{"title":"The Space Charge Measurement by Pulsed Electroacoustic Method up to 200 ∘C","authors":"Bingjie Wang;Jiaxin Chen;Yuntong Ma;Kai Wu","doi":"10.1109/TDEI.2024.3521882","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3521882","url":null,"abstract":"In this letter, an improved pulsed electroacoustic (PEA) device is modified to test the space charge distributions in polytetrafluoroethylene (PTFE) at high temperatures (<inline-formula> <tex-math>$90~^{circ }$ </tex-math></inline-formula>C–<inline-formula> <tex-math>$200~^{circ }$ </tex-math></inline-formula>C). The LiNbO3 sensor and temperature controller suitable for high temperature’s measurement are designed. The voltage protocol is composed of electric field application from 30 to 50 kV/mm in a stepwise manner with 30-min polarization and depolarization. It shows that LiNbO3 can be used as a sensor material to test space charge at high temperatures up to <inline-formula> <tex-math>$200~^{circ }$ </tex-math></inline-formula>C. The PTFE has no obvious charge injection below <inline-formula> <tex-math>$150~^{circ }$ </tex-math></inline-formula>C. Above <inline-formula> <tex-math>$150~^{circ }$ </tex-math></inline-formula>C, the anode injects a large amount of positive charge, which migrates to the cathode in the form of space charge packets. It is expected that this PEA measurement technique is helpful to develop insulating materials for high temperatures.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"627-629"},"PeriodicalIF":2.9,"publicationDate":"2024-12-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143361035","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Yifan Wu;Shihang Wang;Bingrong Huang;Xinru Yang;Shengtao Li
{"title":"Excellent DC Electrical Performance of a Byproduct-Free Crosslinked Polyethylene Copolymer Blend for High-Voltage Cables","authors":"Yifan Wu;Shihang Wang;Bingrong Huang;Xinru Yang;Shengtao Li","doi":"10.1109/TDEI.2024.3521874","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3521874","url":null,"abstract":"The byproducts of crosslinked polyethylene (XLPE) for high-voltage cables reduce the purity of the insulation, thereby limiting its dc electrical performance. The byproduct-free click chemistry reaction between polyethylene copolymers demonstrates significant potential as an alternative to peroxide crosslinking. In this article, polyethylene copolymer blends were prepared, and their thermal properties, chemical composition, crystalline structure, and dielectric characteristics were evaluated comprehensively. A low-density polyethylene (LDPE) and the resulting XLPE for high-voltage cables were selected as references. In addition, the effect of antioxidant on the structure and properties of polyethylene copolymer blends was explored. The results show that the polyethylene copolymer blends exhibit superior dc electrical performance owing to the higher density of deep traps. The incorporation of polar groups in the copolymer blends affects the development of crystallization, resulting in reduced crystallinity and diminished spherulite size. More importantly, the polar groups in the copolymer blends significantly increase the density of deep traps, which suppress the space charge injection and enhance the dc breakdown strength. These findings suggest that this novel insulating material holds promising prospects in the field of dc cable insulation.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 2","pages":"658-666"},"PeriodicalIF":2.9,"publicationDate":"2024-12-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143761447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Transactions on Dielectrics and Electrical Insulation Information for Authors","authors":"","doi":"10.1109/TDEI.2024.3497456","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3497456","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"31 6","pages":"C4-C4"},"PeriodicalIF":2.9,"publicationDate":"2024-12-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10811103","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142858995","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Letter of Appreciation","authors":"","doi":"10.1109/TDEI.2024.3509112","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3509112","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"31 6","pages":"3504-3507"},"PeriodicalIF":2.9,"publicationDate":"2024-12-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10811504","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142859262","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"TechRxiv: Share Your Preprint Research With the World!","authors":"","doi":"10.1109/TDEI.2024.3513493","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3513493","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"31 6","pages":"3508-3508"},"PeriodicalIF":2.9,"publicationDate":"2024-12-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10811099","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142859359","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Dielectrics and Electrical Insulation Society Information","authors":"","doi":"10.1109/TDEI.2024.3497458","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3497458","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"31 6","pages":"C3-C3"},"PeriodicalIF":2.9,"publicationDate":"2024-12-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10811662","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142859265","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Editorial Condition Monitoring and Diagnostics of Electrical Insulation","authors":"Marek Florkowski;Cheng Pan","doi":"10.1109/TDEI.2024.3496012","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3496012","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"31 6","pages":"2859-2859"},"PeriodicalIF":2.9,"publicationDate":"2024-12-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10811097","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142858968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Transactions on Dielectrics and Electrical Insulation Publication Information","authors":"","doi":"10.1109/TDEI.2024.3497460","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3497460","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"31 6","pages":"C2-C2"},"PeriodicalIF":2.9,"publicationDate":"2024-12-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10811102","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142858998","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Pulse Charging–Discharging Behavior and Reliability Analysis of Antiferroelectric MLCCs","authors":"Deke Liu;Yingxuan Li;Qingshan Zhu;Gang Wang;Zemin Yu;Chenchen He;Jian Zhou;Ran Xu","doi":"10.1109/TDEI.2024.3519075","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3519075","url":null,"abstract":"In this research, the pulse charging-discharging behavior and reliability of antiferroelectric multilayer ceramic capacitors (AFE MLCCs) were investigated. The results revealed that as the voltage stress increased gradually from 900 to 1400 V, the characteristic lifetime of AFE MLCCs exhibited a monotonically decreasing trend, and this downward trend conforms to an inverse power law. However, experimental findings reveal that the discharge lifetime of AFE MLCCs is longer at higher temperatures. Moreover, the relationship between lifetime and temperature stress no longer follows the Arrhenius accelerated model, which may be attributed to the different phase transition behaviors of AFE MLCC at elevated temperatures. By observing the results at high temperatures, it was found that the polarization of AFE MLCC significantly decreased, leading to a reduction in its stored energy density and discharge current. Furthermore, high temperatures also decreased the strain caused by structural transitions in AFE MLCC, indicating a more complex influence of temperature on the phase transition behavior of AFE materials. Finally, microfailures of AFE MLCC were observed, and the failure mechanism was analyzed, categorizing it into three types. In addition, it was noted that due to the phase transition behavior of AFE materials and the inherent complex internal structure of MLCC, the breakdown failure of AFE MLCC is a complex mechanical-electrical–thermal coupling phenomenon, which needs to be a key point for future practical applications of AFE MLCCs.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 2","pages":"940-949"},"PeriodicalIF":2.9,"publicationDate":"2024-12-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143761398","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Qingguo Chen;Wei Sun;Song Cheng;Liang Zhang;Chunpeng Li
{"title":"A Two-Step Modification Method for Estimating the Aging Status of Insulation Paper After Oil-Replacement Based on the Methanol","authors":"Qingguo Chen;Wei Sun;Song Cheng;Liang Zhang;Chunpeng Li","doi":"10.1109/TDEI.2024.3515922","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3515922","url":null,"abstract":"Replace aged oil (RAO) can retard the aging development of transformer insulation by regularly filtering out the harmful substances in oil; however, the RAO itself may affect the estimation accuracy of the aging status of paper insulation based on chemical characteristic marker methods, such as carbon oxides, furfural, and methanol (MeOH). In this article, accelerating thermal aging experiments are carried out, and the influence of RAO on MeOH concentration in insulating oil and the estimation degree of polymerization (DP) of paper insulation is investigated. The results indicate that the current estimation methods are unsuitable for RAO based on the MeOH in oil. Furthermore, the MeOH correction factor (CF) and DP CF are established as power-series expansion, and a two-step modification method that considers both variations of MeOH in oil and DP of paper insulation is proposed for modifying the estimation errors by RAO. Eventually, the verification experiment is carried out to verify the estimation accuracy of the proposed method, and the results indicate that the range of average relative estimation errors is reduced to 1.8%~3.9%. The accuracy of aging estimation is improved and the proposed method has good applicability.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 2","pages":"1129-1137"},"PeriodicalIF":2.9,"publicationDate":"2024-12-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143783308","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}