IEEE Transactions on Dielectrics and Electrical Insulation最新文献

{"title":"Random Telegraph Noise Due to Dielectric-Semiconductor Interface Traps in MOS Transistors","authors":"Deepjyoti Deb;Rupam Goswami;Ratul K. Baruah","doi":"10.1109/TDEI.2024.3491672","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3491672","url":null,"abstract":"Random telegraph noise (RTN), primarily a gate dielectric-semiconductor interfacial phenomenon in field-effect transistors, is an important parameter of interest for downscaled devices. The existing methods proposed so far do not predict RTN and are fundamentally focused on tracing RTN signals from raw experimental data. Commonly used modern technology computer-aided design (TCAD) tools are equipped with physics-based models to analyze overall noise response in metal-oxide–semiconductor (MOS) devices; however, they lack integrated models, which can predict and plot RTN. This article presents an algorithm for generating RTN characteristics (RTN current versus time) for MOS devices using extracted parameters from noise spectral density (NSD) characteristics. The model is developed, considering tunnel field-effect transistors (TFETs) as primary devices of interest, and later validating for other MOS devices. The model utilizes the properties of interarrival times in a Poisson process along with NSD roll-off at low frequency to calculate the capture and emission times of single interface traps (SITs). The generic nature of the algorithm facilitates its applicability to any MOS based transistors as well and allows integration with the existing TCAD tools. This report also outlines a strategy for developing a random number generator (RNG) from the RTN signal based on the proposed model. The code for generating RTN is openly accessible for use.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 3","pages":"1492-1497"},"PeriodicalIF":2.9,"publicationDate":"2024-11-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144206169","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"An Electric and Stress Field-Driven Electrical Tree Growth Model","authors":"Kang He;Jiahong He;Yijun Zhou;Bingtuan Gao","doi":"10.1109/TDEI.2024.3489593","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3489593","url":null,"abstract":"Electrical trees have different shapes and growth rates under different voltage conditions. This article proposes an electric and stress field-driven electrical tree simulation model. The stress field describes the gas expansion of the partial discharge (PD) process. This model introduces the driving energy to determine the tree shape according to multiphysical fields instead of controlling the tree shape manually by artificial parameters. The electrical tree simulations and experiments were carried out to analyze the electric and stress field distributions under 11- and 15-kV voltages. The tree under 11 kV is branch-shaped (fractal dimension = 1.33), with the electric and stress fields concentrated at the tree tips. Meanwhile, a significant densification effect of the electric field replaces the concentration effect and causes a bush-shaped tree (fractal dimension = 1.72) under 15 kV. The tree-driving energy during tree growth under 15 kV constantly decreases faster than 11 kV. Consequently, the tree length under 15 kV is 69% shorter than 11 kV due to the decrement of the driving effect of the stress field. The proposed model explains the geometric shapes and growth rates of electrical trees under different voltages.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 2","pages":"742-750"},"PeriodicalIF":2.9,"publicationDate":"2024-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143761409","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Insulation Failure Mechanism of Polyimide Under High-Frequency Electrical Stress: A Synergistic Analysis of Aging Experiments and Molecular Dynamics Simulations","authors":"Yiwei Wang;Huangkuan Xu;Bilal Iqbal Ayubi;Shengrui Zhou;Li Zhang","doi":"10.1109/TDEI.2024.3489602","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3489602","url":null,"abstract":"Polyimide (PI), an insulating material extensively employed in high-frequency power transformers, encounters accelerated insulation deterioration under high-frequency electrical stress. This study elucidates the insulation failure process of PI under high-frequency electrical stress by employing a combined approach of aging experiments and reactive force field molecular dynamics (ReaxFF MDs) simulation, with scanning electron microscopy (SEM) analysis and Fourier transform infrared spectroscopy (FTIR) used. The investigation reveals that the primary causes of PI insulation failure are partial discharge (PD) erosion and electrothermal aging. PD progressively erodes the PI surface, with the erosion intensity initially intensifying before diminishing over the material’s lifespan. The synergistic impact of electrothermal stress instigates the fracture of various chemical bonds within PI molecules. These include the C-H and C-N bonds in the imide ring and C-C bonds connecting the imide structure to the benzene ring, leading to the generation of gaseous byproducts like CO and H2 O. Concurrently, the rupture of the C-O–C bond between the benzene ring and the disintegration of the imine ring result in the main chain’s fragmentation. This process leads to the continual degradation and recombination of molecular chains with varying polymerization degrees and a small hydrocarbon product C2 H2 is produced. The influence of electrical stress on PI’s molecular configuration manifests in the alteration of the electric dipole moment and the elongation of polar bonds, notably the C-N bond in the imine ring, which rapidly fractures under electric heating stress.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"246-253"},"PeriodicalIF":2.9,"publicationDate":"2024-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106401","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Comparison of Phenolic Antioxidants’ Impact on Thermal Oxidation Stability of Pentaerythritol Ester Insulating Oil","authors":"Ying Zhang;Feipeng Wang;Shi Li;Sichen Yan;Bojun Li;Zhengyong Huang;Jian Li","doi":"10.1109/TDEI.2024.3487148","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3487148","url":null,"abstract":"Synthetic ester insulating oil emerges as an environmentally friendly substitute for mineral insulating oil. However, the intrinsic ester structure poses challenges to its oxidation stability, making improvement necessary. This article compares the impact of three phenolic antioxidants, specifically 2,6-di-tert-butyl-4-methylphenol (T501), tert-butylhydroquinone (TBHQ), and 4,4’-methylenebis (2,6-di-tert-butylphenol) (T511), on improving the thermal oxidation stability of pentaerythritol ester insulating oil (KKA). The antioxidants are introduced at molar ratios of 6 and <inline-formula> <tex-math>$18~mu $ </tex-math></inline-formula>mol/g. The thermal oxygen aging tests indicate that all three antioxidants mitigate the deterioration of KKA’s physicochemical and electrical properties to varying extents. TBHQ exhibits the most pronounced effect on enhancing KKA’s thermal stability, as evidenced by the highest extrapolated onset temperature obtained via thermogravimetric analysis and differential scanning calorimetry (TG-DSC) in a nitrogen atmosphere. T511 is the most influential in improving KKA’s oxidation stability, characterized by its superior onset oxidation temperature and highest capacity to elevate the initial oxidative activation energy of KKA determined through nonisothermal DSC. Furthermore, the lowest bond dissociation energy (BDE) ofT511 indicates a most facilitated release of hydrogen atoms, providing additional evidence for its superior antioxidant efficiency.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 3","pages":"1518-1527"},"PeriodicalIF":2.9,"publicationDate":"2024-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144205976","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"DC Breakdown Characteristics of Transformer Oil With Different Cellulose Impurity Concentrations","authors":"Yuan Li;Ranran Li;Senhong Yang;Can Guo;Yefei Xu;Kai Zhou;Zhaoyang Ran","doi":"10.1109/TDEI.2024.3488680","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3488680","url":null,"abstract":"Cellulose impurities in transformer oil pose a significant threat to the reliability of converter transformers, with their concentration increasing during long-term operation, further compromising insulation performance. Therefore, it is crucial to investigate how the concentration of cellulose impurities affects the dc breakdown characteristics of transformer oil. For this purpose, the study constructed an experimental platform to explore the breakdown characteristics of transformer oil containing cellulose impurities under dc voltage. The results indicate that the breakdown voltage of transformer oil initially decreases, then increases, and eventually stabilizes with increasing cellulose impurity concentration. The maximum decrease and increase in breakdown voltage of transformer oil are 39.0% and 25.2%, respectively. Subsequently, observations were made using an optical diagnostic system, revealing that at low concentrations (≤0.005%), cellulose bridges exhibited periodic collapse, while at high concentrations (>0.005%), the bridges remained intact and bubbles appeared due to partial discharge (PD). Furthermore, physical and simulation models indicate that at low concentrations, breakdown is primarily associated with electric field distortion caused by cellulose impurities, while at high concentrations, thermal effects from leakage current and PD dominate. Therefore, the cellulose retards bubble growth (CR-BG) model is proposed to describe how cellulose impurity concentrations inhibit bubble bridging and affect the breakdown voltage of transformer oil at high concentrations. These findings establish a quantitative relationship between cellulose concentration and the electrical strength of transformer oil under the dc electric field, providing valuable engineering guidance for monitoring and maintenance work at the site.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 3","pages":"1810-1819"},"PeriodicalIF":2.9,"publicationDate":"2024-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144196662","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Cryogenic Electrical Tree Characteristics of Epoxy Resin for HTS Power Equipment Under DC/Impulse Superimposed Voltage","authors":"Yunqi Xing;Kunran Xiao;Yuqiang Zhao;Rongjin Huang;Jingquan Zheng","doi":"10.1109/TDEI.2024.3488677","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3488677","url":null,"abstract":"Epoxy resin (EP) for current lead insulation in superconducting equipment offers advantages such as low costs, high chemical stability, and excellent electrical and insulation properties. However, during operation, the combined effects of complex voltage and a wide temperature range from room temperature to 77 K can easily induce partial discharge, leading to insulation faults and posing a threat to the safety and stability of the power system. In this work, we conducted electrical tree tests on bisphenol F EP to investigate the influence of environmental temperature, voltage forms, impulse frequency, and other factors on the inception and growth characteristics of electrical tree. The results indicate that low temperature can effectively inhibit the inception and growth of electrical tree in EP. Continuous dc voltage application affects traps, making superimposed voltage more likely to promote electrical tree growth than a single impulse voltage at 300 K. The impulse voltage component dominates in the superimposed voltage, and its polarity significantly affects electrical tree characteristics, though the mechanisms differ. Additionally, the form of voltage superposition influences electrical tree characteristics. The promotion effect of heteropolar superposition voltage on electrical tree is slightly lower than that of homopolar superposition voltage, but the influence is not as obvious as that of positive and negative polarity.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 3","pages":"1422-1431"},"PeriodicalIF":2.9,"publicationDate":"2024-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144213604","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A Dampness Discrimination Method for MV Power Cable Joints Based on PDC Testing Under Thermal Excitation Conditions","authors":"Guangya Zhu;Zhaogui Liu;Songkun Pan;Pengfei Meng;Kai Zhou;Xinyi Wang;Qing Shen;Hao Zhou","doi":"10.1109/TDEI.2024.3487957","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3487957","url":null,"abstract":"The penetration of moisture into power cable joints accelerates cable insulation degradation, ultimately leading to cable breakdowns and power outages. The determination of whether environmental moisture has penetrated an insulation interface and the discrimination of dampness status are, thus, significant tasks in cable operation, maintenance, and management. Therefore, a dampness discrimination method based on polarization and depolarization current (PDC) testing under thermal stimulation is presented here. Initially, a working principle of the PDC testing method for detecting moisture in cable joints is developed. Subsequently, a thorough description of the principle of dampness discrimination in cable joints is provided based on PDC testing under thermal stimulation. This analysis reveals that thermal stimulation may alter the phase state of water and the interface contact state between cross-linked polyethylene (XLPE) and silicone rubber (SiR), decreasing the conducting current of the cable. In addition, finite element simulations are employed to determine the parameters for the thermal stimulation methods. Finally, experimental results confirm the effectiveness of the proposed method in accurately identifying dampness defects in cable joints.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"581-588"},"PeriodicalIF":2.9,"publicationDate":"2024-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143361068","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Progress in Nanodielectrics: Future From the Past Decade","authors":"Toshikatsu Tanaka","doi":"10.1109/TDEI.2024.3487813","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3487813","url":null,"abstract":"Since the early 21st century, nanodielectrics have attracted significant attention. Initially regarded as exotic materials, they have since evolved into widely accessible advanced materials. Research has primarily focused on solid polymer nanocomposites and has recently expanded to include liquid nanocomposites, known as nanofluids. Over the past decade, considerable progress has been made in the field of nanodielectrics. To capture this progress, more than 400 papers published in the IEEE Transactions on Dielectrics and Electrical Insulation and IEEE Electrical Insulation Magazine between 2011 and 2023 have been collected and reviewed. The evaluation of host materials, guest nanoparticles, and their combinations has been carried out to identify those that deliver superior performance. Notable advances in microscopic studies of interphases and particle dispersions are highlighted. Applications in high-voltage (HV) equipment and power electronics devices are also referenced to promote further research in this area. In addition, it is important to recognize that machine learning (ML) plays a critical role in accelerating the research and development of nanodielectrics and their applications.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"102-116"},"PeriodicalIF":2.9,"publicationDate":"2024-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106397","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Fault Feature Assessment Method for High-Voltage Circuit Breakers Based on Explainable Image Recognition","authors":"Yaxiong Tan;Jiayi Gong;Shangding Li;Jian Li;Weigen Chen","doi":"10.1109/TDEI.2024.3487820","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3487820","url":null,"abstract":"The current deep learning (DL) model for fault diagnosis of high-voltage circuit breakers (HVCBs) lacks explainability. It is difficult to further analyze the cause and mechanism of faults, which could provide little help for the maintenance and optimization design of HVCBs. To address this problem, a fault feature assessment method of HVCBs based on explainable image recognition is proposed to realize a quantitative analysis of faults. First, the vibration signals of HVCBs are preprocessed by continuous wavelet transform (CWT). The time-frequency diagrams of CWT are segmented by the travel curve to obtain the action sequence of the HVCB. Then, Shapley additive explanations (SHAPs) explain the deep residual network ResNet to obtain the feature importance distribution maps. Through the feature importance distribution map, accurate fault location and time traceability can be realized, and the frequency-domain features of the fault can be directly visualized from the distribution degree of the feature importance. The fault evaluation factor (FEF) is proposed to quantitatively study the time-frequency–amplitude comprehensive difference between the fault state and the normal state of the circuit breaker.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 1","pages":"92-101"},"PeriodicalIF":2.9,"publicationDate":"2024-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106323","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Quantitative Analysis of Electrical Tree Growth With Partial Discharge Characteristics of PCB Double Layer Under AC Voltage","authors":"Jianhong Song;Zepeng Lv;Kai Wu;Yonghong Cheng;Zhenyu Wu;Xianghuan Zeng;Steven Qi Li","doi":"10.1109/TDEI.2024.3487816","DOIUrl":"https://doi.org/10.1109/TDEI.2024.3487816","url":null,"abstract":"With the development of electronic technology, electronic devices are moving toward high power and miniaturization. Printed circuit board (PCB), as an important insulation support in electronic devices, is difficult to meet the development needs of power electronic devices. As an important insulation degradation phenomenon, the electric tree is also detected in PCBs. However, the issue of insulation degradation between PCB layers has not been thoroughly studied. In this article, a V-shape double-layer electrode is designed to investigate the insulation failure caused by the electrical tree between layers of PCB. By analyzing the phase-resolved partial discharge (PRPD) pattern and voltage difference (dV) plots of electrical tree growth, the partial discharge (PD) characteristics and electrical tree growth characteristics at different stages of electrical tree growth between layers are studied. PD inception voltage (PDIV) (<inline-formula> <tex-math>${V}_{text {I}}$ </tex-math></inline-formula>) and PD extinction voltage (<inline-formula> <tex-math>${V}_{text {X}}$ </tex-math></inline-formula>) during the growth of a nonconductive tree are estimated. The quantitative relationship between PD and tree length is investigated. It is found that PD maximum magnitude and <inline-formula> <tex-math>${V}_{text {I}}-{V}_{text {X}}$ </tex-math></inline-formula> and tree length show a linear relationship in the stage of nonconductive tree growth. The ratio of PD maximum magnitude to <inline-formula> <tex-math>${V}_{text {I}}-{V}_{text {X}}$ </tex-math></inline-formula> and tree length is approximately equal to a constant. To explain the relationship between tree length and PD maximum magnitude, <inline-formula> <tex-math>${V}_{text {I}}$ </tex-math></inline-formula> and <inline-formula> <tex-math>${V}_{text {X}}$ </tex-math></inline-formula> in the non-conductive tree, a dynamic PD propagation in nonelectric tree model is proposed. This method can quantitatively analyze the electrical defects of power equipment only through PD information. This has great potential for application in the defect assessment of PCBs.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 3","pages":"1703-1711"},"PeriodicalIF":2.9,"publicationDate":"2024-10-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144196603","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}