Fault management in an IEEE P1687 (IJTAG) environment

Abstract

Summary form only given. To meet the constant demand for performance, it is increasingly common with multi-processor system-on-chips (MPSoCs). As these integrated circuits (ICs) may contain billions of transistors squeezed on a few square centimeters, it is difficult to ensure that they are correct. Defects may escape manufacturing test or develop during operation and, further, ICs manufactured in later semiconductor technologies are increasingly sensitive to environmental disturbances. These defects may be permanent (hard) or transient (soft).