and Pulse Pileup Effects for PCCT Simulation","authors":"Haomin Hou;Jiabing Sheng;Zhaoying Bian;Yongshuai Ge;Jianhua Ma;Dong Zeng","doi":"10.1109/TNS.2026.3731269","DOIUrl":"https://doi.org/10.1109/TNS.2026.3731269","url":null,"abstract":"Photon-counting computed tomography (PCCT) enables multi-energy imaging with a single X-ray exposure by utilizing photon-counting detectors (PCDs) to resolve energy-specific photon interactions. However, two fundamental limitations hinder it: 1) the charge sharing (CS) effect, characterized by signal diffusion across adjacent detector elements and 2) pulse pileup (PP) distortion constrained by counting electronics. Existing studies predominantly model these effects in isolation, neglecting their cascaded interactions in practical imaging chains. To address this critical gap, we propose the first analytical framework for cascaded modeling of CS and PP distortions in PCCT systems. The proposed ASim-PCCT lies in a dual-stage analytical approach that integrates physical transport processes with statistical energy redistribution. In particular, for the CS effect, we develop a multiphysics model combining: 1) a photon transport module to probabilistically characterize primary interactions across adjacent pixels and 2) a dynamic electron cloud diffusion model based on Kanaya-Okayama theory, explicitly linking energy deposition to spatial variance of electron clouds. For the PP effect, we extend classical nonparalyzable detector theory by incorporating energy-dependent pulse superposition with a GPU-based parallel computing strategy. By embedding these models into a virtual PCCT imaging chain, we quantitatively evaluate their synergistic impact on image quality using three different digital phantoms. Extensive experiments demonstrate that the proposed cascaded framework achieves comparable accuracy to Monte Carlo (MC) methods with faster computation. This work provides a foundational tool for PCCT system design and artifact correction, advancing the transition from theoretical models to clinical translation.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"73 10","pages":"3811-3823"},"PeriodicalIF":2.4,"publicationDate":"2026-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149219360","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Graph Neural ODE Digital Twins for Control-Oriented Reactor Thermal-Hydraulic Forecasting Under Partial Observability","authors":"Akzhol Almukhametov;Doyeong Lim;Rui Hu;Yang Liu","doi":"10.1109/TNS.2026.3732134","DOIUrl":"https://doi.org/10.1109/TNS.2026.3732134","url":null,"abstract":"The real-time supervisory control of advanced reactors requires accurate forecasting of plant-wide thermal-hydraulic states, including locations where physical sensors are unavailable. This need calls for surrogate models that combine predictive fidelity, millisecond-scale inference, and robustness to partial observability. We present a physics-guided message-passing graph neural network coupled with a neural ordinary differential equation (GNN-ODE) that addresses all three requirements. The system is represented as a directed sensor graph whose edges encode hydraulic connectivity through flow- and heat-transfer-aware message passing, and the latent dynamics are advanced in continuous time by a controlled neural ODE. A topology-guided initializer reconstructs uninstrumented states at rollout start. Prediction then proceeds fully autoregressively. On held-out simulation transients, the surrogate achieves an average MAE of 0.92 K at 60 s and 1.97 K at 300 s for uninstrumented nodes. Inference runs at approximately 105 times faster than simulated time on a single GPU, which makes 64-member ensemble rollouts practical for uncertainty quantification. To assess sim-to-real transfer, we adapt the pretrained surrogate to measurements collected on the physical thermal-fluid testbed using layerwise discriminative fine-tuning with 30 training sequences. The learned flow-dependent heat-transfer scaling recovers a Reynolds-number exponent consistent with established correlations, indicating constitutive learning beyond trajectory fitting. The model tracks a steep power-change transient at instrumented locations and produces physically plausible trajectories at uninstrumented ones.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"73 10","pages":"3837-3855"},"PeriodicalIF":2.4,"publicationDate":"2026-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149219327","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Radiation Effects in Visible-Guiding Hollow-Core Optical Fibers Under Gamma and 14 MeV Neutron Irradiation","authors":"Hans Christian H. Mulvad;Ian A. Davidson;Thomas W. Kelly;Jing Meng;Hesameddin Mohammadi;Konstantin Vidiajev;Tim Hoad;Austin Taranta;Yongmin Jung;Francesco Poletti;Natalie V. Wheeler","doi":"10.1109/TNS.2026.3732051","DOIUrl":"https://doi.org/10.1109/TNS.2026.3732051","url":null,"abstract":"Hollow-core optical fibers can offer significantly increased radiation hardness relative to solid-core fibers for applications in high-radiation environments such as fusion reactors. Here, we report on gamma and 14 MeV neutron radiation tests of anti-resonant hollow-core fibers (HCFs) guiding in the visible wavelength range, where radiation-induced point defects in silica glass generally cause significantly higher absorption relative to the typically investigated near-infrared range. Characterization includes spectral loss measurements of radiation-induced attenuation (RIA) during irradiation followed by post-irradiation Raman scattering gas analysis of the air-filled hollow core. In the gamma-radiation test, HCFs were exposed to gamma-radiation from Co-60 up to a total dose of 659 kGy(SiO<inline-formula> <tex-math>${}_{2}$ </tex-math></inline-formula>). There was no evidence of RIA related to the silica glass microstructure surrounding the hollow core. However, visible-range absorption linked to the radiolytic production of nitrogen dioxide and chlorine in the air-filled core was evident, which was confirmed by the post-irradiation Raman gas analysis. In the neutron test, HCFs were exposed to 14 MeV neutrons from the deuterium-tritium reaction up to a mean fluence of <inline-formula> <tex-math>$4.2{,}{,}times {,}{,}10 ^{{11}}$ </tex-math></inline-formula> n/cm². There was no measurable RIA, but the Raman gas analysis again revealed trace amounts of nitrogen dioxide and elevated amounts of chlorine. These tests provide further evidence of the radiation-hardness inherent to anti-resonant HCFs and highlight that this radiation-hardness prevails even at visible wavelengths. Future work will explore evacuated cores and inert filling gases, and low-chlorine content silica glass for the fiber fabrication to mitigate absorptions due to radiation-induced gas chemistry.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"73 10","pages":"3891-3905"},"PeriodicalIF":2.4,"publicationDate":"2026-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149219333","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Impact of Total Ionizing Dose on 128-Layer 3-D TLC NAND Flash Memory: Endurance, Read Disturb, and Data Retention","authors":"Yuhang Wang;Xuesong Zheng;Haotian Li;Hao Li;Zebin Wang;Zepeng Xiao;Jiaming Zhou;Xuepeng Zhan;Chaoming Liu;Mingxue Huo","doi":"10.1109/TNS.2026.3727668","DOIUrl":"https://doi.org/10.1109/TNS.2026.3727668","url":null,"abstract":"This article evaluates the postirradiation degradation of the endurance, read disturb, and data retention characteristics in a 128-layer 3-D triple-level cell (TLC) <sc>nand</small> flash memory. Both fresh and P/E-cycled memory chips were exposed to a total ionizing dose of 10 krad(Si) using a Co-60 gamma-ray source. Subsequently, a random data pattern was programmed into the irradiated chips to investigate the degradation behaviors of these three characteristics. Experimental results demonstrate that, compared to unirradiated chips, the irradiated devices exhibit significant degradation in both endurance and retention characteristics. The endurance characteristics of the irradiated devices are degraded by approximately 30% upon reaching a program/erase (P/E) cycle count of 5k. Furthermore, cells in different programmed states exhibit distinct responses regarding the direction of their threshold voltage shifts during postirradiation P/E cycling tests. In addition, both the order in which P/E cycling stress and irradiation are applied and the storage state of the chip during irradiation profoundly affect the severity of the data retention degradation. The data retention characteristic under the most severe stress condition was 94% higher than that under the least severe condition after 12 h of high-temperature bake.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"73 10","pages":"3866-3877"},"PeriodicalIF":2.4,"publicationDate":"2026-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149219345","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Radiation-Hardened Design and System-Level Validation of a Sub-20 nm FinFET 1--32 Gbps SerDes Against 5 Mrad(Si) TID Effects","authors":"Yi Wen;Jianjun Chen;Bin Liang;Yaqing Chi;Jun Huang","doi":"10.1109/TNS.2026.3690002","DOIUrl":"https://doi.org/10.1109/TNS.2026.3690002","url":null,"abstract":"This study systematically characterizes the system-level response of a 1–32 Gbps serializer/deserializer (SerDes) fabricated in a sub-20 nm FinFET technology under total ionizing dose (TID) environments, focusing on its applicability in high-radiation aerospace applications. Radiation testing uses Co60 gamma rays with a cumulative dose up to 5 Mrad(Si) at 100 rad(Si)/s, with the chip powered during irradiation to simulate real operating conditions. Performance of core sub-modules [phase-locked loop (PLL), transmitter (TX), and receiver (RX)] is evaluated via eye diagrams, jitter, and bit error rate (BER) before and after irradiation. Before irradiation, the 32 Gbps SerDes meets PCIe 5.0 requirements, with a system BER better than <inline-formula> <tex-math>$1times 10^{-14}$ </tex-math></inline-formula> at 32.68 dB channel loss. After 5 Mrad(Si) TID irradiation and 48-h annealing, key metrics (eye height/width, BER) degrade moderately (<inline-formula> <tex-math>$le$ </tex-math></inline-formula>18.7%) while the system remains functionally stable. The proposed radiation-hardened design introduces approximately 23.8% area overhead and 31.4% power overhead compared with the unhardened implementation. This work achieves system-level verification of a 32 Gbps sub-20 nm FinFET SerDes under 5 Mrad(Si) TID. Integrating radiation-hardened-by-design (RHBD) with adaptive calibration, it provides a cost-effective radiation-hardened solution for high-speed data links in high-radiation aerospace applications and fills the gap in system-level radiation verification for advanced-process high-speed SerDes.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"73 10","pages":"3935-3945"},"PeriodicalIF":2.4,"publicationDate":"2026-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149219309","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Analysis of Total Ionizing Dose Effect on a Linear RF Power Amplifier","authors":"Muhammad Adeel Anwar;Dong-Seok Kim;Min Sun Lee;Inyong Kwon","doi":"10.1109/TNS.2026.3736401","DOIUrl":"https://doi.org/10.1109/TNS.2026.3736401","url":null,"abstract":"After accidents at nuclear power plants (NPPs), ensuring safety and reliability has become critically important. Monitoring NPPs is essential to detect and prevent accidents early. Wireless sensor networks (WSNs) are best suited for monitoring, but need to be robust against radiation to work effectively in harsh conditions. An important building block of a WSN node is the radio frequency (RF) power amplifier (PA), which should be able to provide the power to transmit the data even in the event of an accident. This article investigates the impact of total ionizing dose (TID) on the performance of a 2.4 GHz complementary metal–oxide–semiconductor (CMOS) RF PA. TID-induced changes in threshold voltage (<inline-formula> <tex-math>$V_{th}$ </tex-math></inline-formula>) result in a displacement of the quiescent operating point (Q-point), leading to variations in critical performance metrics such as gain and efficiency. The PA is specifically designed to tolerate the increase in drain current caused by radiation, thereby maintaining functionality under radiation exposure. The PA is exposed to ionizing radiation at a dose rate of 200 Gy/h up to a total dose of 5 kGy using a ⁶⁰Co gamma source facility to evaluate its radiation tolerance and assess performance degradation. Measured results show a decline in small-signal gain (<inline-formula> <tex-math>$S_{21}$ </tex-math></inline-formula>) and a reduction in power-added efficiency (PAE) from 12.2% to 9.6% as the total dose increases, with a sharp degradation observed beyond 1 kGy.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"73 10","pages":"3918-3926"},"PeriodicalIF":2.4,"publicationDate":"2026-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149219342","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Readout Electronics Firmware for the Beam Particle Monitor in the HIRFL-CSR External-Target Experiment","authors":"Ran Chen;Jun Liu;Hulin Wang;Chaosong Gao;Junshuai Liu;Xianglun Wei;Shuangshaung Wu;Ming Yang;Ni Fang;Shiqiang Zhou;Hao Zhou;Zhihong Yan;Hongyu Zhu;Fan Liu;Xintong Cai;Xiangming Sun;Dong Wang;Zhen Wang;Haibo Yang;Chengxin Zhao;Guangming Huang;Feng Liu","doi":"10.1109/TNS.2026.3735341","DOIUrl":"https://doi.org/10.1109/TNS.2026.3735341","url":null,"abstract":"The cooler-storage-ring (CSR) external-target experiment (CEE) at the Heavy Ion Research Facility in Lanzhou (HIRFL) requires a non-interceptive beam particle monitor (BPM) for accurate primary vertex reconstruction and background suppression. Traditional beam diagnostics fail to meet the simultaneous requirements of high spatial resolution, continuous online monitoring, and radiation hardness, so a dual micro time projection chamber (micro-TPC) BPM based on a custom Topmetal-CEEv2 pixel application-specific integrated circuit (ASIC) is developed here. This work presents a full field-programmable gate array (FPGA) readout firmware running on three Xilinx Kintex-7 devices, featuring modular control, trigger synchronization, and multi-stage data processing. Three operation modes are supported: raw data mode, trigger-synchronized scientific data mode, and a novel four-stage pipelined online tracking mode for real-time centroid calculation, whose multi-cluster capability has been validated through guard-ring injection tests. The pipelined logic yields a fixed latency of <inline-formula> <tex-math>$1.9 mu text {s}$ </tex-math></inline-formula> and cuts data throughput to only 10% of raw pixel streams, greatly reducing data acquisition (DAQ) load. We validate the system via guard-ring pulse injection, <inline-formula> <tex-math>$4times 4$ </tex-math></inline-formula> pinhole laser tests and <inline-formula> <tex-math>$350 text {MeV/u}$ </tex-math></inline-formula> heavy-ion beam experiments. After <inline-formula> <tex-math>$3sigma $ </tex-math></inline-formula> outlier elimination, centroid standard deviations drop from <inline-formula> <tex-math>$7.47/2.88$ </tex-math></inline-formula> to <inline-formula> <tex-math>$0.47/0.46$ </tex-math></inline-formula> at two laser injection positions. Beam campaigns prove the BPM satisfies the design targets: transverse spatial resolution better than <inline-formula> <tex-math>$50 mu text {m}$ </tex-math></inline-formula> and time resolution below <inline-formula> <tex-math>$1 mu text {s}$ </tex-math></inline-formula>. Compared with our incomplete Topmetal-CEEv1 prototype firmware, this version integrates pipelined trigger acquisition, remote quickboot and real-time status monitoring, with higher throughput and mode flexibility. All test results verify the complete and stable performance of the proposed BPM readout firmware.","PeriodicalId":13406,"journal":{"name":"IEEE Transactions on Nuclear Science","volume":"73 10","pages":"3824-3836"},"PeriodicalIF":2.4,"publicationDate":"2026-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"149219354","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}