A New Method for Surface Charge Measurement of HVDC GIL: Ring-Shaped Multipoint Potential Method

IF 3.1 3区工程技术 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC

IEEE Transactions on Dielectrics and Electrical Insulation Pub Date : 2025-06-20 DOI:10.1109/TDEI.2025.3581543

Lei Zhang;Di Yu;Deyue Tang;Zhousheng Zhang

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Abstract

In this article, a new method for surface charge measurement of the dc GIL insulator is proposed, that is, the ring-shaped multipoint potential (RMP) method. The basic principle of the RMP method is introduced in detail. Meanwhile, a corresponding experimental platform is built, and the surface charge distribution results obtained by the RMP method are compared with those obtained by the traditional multipoint measurement (TMM) method. The results show that for the ring-shaped measuring points’ set in this article, the RMP method can detect the surface charge accumulation on about 1/3 area of the insulator surface, and the surface charge density value obtained by the RMP method is approximately equal to the sum of the surface charge density contribution value on the subelement in this region (which is equal to the surface charge density multiplied by the contribution coefficient ratio). In addition, the square root of peak mean square error (PMSE) for the RMP method performed best at 24 measuring points, with a mean error of 11.7%. This study can provide a reference for the surface charge measurement technology of dc GIL insulators.

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一种测量高压直流GIL表面电荷的新方法：环形多点电位法

本文提出了一种测量直流GIL绝缘子表面电荷的新方法，即环形多点电位法。详细介绍了RMP方法的基本原理。同时，搭建了相应的实验平台，并将RMP方法得到的表面电荷分布结果与传统多点测量（TMM）方法得到的结果进行了比较。结果表明，对于本文设置的环形测点，RMP方法可以检测到绝缘子表面约1/3面积上的表面电荷积累，且RMP方法得到的表面电荷密度值近似等于该区域子元上的表面电荷密度贡献值之和（等于表面电荷密度乘以贡献系数比）。此外，在24个测点上，RMP方法的峰值均方误差（PMSE）的平方根表现最佳，平均误差为11.7%。该研究可为直流GIL绝缘子的表面电荷测量技术提供参考。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

IEEE Transactions on Dielectrics and Electrical Insulation 工程技术-工程：电子与电气

CiteScore

6.00

自引率

22.60%

发文量

309

审稿时长

5.2 months

期刊介绍： Topics that are concerned with dielectric phenomena and measurements, with development and characterization of gaseous, vacuum, liquid and solid electrical insulating materials and systems; and with utilization of these materials in circuits and systems under condition of use.