2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)最新文献

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LC-VCO design automation tool for nanometer CMOS technology 用于纳米CMOS技术的LC-VCO设计自动化工具
Krzysztof Siwiec, T. Borejko, W. Pleskacz
{"title":"LC-VCO design automation tool for nanometer CMOS technology","authors":"Krzysztof Siwiec, T. Borejko, W. Pleskacz","doi":"10.1109/DDECS.2012.6219027","DOIUrl":"https://doi.org/10.1109/DDECS.2012.6219027","url":null,"abstract":"In this paper a low-voltage LC voltage-controlled oscillator (VCO) design automation tool has been presented. The tool is based on design methodology, which takes under consideration trade-offs between power consumption, phase noise and tuning range. NMOS only architecture is considered because of its capability to work with low supply voltages. One of the goals, while creating the tool, was to make it technology independent. This was achieved by creating SKILL scripts that allows fast configuration of design library for specified technology. Trade-offs between power consumption, phase noise and tuning range are analyzed and based on them design flow has been proposed. Finally two design examples in 90 and 130 nm CMOS technology have been presented.","PeriodicalId":131623,"journal":{"name":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115579792","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 10
Reliability challenges in avionics due to silicon aging 硅老化对航空电子设备可靠性的挑战
B. Mesgarzadeh, I. Söderquist, A. Alvandpour
{"title":"Reliability challenges in avionics due to silicon aging","authors":"B. Mesgarzadeh, I. Söderquist, A. Alvandpour","doi":"10.1109/DDECS.2012.6219085","DOIUrl":"https://doi.org/10.1109/DDECS.2012.6219085","url":null,"abstract":"Today's aviation systems are strongly dependent on electronics. Avionics (i.e., aviation electronics) should be highly reliable due to the nature of their applications. CMOS technology, which is widely used in the fabrication of integrated circuits, is continuously scaled to achieve higher performance and higher integration density (i.e., the wellknown Moore's law). This scaling property creates new challenges in reliability of avionics. As an example, the aging process is speeded up resulting in shorter time to wear-out. This paper investigates reliability challenges in design of avionics caused by silicon aging. It is shown that in the circuits and systems designed in modern CMOS technology, aging phenomenon have to be considered as a serious concern.","PeriodicalId":131623,"journal":{"name":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114573533","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Fault management in an IEEE P1687 (IJTAG) environment IEEE P1687 (IJTAG)环境下的故障管理
E. Larsson, Konstantin Sibin
{"title":"Fault management in an IEEE P1687 (IJTAG) environment","authors":"E. Larsson, Konstantin Sibin","doi":"10.1109/DDECS.2012.6219013","DOIUrl":"https://doi.org/10.1109/DDECS.2012.6219013","url":null,"abstract":"Summary form only given. To meet the constant demand for performance, it is increasingly common with multi-processor system-on-chips (MPSoCs). As these integrated circuits (ICs) may contain billions of transistors squeezed on a few square centimeters, it is difficult to ensure that they are correct. Defects may escape manufacturing test or develop during operation and, further, ICs manufactured in later semiconductor technologies are increasingly sensitive to environmental disturbances. These defects may be permanent (hard) or transient (soft).","PeriodicalId":131623,"journal":{"name":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123245005","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Generation of non-overlapping clock signals without using a feedback loop 产生不重叠的时钟信号,不使用反馈回路
R. Spilka, G. Hilber, Andreas Rauchenecker, D. Gruber, M. Sams, T. Ostermann
{"title":"Generation of non-overlapping clock signals without using a feedback loop","authors":"R. Spilka, G. Hilber, Andreas Rauchenecker, D. Gruber, M. Sams, T. Ostermann","doi":"10.1109/DDECS.2012.6219061","DOIUrl":"https://doi.org/10.1109/DDECS.2012.6219061","url":null,"abstract":"Within the field of delta-sigma modulators utilizing switched-capacitor structures it is of great importance to use non-overlapping clocks. The circuit presented in this document generates these signals without the need of feedback loops. To verify the timing of non-overlapping clocks, an integrated circuit is introduced that is capable of sampling fast clock signals and forwards the processed data to the measurement equipment.","PeriodicalId":131623,"journal":{"name":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","volume":"49 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123554613","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
A gigabit fully integrated plastic optical fiber receiver for a RC-LED source 用于RC-LED光源的千兆完全集成塑料光纤接收器
M. Atef, R. Swoboda, H. Zimmermann
{"title":"A gigabit fully integrated plastic optical fiber receiver for a RC-LED source","authors":"M. Atef, R. Swoboda, H. Zimmermann","doi":"10.1109/DDECS.2012.6219028","DOIUrl":"https://doi.org/10.1109/DDECS.2012.6219028","url":null,"abstract":"The presented work describes a plastic optical fiber receiver for gigabit transmission using a resonant cavity light emitting diode (RC-LED). The integrated optical receiver is realized in 0.6μm BiCMOS technology. The main novelty of the presented design is the integration of the equalizer with the optical receiver. A large area Si photodiode is integrated with the optical receiver. The design combines a TIA, equalizer and post amplifier stage followed by a 50 Ω output driver. To minimize power supply noise and substrate noise, a fully differential design is used. A dummy TIA provides a symmetrical input signal reference and a control loop is used to compensate the offset levels. The total transimpedance of the complete receiver chain is in the range of 85dBΩ. The value of the DC gain and the corner frequency of the equalizer can be adapted via an external control voltage to adapt the design to different SI-POF lengths and RC-LED limited bandwidths. The optical receiver operates at a 3.3 V single power supply and the total current consumption is 31mA. The presented optical receiver succeeded to equalize the low-bandwidth transmission system (RC-LED and 50m POF). A data rate of 1Gbit/s can be transmitted over 50m SI-POF with a sensitivity of -13dBm at BER of 10-9.","PeriodicalId":131623,"journal":{"name":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115868334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
Evaluation of susceptibility of FPGA-based circuits to fault injection attacks based on clock glitching 基于时钟故障的fpga电路对故障注入攻击的易感性评估
Jakub Korczyc, A. Krasniewski
{"title":"Evaluation of susceptibility of FPGA-based circuits to fault injection attacks based on clock glitching","authors":"Jakub Korczyc, A. Krasniewski","doi":"10.1109/DDECS.2012.6219047","DOIUrl":"https://doi.org/10.1109/DDECS.2012.6219047","url":null,"abstract":"We present a method and tool for examining an FPGA-based circuit, in particular an implementation of a cryptographic algorithm, subjected to a fault injection attack based on clock glitching. The proposed approach offers some unique features that allow us to thoroughly analyse the impact of injected faults on the operation of the circuit. In particular, through precise adjustment of the frequency of an external clock generator, the number of faults occurring at the output of the circuit under test can be observed and controlled. The effectiveness of the proposed approach has been assessed for the AES implementation, leading to a number of practical guidelines that may be essential when planning experimental studies on fault injection in FPGA-based circuits.","PeriodicalId":131623,"journal":{"name":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121335557","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
On test time reduction using pattern overlapping, broadcasting and on-chip decompression 利用模式重叠、广播和片上解压缩减少测试时间
Martin Chloupek, O. Novák, Jiri Jenícek
{"title":"On test time reduction using pattern overlapping, broadcasting and on-chip decompression","authors":"Martin Chloupek, O. Novák, Jiri Jenícek","doi":"10.1109/DDECS.2012.6219078","DOIUrl":"https://doi.org/10.1109/DDECS.2012.6219078","url":null,"abstract":"The paper deals with the problem of test data volume, test application time and on-chip test decompressor hardware overhead of scan based circuits. Broadcast-based test compression techniques can reduce both the test data volume and test application time. Pattern overlapping test compression techniques are proven to be highly effective in the test data volume reduction and low decompressor hardware requirements. This paper presents a new test compression and test application approach that combines both the test pattern overlapping technique and the test pattern broadcasting technique. This new technique significantly reduces test application time by utilizing a new on-chip test decompressor architecture presented in this paper.","PeriodicalId":131623,"journal":{"name":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129071530","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
A low phase noise Ka-band voltage controlled oscillator using 0.15 µm GaAs pHEMT technology 采用0.15µm GaAs pHEMT技术的低相位噪声ka波段压控振荡器
H. Kao, S. Shih, C. Yeh, Li-Chun Chang
{"title":"A low phase noise Ka-band voltage controlled oscillator using 0.15 µm GaAs pHEMT technology","authors":"H. Kao, S. Shih, C. Yeh, Li-Chun Chang","doi":"10.1109/DDECS.2012.6219029","DOIUrl":"https://doi.org/10.1109/DDECS.2012.6219029","url":null,"abstract":"A low phase noise, low dissipated power and small sized Ka-band voltage-controlled oscillator (VCO), using dual cross-coupled pair configuration and capacitance-splitting technique is presented. The Ka-band VCO circuit uses 0.15 μm GaAs pHEMT technology. The VCO has low phase noise, of -116.36 dBc/Hz, at a 1 MHz offset and can be tuned from 30.5 to 31.22 GHz. The figure of merit (FOM) is -192.36 dBc/Hz. The power consumption of the VCO with 1.04 mm2 chip area was 24 mW, from a 1 V power supply.","PeriodicalId":131623,"journal":{"name":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130381555","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Multisine signal generation method for a bioimpedance measurement device 一种生物阻抗测量装置的多正弦信号生成方法
M. Gorev, V. Pesonen, P. Ellervee
{"title":"Multisine signal generation method for a bioimpedance measurement device","authors":"M. Gorev, V. Pesonen, P. Ellervee","doi":"10.1109/DDECS.2012.6219035","DOIUrl":"https://doi.org/10.1109/DDECS.2012.6219035","url":null,"abstract":"Implementing a high-speed multisine-wave synthesiser in hardware is, although common, but hardly a trivial task. In this paper we review and analyse several prominent approaches for generating a multisine signal. The most appropriate method for a given bioimpedance measurement device is considered and improved.","PeriodicalId":131623,"journal":{"name":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","volume":"814 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133208695","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Design techniques for increasing performance and resource utilization of reconfigurable soft CPUs 提高可重构软cpu性能和资源利用率的设计技术
Alexander Wold, Dirk Koch, J. Tørresen
{"title":"Design techniques for increasing performance and resource utilization of reconfigurable soft CPUs","authors":"Alexander Wold, Dirk Koch, J. Tørresen","doi":"10.1109/DDECS.2012.6219024","DOIUrl":"https://doi.org/10.1109/DDECS.2012.6219024","url":null,"abstract":"Reconfigurable hardware allows application specific customization of soft microprocessors. Techniques such as removing unused instructions, software emulation of instructions, custom instruction set extensions, and run-time reconfigurable instructions have been suggested. However, the techniques have largely been studied separately from each other. The contribution of this paper is a classification method enabling integration of these techniques. This allows for generating an application specific microprocessor based system from a given program. The generated microprocessor is optimized with respect to performance per area. The improvement of our methodology is demonstrated for the CoreBench benchmark. The benefit of combining the removal of unused instructions (ISA subsetting) with software emulation of rarely used instructions is shown to increase performance while at the same time reducing resource requirements. Improvement in both area and performance is accomplished thorough simplifying the design allowing an increase in clock frequency for the synthesized soft CPU. Optimizing only by using custom instructions allowed a 12% increase in performance, but also increased resource usage by 6%. Software emulation combined with ISA subsetting allowed area savings of 7%, but only improved performance by 3%. By combining custom instructions, software emulation and ISA subsetting, we achieved an performance improvement of 15% while at the same time reducing resource requirements.","PeriodicalId":131623,"journal":{"name":"2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-04-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131696179","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 7
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