M. Hemalatha;N. B. Balamurugan;M. Suguna;D. Sriram Kumar
{"title":"A New Precise Analytical Modeling for Triangular Gate FinFETs With Quantum Effects","authors":"M. Hemalatha;N. B. Balamurugan;M. Suguna;D. Sriram Kumar","doi":"10.1109/TDEI.2025.3579447","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3579447","url":null,"abstract":"In this study, we present a comprehensive analytical model for triangular gate (TG) fin-shaped field-effect transistors (FinFETs) that fully incorporate quantum effects. Our model extends the traditional analytical solution to the Schrödinger-Poisson equation using a variational technique. Specifically, we derive an analytical expression for the inversion charge distribution function (ICDF), often referred to as the wave function, specifically tailored for TG FinFETs. Utilizing this ICDF, we calculate key device parameters such as the inversion charge centroid, subthreshold swing (SS), drain-induced barrier lowering (DIBL), threshold voltage, inversion charge, and drain current. Our methodology is versatile, accommodating various device geometries and operational biases. To validate our model, we performed a comparative analysis with results from TCAD simulations, demonstrating strong agreement and substantiating the accuracy of our approach.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 5","pages":"2683-2692"},"PeriodicalIF":3.1,"publicationDate":"2025-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145190143","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Shusheng Zheng;Ju Kong;Chengzhi Song;Minting Dai;Ning Luo;Chang Ye
{"title":"The Excitation Effect of X-Ray on Partial Discharge of Bush-Type Electrical Tree in Epoxy Resin","authors":"Shusheng Zheng;Ju Kong;Chengzhi Song;Minting Dai;Ning Luo;Chang Ye","doi":"10.1109/TDEI.2025.3579451","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3579451","url":null,"abstract":"The partial discharge (PD) signals of bush-type electrical tree defects in epoxy resin are weak, intermittent, and challenging to detect, posing serious threats to insulation performance of power equipment. In response, a PD test method is suggested with X-ray irradiation. To verify its effectiveness, the discharge characteristics of bush-type electrical tree samples at different degradation stages were systematically measured under X-ray irradiation. Experimental results demonstrate that X-ray irradiation exhibits an excitation effect on electrical tree PD at all stages except the first stage (S1). Specifically, during the second stage (S2), X-ray irradiation amplified the maximum discharge magnitude (<inline-formula> <tex-math>${Q}_{max }$ </tex-math></inline-formula>) by 17.17 times, and the maximum pulse repetition rate (PRRmax) by 2.6 times. For the third stage (S3), X-ray irradiation increases <inline-formula> <tex-math>${Q}_{max }$ </tex-math></inline-formula> by 4.1 times and PRRmax by 2.5 times. For stage 4.1 (S4.1), X-ray irradiation increased <inline-formula> <tex-math>${Q}_{max }$ </tex-math></inline-formula> by 3.1 times, and PRRmax was greatly increased. For stage 4.2 (S4.2), X-ray irradiation can excite the stopped discharge. X-ray provides initial electrons for PD by ionizing gas in electrical trees to maintain the streamer propagation and reduce the statistical delay of PD. This research can provide a new method for PD detection of epoxy resin electrical tree defects.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 4","pages":"2122-2133"},"PeriodicalIF":3.1,"publicationDate":"2025-06-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144739886","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Advancements in Insulation Technologies for Electric Vehicle Battery Cells: A Review","authors":"Guangjun Yin","doi":"10.1109/TDEI.2025.3577146","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3577146","url":null,"abstract":"The accelerating transition to electric vehicles (EVs) demands enhanced battery safety and performance, with insulation technologies being a critical factor. This review comprehensively examines the evolution of insulation technologies for EV battery cells, a critical component in ensuring battery safety and performance. It not only reviews traditional materials such as polyethylene terephthalate (PET)-based blue films but also explores innovative solutions like powder insulation coatings and ultraviolet (UV)-curable insulation coatings. The review assesses the challenges faced by conventional materials, including issues with impact resistance, adhesive bonding, and compatibility with high-voltage systems. It further discusses the formulation and application techniques for advanced materials, emphasizing their unique properties and potential to meet the stringent safety and performance standards of the EV industry. Specifically, this review highlights the latest advancements in UV-curable and powder coatings, which offer superior insulation properties and environmental sustainability. It also provides insights into the future direction of insulation technologies for EV batteries, emphasizing the importance of material innovation for the continued growth and sustainability of the EV market.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 4","pages":"2153-2161"},"PeriodicalIF":3.1,"publicationDate":"2025-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144739790","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Electric Field Mitigation in (U)WBG Power Module Using Nonlinear Field-Dependent Conductivity Layer and Protruding Substrate Under High-Frequency, High-Slew-Rate Square Wave Voltages","authors":"Pujan Adhikari;Mona Ghassemi","doi":"10.1109/TDEI.2025.3576326","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3576326","url":null,"abstract":"Incorporating nonlinear resistive field grading materials (FGMs) onto metal-brazed substrates has been widely investigated as an efficient electric field reduction strategy at triple points (TPs) within ultrawide bandgap [(U)WBG] power modules. However, most investigations have been carried out using either dc or sinusoidal ac voltages despite actual (U)WBG power modules operating with high-frequency square voltages featuring high-slew rate (<inline-formula> <tex-math>${textit {dv}}/ {textit {dt}}$ </tex-math></inline-formula>). Thus, this study introduces a field-dependent conductivity (FDC) layer to analyze electric field reduction under high-frequency, high-slew-rate square voltages. Using COMSOL Multiphysics, both coated and uncoated structures were modeled to evaluate electric field reduction. When employing nonlinear FDC coating, the findings demonstrate a notable decrease in field stress, even under square voltages with rapid rise times and high frequencies. However, relying solely on the nonlinear FDC layer may not adequately address the electric field concerns, particularly when factoring in protrusions on metallization layers and reducing layer coverage. In response to this challenge, protrusions at the metal ends are incorporated into a protruding substrate configuration. This entire structure is then coated with a nonlinear FDC layer. The combined impact of the protruding substrate and nonlinear FDC layer effectively reduces the electric field. However, when the rise time is shortened to 75 ns and the frequency is raised to 500 kHz, the electric field stress around TPs exceeds the insulation’s withstand strength. This finding underscores the need for further research into alternative strategies as the prevalent strategies are unable to effectively mitigate electric fields in real-world operating conditions of (U)WBG power modules.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 5","pages":"3078-3088"},"PeriodicalIF":3.1,"publicationDate":"2025-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145210086","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Transactions on Dielectrics and Electrical Insulation Information for Authors","authors":"","doi":"10.1109/TDEI.2025.3570211","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3570211","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 3","pages":"C4-C4"},"PeriodicalIF":2.9,"publicationDate":"2025-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11021256","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144196886","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Transactions on Dielectrics and Electrical Insulation Publication Information","authors":"","doi":"10.1109/TDEI.2025.3570205","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3570205","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 3","pages":"C2-C2"},"PeriodicalIF":2.9,"publicationDate":"2025-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11021278","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144213597","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"IEEE Dielectrics and Electrical Insulation Society","authors":"","doi":"10.1109/TDEI.2025.3570207","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3570207","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 3","pages":"C3-C3"},"PeriodicalIF":2.9,"publicationDate":"2025-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11021268","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144196744","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Analysis of Online Monitoring Error and Equivalent Circuit Model for Dielectric Loss Angle of Capacitive Equipment","authors":"Lin Du;Xin Li;Hui Feng","doi":"10.1109/TDEI.2025.3574952","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3574952","url":null,"abstract":"The tangent value of the dielectric loss angle, tan<inline-formula> <tex-math>$delta $ </tex-math></inline-formula>, is a crucial electrical parameter that indicates the insulation status of capacitive equipment. The accurate measurement of tan<inline-formula> <tex-math>$delta $ </tex-math></inline-formula> is critical for detecting both overall defects and localized large defects in the insulation medium. The equipment voltage and its insulation leakage current serve as the electrical parameters for tan<inline-formula> <tex-math>$delta $ </tex-math></inline-formula> calculation. This article examines the factors influencing online monitoring of voltage and current measurements, proposes an equivalent circuit model affecting voltage and current measurements, and conducts an error analysis of tan<inline-formula> <tex-math>$delta $ </tex-math></inline-formula>. The study identifies current sensors, insulation of signal cable, spatial electromagnetic field coupling, cable parameters, and signal conditioning unit characteristics as the main factors affecting insulation leakage current measurements. Additionally, the insulation and temperature characteristics of capacitor units in capacitive voltage transformers (CVTs) are identified as the primary factors influencing voltage measurement. By establishing multifactor equivalent circuit models for current and voltage measurement channels, this article theoretically and experimentally analyzes the effects of various factors on tan<inline-formula> <tex-math>$delta $ </tex-math></inline-formula>. This work not only provides a detailed explanation of the various sources of errors in online monitoring of the dielectric loss angle but also offers valuable theoretical guidance for the online measurement of tan<inline-formula> <tex-math>$delta $ </tex-math></inline-formula> under complex operating conditions.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 4","pages":"2143-2152"},"PeriodicalIF":3.1,"publicationDate":"2025-06-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144739960","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Leena Gautam;T. V. Shraddha;R. Sarathi;I. Fofana;T. Jayasree;U. Mohan Rao
{"title":"Impact of Cu₂S Activity on Dielectric Properties of Oil-Paper Insulation Under Different Ambient Conditions","authors":"Leena Gautam;T. V. Shraddha;R. Sarathi;I. Fofana;T. Jayasree;U. Mohan Rao","doi":"10.1109/TDEI.2025.3563165","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3563165","url":null,"abstract":"This study investigates the impact of Dibenzyl Disulfide (DBDS) on the aging and insulating properties of the pressboard used in transformer systems under varying ambient conditions. While DBDS acts as an antioxidant during the initial stages of aging, its thermal decomposition generates corrosive sulfur compounds that contribute to the chemical degradation of both the oil and pressboard insulation. These sulfur interactions in the transformer lead to the formation of copper sulfide (Cu2S), which subsequently diffuses into the pressboard, altering its thermal and electrical characteristics. Laser-induced breakdown spectroscopy (LIBS) is employed to confirm the presence of elemental copper and sulfur, indicating the Cu2S diffusion in the pressboard. The study correlates the heat trap density of the pressboard with the effects of DBDS and ambient gases on dielectric parameters. Heat trap density is identified as a critical parameter influencing the material’s electrical behavior, affecting charge storage and dissipation processes. Additionally, heat dissipation properties of the aged pressboard are evaluated using laser flash analysis (LFA) highlighting differences in thermal behavior under air and nitrogen aging conditions.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 4","pages":"1979-1986"},"PeriodicalIF":3.1,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144739897","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Idris Ozdemir;Halil Ibrahim Uckol;Suat Ilhan;Yazid Hadjadj;Gurkan Soykan;Abdullah Aydogan;Refat Atef Ghunem
{"title":"Erosion Suppression of Zinc Borate Filler in HTV Silicone Rubber Under AC Dry-Band Arcing","authors":"Idris Ozdemir;Halil Ibrahim Uckol;Suat Ilhan;Yazid Hadjadj;Gurkan Soykan;Abdullah Aydogan;Refat Atef Ghunem","doi":"10.1109/TDEI.2025.3563164","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3563164","url":null,"abstract":"This article investigates the erosion suppression mechanisms of zinc borate (ZB) in high-temperature vulcanized silicone rubber (SiR) using the IEC 60587 inclined plane test and simultaneous thermogravimetric (TGA)-differential thermal analysis (DTA). Alumina tri-hydrate (ATH) is employed in this study as a reference filler for comparison with ZB filler. The dehydration of ZB is reported to start around <inline-formula> <tex-math>$350~^{circ }$ </tex-math></inline-formula>C, whereas ATH starts dehydration at lower temperatures around <inline-formula> <tex-math>$230~^{circ }$ </tex-math></inline-formula>C. An insignificant difference is shown in the erosion resistance between the ATH and ZB-filled composites. Both fillers are shown viable in preventing the tracking and erosion failure in the IEC 60587 inclined plane test under the critical 4.5 kV ACrms voltage. ZB is found to suppress failure with the formation of residue acting as a shield against the progression of erosion. Whereas, ATH alleviates surface temperature by promoting an internal oxidation mechanism that suppresses combustion of SiR. This study’s findings highlight the potential application of ZB as a cost-effective filler in high-temperature vulcanized SiR for outdoor insulation, particularly in regions where this filler is readily available.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 4","pages":"2221-2228"},"PeriodicalIF":3.1,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144739789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}