{"title":"厚于试样的压电传感器在固体介质中电场的直接观测","authors":"Kazunori Kadowaki;Shinji Yudate;Ryotaro Ozaki;Masumi Fukuma","doi":"10.1109/TDEI.2025.3589336","DOIUrl":null,"url":null,"abstract":"This article presents a novel method for the direct observation of electric field profiles in solid dielectrics based on the step electroacoustic method. In the proposed approach, long pressure waves generated by a step voltage excitation are detected using a piezoelectric sensor that is significantly thicker than the test specimen. The transducer acts as a high-pass filter, allowing a step-function-like pressure signal to be observed for each space charge. As a result, the oscillogram directly shows the electric field profile in the specimen. Using an 80-<inline-formula> <tex-math>$\\mu $ </tex-math></inline-formula>m-thick PVDF sensor and a 50-<inline-formula> <tex-math>$\\mu $ </tex-math></inline-formula>m-thick PET film as the test specimen, we experimentally demonstrate that the spatial resolution of the profile after deconvolution can be less than <inline-formula> <tex-math>$10~\\mu $ </tex-math></inline-formula>m.","PeriodicalId":13247,"journal":{"name":"IEEE Transactions on Dielectrics and Electrical Insulation","volume":"32 5","pages":"3114-3116"},"PeriodicalIF":3.1000,"publicationDate":"2025-07-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":"{\"title\":\"Direct Observation of Electric Field in Solid Dielectrics Using SEA Method With Piezoelectric Sensor Thicker Than Test Specimen\",\"authors\":\"Kazunori Kadowaki;Shinji Yudate;Ryotaro Ozaki;Masumi Fukuma\",\"doi\":\"10.1109/TDEI.2025.3589336\",\"DOIUrl\":null,\"url\":null,\"abstract\":\"This article presents a novel method for the direct observation of electric field profiles in solid dielectrics based on the step electroacoustic method. In the proposed approach, long pressure waves generated by a step voltage excitation are detected using a piezoelectric sensor that is significantly thicker than the test specimen. The transducer acts as a high-pass filter, allowing a step-function-like pressure signal to be observed for each space charge. As a result, the oscillogram directly shows the electric field profile in the specimen. Using an 80-<inline-formula> <tex-math>$\\\\mu $ </tex-math></inline-formula>m-thick PVDF sensor and a 50-<inline-formula> <tex-math>$\\\\mu $ </tex-math></inline-formula>m-thick PET film as the test specimen, we experimentally demonstrate that the spatial resolution of the profile after deconvolution can be less than <inline-formula> <tex-math>$10~\\\\mu $ </tex-math></inline-formula>m.\",\"PeriodicalId\":13247,\"journal\":{\"name\":\"IEEE Transactions on Dielectrics and Electrical Insulation\",\"volume\":\"32 5\",\"pages\":\"3114-3116\"},\"PeriodicalIF\":3.1000,\"publicationDate\":\"2025-07-15\",\"publicationTypes\":\"Journal Article\",\"fieldsOfStudy\":null,\"isOpenAccess\":false,\"openAccessPdf\":\"\",\"citationCount\":\"0\",\"resultStr\":null,\"platform\":\"Semanticscholar\",\"paperid\":null,\"PeriodicalName\":\"IEEE Transactions on Dielectrics and Electrical Insulation\",\"FirstCategoryId\":\"5\",\"ListUrlMain\":\"https://ieeexplore.ieee.org/document/11080480/\",\"RegionNum\":3,\"RegionCategory\":\"工程技术\",\"ArticlePicture\":[],\"TitleCN\":null,\"AbstractTextCN\":null,\"PMCID\":null,\"EPubDate\":\"\",\"PubModel\":\"\",\"JCR\":\"Q2\",\"JCRName\":\"ENGINEERING, ELECTRICAL & ELECTRONIC\",\"Score\":null,\"Total\":0}","platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Dielectrics and Electrical Insulation","FirstCategoryId":"5","ListUrlMain":"https://ieeexplore.ieee.org/document/11080480/","RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
Direct Observation of Electric Field in Solid Dielectrics Using SEA Method With Piezoelectric Sensor Thicker Than Test Specimen
This article presents a novel method for the direct observation of electric field profiles in solid dielectrics based on the step electroacoustic method. In the proposed approach, long pressure waves generated by a step voltage excitation are detected using a piezoelectric sensor that is significantly thicker than the test specimen. The transducer acts as a high-pass filter, allowing a step-function-like pressure signal to be observed for each space charge. As a result, the oscillogram directly shows the electric field profile in the specimen. Using an 80-$\mu $ m-thick PVDF sensor and a 50-$\mu $ m-thick PET film as the test specimen, we experimentally demonstrate that the spatial resolution of the profile after deconvolution can be less than $10~\mu $ m.
期刊介绍:
Topics that are concerned with dielectric phenomena and measurements, with development and characterization of gaseous, vacuum, liquid and solid electrical insulating materials and systems; and with utilization of these materials in circuits and systems under condition of use.