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IEEE Transactions on Dielectrics and Electrical Insulation Publication Information
IF 2.9 3区 工程技术
IEEE Transactions on Dielectrics and Electrical Insulation Pub Date : 2025-01-30 DOI: 10.1109/TDEI.2025.3530653
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引用次数: 0
Performance Evaluation of Aeronautical Cables in Semi-Coaxial Geometries: A Novel Test Approach
IF 2.9 3区 工程技术
IEEE Transactions on Dielectrics and Electrical Insulation Pub Date : 2025-01-08 DOI: 10.1109/TDEI.2025.3526091
Sofia P. Mavidou;David Clark;Michail Michelarakis;Christopher Stone;A. Manu Haddad
{"title":"Performance Evaluation of Aeronautical Cables in Semi-Coaxial Geometries: A Novel Test Approach","authors":"Sofia P. Mavidou;David Clark;Michail Michelarakis;Christopher Stone;A. Manu Haddad","doi":"10.1109/TDEI.2025.3526091","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3526091","url":null,"abstract":"This study examines the partial discharge (PD) performance of aircraft cables using a specially designed test electrode. Electrode positioning was precisely controlled within an atmospheric chamber to replicate coaxial geometries. Long-exposure imaging reveals useful insights that enhance our understanding of PD behavior at varying atmospheric pressure. The research compares the experimental data with existing mathematical models based on the Paschen and Halleck equations revealing notable inconsistencies, particularly at higher pressures. This work contributes valuable insights into the complexities of PD phenomena in aircraft cables and proposes a new model by enhancing an existing predictive model and incorporating the influence of an insulation barrier.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"63-72"},"PeriodicalIF":2.9,"publicationDate":"2025-01-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106454","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Dielectric, Mechanical, and Breakdown Properties of Liquid Silicone Rubber Under Different Thermal Aging Conditions
IF 2.9 3区 工程技术
IEEE Transactions on Dielectrics and Electrical Insulation Pub Date : 2025-01-08 DOI: 10.1109/TDEI.2025.3527431
Boxue Du;Yongping Hou;Xiaoxiao Kong;Qiang Fu
{"title":"Dielectric, Mechanical, and Breakdown Properties of Liquid Silicone Rubber Under Different Thermal Aging Conditions","authors":"Boxue Du;Yongping Hou;Xiaoxiao Kong;Qiang Fu","doi":"10.1109/TDEI.2025.3527431","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3527431","url":null,"abstract":"To investigate the effect of thermal aging on the liquid silicone rubber (LSR) used for dry-type transformers, various LSR samples are aged at different temperatures of <inline-formula> <tex-math>$225~^{circ }$ </tex-math></inline-formula>C, <inline-formula> <tex-math>$250~^{circ }$ </tex-math></inline-formula>C, <inline-formula> <tex-math>$275~^{circ }$ </tex-math></inline-formula>C, and <inline-formula> <tex-math>$300~^{circ }$ </tex-math></inline-formula>C, with different aging times of 24, 48, 96, 336, and 504 h. The experimental results show that the aging process of LSR can be roughly divided into two stages depending on the result of competition between crosslinking reaction and fracture reaction, as evidenced by the FTIR. In the early stage, dc conductivity and integral charge Q(t) decrease, while the breakdown strength increases with the aging time increases, which are attributed to the more compact network structure caused by crosslinking reaction. The later stage is dominated by facture reaction with the deepening of thermal aging. Dielectric properties begin to show a decreasing trend. The breakdown strength could be reduced by 16.5% at <inline-formula> <tex-math>$300~^{circ }$ </tex-math></inline-formula>C with 504 h. Meanwhile, the mechanical properties of the tensile strength and the elongation at break are decreased by 73.2% and 85.2% after 504 h thermal aging at <inline-formula> <tex-math>$504~^{circ }$ </tex-math></inline-formula>C, respectively. Dielectric spectra are investigated under different aging conditions, and differential processing is performed to distinguish the different aging state of the LSR. The results show that the loss peak shifts toward the low frequency as the aging degrees increase. This article aims to provide a theoretical basis for the application of LSR for dry-type transformers.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"273-280"},"PeriodicalIF":2.9,"publicationDate":"2025-01-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106403","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Rethinking Shallow and Deep Learnings for Transformer Dissolved Gas Analysis: A Review
IF 2.9 3区 工程技术
IEEE Transactions on Dielectrics and Electrical Insulation Pub Date : 2025-01-06 DOI: 10.1109/TDEI.2025.3526080
Hong Cai Chen;Yang Zhang
{"title":"Rethinking Shallow and Deep Learnings for Transformer Dissolved Gas Analysis: A Review","authors":"Hong Cai Chen;Yang Zhang","doi":"10.1109/TDEI.2025.3526080","DOIUrl":"https://doi.org/10.1109/TDEI.2025.3526080","url":null,"abstract":"Dissolved gas analysis (DGA) of power transformers has attracted attention for years. Extensive machine learning techniques have been adopted to DGA for fault classification. Recently, deep learning (DL) techniques have been brought to deal with DGA issues, while their performances are not significantly improved compared to shallow learning (SL) algorithms. For a comprehensive investigation, this article tests popular SL algorithms and reports DL algorithms on four different DGA datasets. The results show that SL algorithms have efficient capacity for DGA analysis, while DL algorithms may not as great as they expect. In addition of complex structure and numerous parameters to tune, DL algorithms may even perform worse than SL algorithms. This work can be a reference for future DGA algorithm development.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"3-10"},"PeriodicalIF":2.9,"publicationDate":"2025-01-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
2024 Index IEEE Transactions on Dielectrics and Electrical Insulation Vol. 31 电介质和电绝缘学报，第31卷
IF 2.9 3区 工程技术
IEEE Transactions on Dielectrics and Electrical Insulation Pub Date : 2025-01-01 DOI: 10.1109/TDEI.2024.3525236
{"title":"2024 Index IEEE Transactions on Dielectrics and Electrical Insulation Vol. 31","authors":"","doi":"10.1109/TDEI.2024.3525236","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3525236","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"31 6","pages":"3509-3592"},"PeriodicalIF":2.9,"publicationDate":"2025-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10820038","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142912524","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Application of PDC Testing for Medium-Voltage XLPE Cable Joint Water Ingress Detection
IF 2.9 3区 工程技术
IEEE Transactions on Dielectrics and Electrical Insulation Pub Date : 2024-12-27 DOI: 10.1109/TDEI.2024.3523877
Changyou Suo;Hongyan Cao;Wenkwang Chern;Amer Ghias
{"title":"Application of PDC Testing for Medium-Voltage XLPE Cable Joint Water Ingress Detection","authors":"Changyou Suo;Hongyan Cao;Wenkwang Chern;Amer Ghias","doi":"10.1109/TDEI.2024.3523877","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3523877","url":null,"abstract":"This article took 6.6-kV medium-voltage crosslinked polyethylene (XLPE) cables as the test object, conducting field tests of polarization and depolarization currents (PDCs), very-low-frequency (VLF) tan <inline-formula> <tex-math>$delta $ </tex-math></inline-formula>, and time-domain reflectometry (TDR). The correlation between PDC testing and VLF tan <inline-formula> <tex-math>$delta $ </tex-math></inline-formula> and TDR measurements was investigated to enhance the effectiveness of the PDC testing method. PDC test outcomes indicated that polarization currents sometimes exhibit increasing or non monotonic trends over time, referred to as abnormal trends herein. Through in-depth research combining TDR measurement results and relevant theoretical frameworks, it is confirmed that abnormal polarization currents are attributable to water ingress issues in cable joints. Water ingress into the joint induces nonlinear variations in insulation conductivity with the electric field, manifesting as abnormal trends in polarization currents at the joint-insulation interface. These kinds of abnormal polarization currents can serve as an effective diagnostic indicator for identifying cable joint issues. Moreover, VLF tan <inline-formula> <tex-math>$delta $ </tex-math></inline-formula> measurements alone sometimes fail to accurately diagnose water ingress issues in cable joints, necessitating the use of TDR for further diagnosis.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"36-44"},"PeriodicalIF":2.9,"publicationDate":"2024-12-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106313","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Dielectrics and Electrical Insulation Information for Authors IEEE介电学与电绝缘资讯汇刊
IF 2.9 3区 工程技术
IEEE Transactions on Dielectrics and Electrical Insulation Pub Date : 2024-12-20 DOI: 10.1109/TDEI.2024.3497456
{"title":"IEEE Transactions on Dielectrics and Electrical Insulation Information for Authors","authors":"","doi":"10.1109/TDEI.2024.3497456","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3497456","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"31 6","pages":"C4-C4"},"PeriodicalIF":2.9,"publicationDate":"2024-12-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10811103","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142858995","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Letter of Appreciation 感谢信
IF 2.9 3区 工程技术
IEEE Transactions on Dielectrics and Electrical Insulation Pub Date : 2024-12-20 DOI: 10.1109/TDEI.2024.3509112
{"title":"Letter of Appreciation","authors":"","doi":"10.1109/TDEI.2024.3509112","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3509112","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"31 6","pages":"3504-3507"},"PeriodicalIF":2.9,"publicationDate":"2024-12-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10811504","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142859262","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
TechRxiv: Share Your Preprint Research With the World! techxiv：与世界分享你的预印本研究！
IF 2.9 3区 工程技术
IEEE Transactions on Dielectrics and Electrical Insulation Pub Date : 2024-12-20 DOI: 10.1109/TDEI.2024.3513493
{"title":"TechRxiv: Share Your Preprint Research With the World!","authors":"","doi":"10.1109/TDEI.2024.3513493","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3513493","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"31 6","pages":"3508-3508"},"PeriodicalIF":2.9,"publicationDate":"2024-12-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10811099","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142859359","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Dielectrics and Electrical Insulation Society Information 电介质和电气绝缘协会信息
IF 2.9 3区 工程技术
IEEE Transactions on Dielectrics and Electrical Insulation Pub Date : 2024-12-20 DOI: 10.1109/TDEI.2024.3497458
{"title":"IEEE Dielectrics and Electrical Insulation Society Information","authors":"","doi":"10.1109/TDEI.2024.3497458","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3497458","url":null,"abstract":"","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"31 6","pages":"C3-C3"},"PeriodicalIF":2.9,"publicationDate":"2024-12-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10811662","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142859265","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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