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IEEE Transactions on Signal and Power Integrity最新文献

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Transmission Lines: Reflections and Termination 传输线:反射和终端
IEEE Transactions on Signal and Power Integrity Pub Date : 2022-01-01 DOI: 10.1007/978-3-030-86927-4_7
S. Russ
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引用次数: 0
Gates, Packaging, and Boards: Properties and Modeling 门，包装和板:属性和建模
IEEE Transactions on Signal and Power Integrity Pub Date : 2022-01-01 DOI: 10.1007/978-3-319-29758-3_3
S. Russ
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引用次数: 0
Power Distribution Network: Frequency Domain Analysis 配电网:频域分析
IEEE Transactions on Signal and Power Integrity Pub Date : 2022-01-01 DOI: 10.1007/978-3-319-29758-3_10
S. Russ
{"title":"Power Distribution Network: Frequency Domain Analysis","authors":"S. Russ","doi":"10.1007/978-3-319-29758-3_10","DOIUrl":"https://doi.org/10.1007/978-3-319-29758-3_10","url":null,"abstract":"","PeriodicalId":100646,"journal":{"name":"IEEE Transactions on Signal and Power Integrity","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88144859","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Circuit Elements: Resistance, Capacitance, and Inductance 电路元件:电阻、电容和电感
IEEE Transactions on Signal and Power Integrity Pub Date : 2022-01-01 DOI: 10.1007/978-3-319-29758-3_4
S. Russ
{"title":"Circuit Elements: Resistance, Capacitance, and Inductance","authors":"S. Russ","doi":"10.1007/978-3-319-29758-3_4","DOIUrl":"https://doi.org/10.1007/978-3-319-29758-3_4","url":null,"abstract":"","PeriodicalId":100646,"journal":{"name":"IEEE Transactions on Signal and Power Integrity","volume":"38 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88428306","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Circuit-Board Attacks and Security 电路板攻击与安全
IEEE Transactions on Signal and Power Integrity Pub Date : 2022-01-01 DOI: 10.1007/978-3-030-86927-4_16
S. Russ
{"title":"Circuit-Board Attacks and Security","authors":"S. Russ","doi":"10.1007/978-3-030-86927-4_16","DOIUrl":"https://doi.org/10.1007/978-3-030-86927-4_16","url":null,"abstract":"","PeriodicalId":100646,"journal":{"name":"IEEE Transactions on Signal and Power Integrity","volume":"55 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77360996","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
EMI/EMC: Design and Susceptibility EMI/EMC:设计和易感性
IEEE Transactions on Signal and Power Integrity Pub Date : 2022-01-01 DOI: 10.1007/978-3-319-29758-3_11
S. Russ
{"title":"EMI/EMC: Design and Susceptibility","authors":"S. Russ","doi":"10.1007/978-3-319-29758-3_11","DOIUrl":"https://doi.org/10.1007/978-3-319-29758-3_11","url":null,"abstract":"","PeriodicalId":100646,"journal":{"name":"IEEE Transactions on Signal and Power Integrity","volume":"6 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74776111","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Commercial and Legal Implications, Project Management, and Risk Mitigation 商业和法律影响、项目管理和风险缓解
IEEE Transactions on Signal and Power Integrity Pub Date : 2022-01-01 DOI: 10.1007/978-3-030-86927-4_18
S. Russ
{"title":"Commercial and Legal Implications, Project Management, and Risk Mitigation","authors":"S. Russ","doi":"10.1007/978-3-030-86927-4_18","DOIUrl":"https://doi.org/10.1007/978-3-030-86927-4_18","url":null,"abstract":"","PeriodicalId":100646,"journal":{"name":"IEEE Transactions on Signal and Power Integrity","volume":"43 6","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91400395","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Differential Signaling 微分信号
IEEE Transactions on Signal and Power Integrity Pub Date : 2022-01-01 DOI: 10.1007/978-3-319-29758-3_8
S. Russ
{"title":"Differential Signaling","authors":"S. Russ","doi":"10.1007/978-3-319-29758-3_8","DOIUrl":"https://doi.org/10.1007/978-3-319-29758-3_8","url":null,"abstract":"","PeriodicalId":100646,"journal":{"name":"IEEE Transactions on Signal and Power Integrity","volume":"75 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77231675","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Testing, Debugging, DFX, and Quality Management 测试，调试，DFX和质量管理
IEEE Transactions on Signal and Power Integrity Pub Date : 2022-01-01 DOI: 10.1007/978-3-030-86927-4_17
S. Russ
{"title":"Testing, Debugging, DFX, and Quality Management","authors":"S. Russ","doi":"10.1007/978-3-030-86927-4_17","DOIUrl":"https://doi.org/10.1007/978-3-030-86927-4_17","url":null,"abstract":"","PeriodicalId":100646,"journal":{"name":"IEEE Transactions on Signal and Power Integrity","volume":"64 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84286988","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The Basics – Charge, Energy, Time, and Distance 基本-充电，能量，时间和距离
IEEE Transactions on Signal and Power Integrity Pub Date : 2022-01-01 DOI: 10.1007/978-3-030-86927-4_1
S. Russ
{"title":"The Basics – Charge, Energy, Time, and Distance","authors":"S. Russ","doi":"10.1007/978-3-030-86927-4_1","DOIUrl":"https://doi.org/10.1007/978-3-030-86927-4_1","url":null,"abstract":"","PeriodicalId":100646,"journal":{"name":"IEEE Transactions on Signal and Power Integrity","volume":"23 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"88031161","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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