IEEE Transactions on Dielectrics and Electrical Insulation最新文献

{"title":"Correlating Discharge Current Pulse With Surface Charge Deposition in Diverse Gaseous Environment","authors":"Shelly Saini;Shakthi Prasad D;Thami Zeghloul;Lucian Dascalescu","doi":"10.1109/TDEI.2025.3591391","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3591391","url":null,"abstract":"The phenomenon of surface charging caused by electrical discharges has attracted significant attention because of its adverse effects on electrical systems and its industrial applications. Since the surface charging and discharge current are both influenced by the charges generated during the discharge, it is important to study the correlation quantitatively. The primary goal of the study is to analyze the relationship between the discharge current pulse and the corresponding surface charge deposition for positive and negative excitations. To establish the relation, variations were introduced in two key parameters influencing the discharge process: the discharge medium (N2, CO2, and dry air) and the pressure (100, 90, 80, 70, and 60 kPa) in each medium. The excitation voltage waveform is chosen to ensure the generation of only a single current pulse during the discharge. The positive excitation resulted in a higher pulse magnitude for N2 and dry air, whereas CO2 exhibited an opposite trend. The change in the current pulse is found to be directly proportional to the variation in charge deposition. The derived empirical formulas establish a linear correlation between the total charge computed from the current pulse and the deposited surface charge, verified by Pearson’s correlation coefficient, which suggests a good correlation strength. Of the three gaseous media, CO2 has shown a lower margin of error and consistent discharge results.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 5","pages":"2756-2764"},"PeriodicalIF":3.1,"publicationDate":"2025-07-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145190288","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Estimation of Secondary Electron Emission Coefficients for Dielectric Barrier Discharge Simulations","authors":"Yoshitaka Miyaji;Hirotaku Ishikawa;Yasutomo Otake;Fuma Yamada;Yusuke Kikuchi","doi":"10.1109/TDEI.2025.3589990","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3589990","url":null,"abstract":"The inverter-driven motors are increasingly used in industrial and mobility applications, driving the demand for greater performance and reliability. Recent advances in power electronics have raised inverter output frequencies and slew rates, increasing the risk of discharge and insulation failure. A better understanding of discharge phenomena is thus essential. The authors are developing numerical simulations of dielectric barrier discharge (DBD) in twisted pairs of enameled wire. This study investigates the estimation and applicability of the secondary electron emission (SEE) coefficient (<inline-formula> <tex-math>$gamma $ </tex-math></inline-formula>) to the DBD simulations, addressing the lack of empirical data. As a result, fitting was found effective for estimating <inline-formula> <tex-math>$gamma $ </tex-math></inline-formula> from discharge voltage measurements. The estimated values were <inline-formula> <tex-math>$4.7times 10^{text {-3}}$ </tex-math></inline-formula> for polyimide (PI) and <inline-formula> <tex-math>$7.5times 10^{text {-3}}$ </tex-math></inline-formula> for polyethylene (PE). Applying these values in DBD simulations suggests the potential to estimate discharge voltages under various pressure conditions. These findings imply that DBD simulations can enhance the accuracy of predictions of discharge phenomena in twisted pairs of enameled wire.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 5","pages":"3117-3119"},"PeriodicalIF":3.1,"publicationDate":"2025-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145189980","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"The Distribution and Erosion Characteristics of Plasma Particles in Magnetron Sputtering Under Different Excitation Voltage Sources","authors":"Yuwei Fu;Peng Ji;Shuai Wen;Rong Liang","doi":"10.1109/TDEI.2025.3589978","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3589978","url":null,"abstract":"Magnetron sputtering is widely used in thin film fabrication and surface modification of materials. During the sputtering process, the spatial species distribution significantly impacts the deposited film’s properties. However, there are still some difficulties in understanding the spatial species distribution, transport and energy control, resulting in uneven coating and low target utilization. In this article, we utilized a 2-D magnetron sputtering plasma model to further investigate the species distribution of the plasma under different excitation voltage sources and consequently obtain the Ar+ sputtering energy distribution. The erosion phenomenon was studied in the transport of ions in matter (TRIM) software, and the particle energy and angle obtained from the plasma simulation were used as input to study the incident distribution and sputtering yield. The results show significant differences in the distribution, density, and sputtering energy of plasma under dc, radio frequency (RF) (13.56 MHz) and high-power pulse (HPP) excitation voltage sources. Under dc, the electron distribution is more uniform than other excitation sources, covering 40%–50% of the target surface area. The initial sputtering energy distribution ranges from 0 to 400 eV with an erosion depth of 20Å, and the sputtering yield is approximately proportional to the voltage. The sputtering yield increases slower under RF when the voltage reaches 1000 V. Under RF, the electric field distribution is uniform at 800 V, but Ar+ is concentrated covering only 15% of the target surface. Under HPP, the electron and Ar+ densities reach <inline-formula> <tex-math>$10^{{17}}$ </tex-math></inline-formula>–<inline-formula> <tex-math>$10^{{18}}$ </tex-math></inline-formula> m<inline-formula> <tex-math>${}^{-{3}}$ </tex-math></inline-formula>, with the highest electron current density reaching <inline-formula> <tex-math>$5times 10^{{3}}$ </tex-math></inline-formula> A/m2. The sputtering depth is 30Å. This research has significant importance in optimizing the process parameters of magnetron sputtering and improving film performance. It provides strong support for the development and application of magnetron sputtering processes.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 5","pages":"2730-2737"},"PeriodicalIF":3.1,"publicationDate":"2025-07-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145190289","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Direct Observation of Electric Field in Solid Dielectrics Using SEA Method With Piezoelectric Sensor Thicker Than Test Specimen","authors":"Kazunori Kadowaki;Shinji Yudate;Ryotaro Ozaki;Masumi Fukuma","doi":"10.1109/TDEI.2025.3589336","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3589336","url":null,"abstract":"This article presents a novel method for the direct observation of electric field profiles in solid dielectrics based on the step electroacoustic method. In the proposed approach, long pressure waves generated by a step voltage excitation are detected using a piezoelectric sensor that is significantly thicker than the test specimen. The transducer acts as a high-pass filter, allowing a step-function-like pressure signal to be observed for each space charge. As a result, the oscillogram directly shows the electric field profile in the specimen. Using an 80-<inline-formula> <tex-math>$mu $ </tex-math></inline-formula>m-thick PVDF sensor and a 50-<inline-formula> <tex-math>$mu $ </tex-math></inline-formula>m-thick PET film as the test specimen, we experimentally demonstrate that the spatial resolution of the profile after deconvolution can be less than <inline-formula> <tex-math>$10~mu $ </tex-math></inline-formula>m.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 5","pages":"3114-3116"},"PeriodicalIF":3.1,"publicationDate":"2025-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145210079","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Effects of Ionizing Radiation on the Inception Voltage of Electrical Discharges","authors":"Giacomo Galli;Michael J. Kirkpatrick;Emmanuel Odic","doi":"10.1109/TDEI.2025.3588794","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3588794","url":null,"abstract":"Experiments are carried out to determine if the changes in the level of ionizing radiation provoke detectable changes in the inception voltage of electrical discharges. The inception voltage for dc corona discharge from a sharp cathode is measured for four cases: 1) ambient conditions; 2) shielded conditions; 3) in the presence of a beta source; and 4) in the presence of a gamma source. The results indicate a decrease of a few hundred volts in the inception voltage when the sources of gamma or beta radiation are placed in the proximity of the discharge zone. No difference in the extinction voltage is detected between the different cases. Additionally, variability in the inception voltage is observed to be notably reduced in the presence of ionizing radiation.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 5","pages":"2822-2829"},"PeriodicalIF":3.1,"publicationDate":"2025-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145189972","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"XLPE Electric Field Reversal Caused by Temperature Rise of Oil-Filled DC Cable Terminal","authors":"Changyun Li;Jun Shao;Fengtian Sun;Yongjin Yu","doi":"10.1109/TDEI.2025.3585848","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3585848","url":null,"abstract":"With the global energy structure evolving, high-capacity, long-distance power transmission will increasingly employ dc systems. Accurate modeling and analysis of the dc cable terminal (CT)—a power device with insulating dielectrics in solid, liquid, and gas states—are crucial for preventing fault formation. Based on the thermal-assisted/variable-range hopping conductance model of cross-linked polyethylene (XLPE), this study identifies the electric field reversal phenomenon in the radial section of XLPE under various conditions. By using different position parameters and operating parameters as independent variables for electric field intensity fitting, we enhance the efficiency of accurately obtaining the internal electric field intensity during the dc CT operation. The analytical results show that the internal electric field is most uniform when an appropriate load is applied to the conductor, representing the healthiest operating mode for the dc CT. This study provides a reference for determining the internal insulation state of the CT under different operating conditions, enabling early detection of potential issues and the adoption of corresponding countermeasures.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 4","pages":"2366-2374"},"PeriodicalIF":3.1,"publicationDate":"2025-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144739799","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Enhancing Partial Discharge Classification Through Augmented Fault Data Balancing","authors":"Saurabh Dutta;Shiyu Chen;Hazlee Azil Illias","doi":"10.1109/TDEI.2025.3585844","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3585844","url":null,"abstract":"Partial discharge (PD) is a prevalent phenomenon in high-voltage (HV) equipment, and its accurate classification is crucial for ensuring the reliability of power systems. For in situ systems, different types of faults, such as corona, floating electrode, surface, and void discharge, exhibit varying occurrences, posing challenges to accurate classification. This research addresses the inherent issues of classification accuracy caused by unbalanced fault data. Employing z-score normalization and combined synthetic data generation using a random undersampling and synthetic minority oversampling technique (SMOTE) ensures a fair representation of different fault types, leading to more accurate classification results. Further, after applying grid-search to optimize the hyperparameters, k-nearest neighbor (KNN), random forest (RF), and gradient boosting (GB) have achieved accuracies of 98.43%, 95.29%, and 88.54% for balanced denoised, unbalanced denoised, and unbalanced noisy datasets, respectively. The presented results also demonstrate a significant statistical difference in classifier accuracies between the three datasets, as confirmed by the analysis of variance (ANOVA) test. This emphasizes the efficacy of balancing the denoised signal features for improved classification performance. The findings of this work contribute valuable insights into the optimization of PD classification models, paving the way for more reliable fault detection and classification in HV equipment.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 5","pages":"2948-2957"},"PeriodicalIF":3.1,"publicationDate":"2025-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145189967","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A New Method for Surface Charge Measurement of HVDC GIL: Ring-Shaped Multipoint Potential Method","authors":"Lei Zhang;Di Yu;Deyue Tang;Zhousheng Zhang","doi":"10.1109/TDEI.2025.3581543","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3581543","url":null,"abstract":"In this article, a new method for surface charge measurement of the dc GIL insulator is proposed, that is, the ring-shaped multipoint potential (RMP) method. The basic principle of the RMP method is introduced in detail. Meanwhile, a corresponding experimental platform is built, and the surface charge distribution results obtained by the RMP method are compared with those obtained by the traditional multipoint measurement (TMM) method. The results show that for the ring-shaped measuring points’ set in this article, the RMP method can detect the surface charge accumulation on about 1/3 area of the insulator surface, and the surface charge density value obtained by the RMP method is approximately equal to the sum of the surface charge density contribution value on the subelement in this region (which is equal to the surface charge density multiplied by the contribution coefficient ratio). In addition, the square root of peak mean square error (PMSE) for the RMP method performed best at 24 measuring points, with a mean error of 11.7%. This study can provide a reference for the surface charge measurement technology of dc GIL insulators.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 4","pages":"2134-2142"},"PeriodicalIF":3.1,"publicationDate":"2025-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144739784","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Radiation Hardness on Dielectric/Ferroelectric Stacked Negative Capacitance Multigate Metal–Oxide–Semiconductor FETs at Sub-3-nm Technology Node: Device to CMOS Inverter Layout","authors":"Sresta Valasa;Venkata Ramakrishna Kotha;Narendar Vadthiya","doi":"10.1109/TDEI.2025.3582236","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3582236","url":null,"abstract":"In this work, for the first time, we present a proper comparison of radiation effects on the dielectric/ferroelectric (FE) stacked negative capacitance (NC) FinFETs and nanosheet (NS) FETs at the sub-3-nm technology node, providing a performance benchmark in device and CMOS inverter cell. The impact of heavy ion particle strikes is analyzed for various directions (top, channel, and lateral strikes), 30 locations, and 5 inclined angles to identify the most critical strike scenarios causing performance degradation. The NC-NSFET demonstrates superior radiation resilience across all strike conditions compared to the NC-FinFET. A detailed circuit-level evaluation of a CMOS inverter layout shows that NC-NSFETs can tolerate total ionizing dosages (TID) up to <inline-formula> <tex-math>$25~text {MeV}cdot text {cm}^{{2}}$ </tex-math></inline-formula>/mg, whereas NC-FinFETs fail at <inline-formula> <tex-math>$20~text {MeV}cdot text {cm}^{{2}}$ </tex-math></inline-formula>/mg indicating that the NC-NSFETs sustain nearly double the dosage compared to NC-FinFETs. These findings highlight the robustness of NC-NSFETs, making them a preferred choice for applications in radiation-rich environments such as spacecraft electronics, high-altitude avionics, nuclear reactors, and medical devices.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 5","pages":"3089-3096"},"PeriodicalIF":3.1,"publicationDate":"2025-06-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145210123","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Hump Phenomenon-Based Aging Estimation of Liquid Insulation Used in HV Transformer","authors":"S. K. Paul;B. Chakraborty;S. Maur;A. K. Pradhan","doi":"10.1109/TDEI.2025.3580076","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3580076","url":null,"abstract":"In this study, aging impact analysis on dielectric behavior of mineral oil (MO), natural and synthetic ester (SE) is performed and their aging status is estimated using the hump phenomenon obtained from dielectric modulus spectrum. For this purpose, equivalent aging of 5, 10, 15, and 20 years of each oil is emulated by mixing formic, acetic, and levulinic acid with mineral and ester oils. Thereafter, Fourier transform infrared spectroscopy and frequency-domain spectroscopy (FDS) are conducted on the prepared aged samples to assess the impact of aging on physicochemical alteration and low-frequency interfacial polarization characteristics at different temperatures, respectively. Based on the FDS results, dielectric modulus spectrum is obtained, from which hump phenomenon is identified. Besides, another important factor, i.e., conduction dominance factor (CDF), is introduced to quantitatively investigate the dominance of conduction mechanism over relaxation polarization. Based on the experimental results, a correlation with the aging status of liquid insulation with the three aging sensitive parameters (hump frequency, hump peak, and CDF) is established, which can reliably be used for estimation of their aging status.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 5","pages":"3004-3011"},"PeriodicalIF":3.1,"publicationDate":"2025-06-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145189981","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}