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Digest of technical papers. SID International Symposium最新文献

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50‐1: Full area local dimming switchable privacy solution with color compensation 50‐1：带颜色补偿的全区域局部调光可切换隐私解决方案
Digest of technical papers. SID International Symposium Pub Date : 2023-06-01 DOI: 10.1002/sdtp.16659
Pawel Murzyn, Danail Totev, Elijah Auger
{"title":"50‐1: Full area local dimming switchable privacy solution with color compensation","authors":"Pawel Murzyn, Danail Totev, Elijah Auger","doi":"10.1002/sdtp.16659","DOIUrl":"https://doi.org/10.1002/sdtp.16659","url":null,"abstract":"Multi display cockpit designs are increasingly popular and aim to provide the content not only to the driver, but also the co‐driver (front seat passenger). This poses a potential safety risk of driver distraction by some content intended for co‐driver entertainment. One potential solution to address it, is switchable (active) privacy allowing to control the display viewing modes.","PeriodicalId":91069,"journal":{"name":"Digest of technical papers. SID International Symposium","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49005590","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
6‐3: Identifying the Detail Reason of Pixel Defect via Machine Learning Method 6-3：通过机器学习方法识别像素缺陷的细节原因
Digest of technical papers. SID International Symposium Pub Date : 2023-06-01 DOI: 10.1002/sdtp.16486
Jun Hee Han, Yoonseob Jeong, Minkyu Chun, Yong Min Park, Sang Won Yoon, Young Mi Kim, Joonyoung Yang, Sooyoung Yoon
{"title":"6‐3: Identifying the Detail Reason of Pixel Defect via Machine Learning Method","authors":"Jun Hee Han, Yoonseob Jeong, Minkyu Chun, Yong Min Park, Sang Won Yoon, Young Mi Kim, Joonyoung Yang, Sooyoung Yoon","doi":"10.1002/sdtp.16486","DOIUrl":"https://doi.org/10.1002/sdtp.16486","url":null,"abstract":"Various studies have been conducted to automatically inspect \u0000defective products. Those technologies already can detect defective \u0000pixels better than humans and have been improved enough to \u0000detect Mura defect, which is rarely detected by the auto detecting \u0000systems. It is as important to determine the cause of the defect as to \u0000detect it. However, efforts to automatically identify the cause of the \u0000defect have yet to show significant results. In this study, a method \u0000to determine the cause of defect with machine learning is \u0000introduced.","PeriodicalId":91069,"journal":{"name":"Digest of technical papers. SID International Symposium","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49112893","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
27‐2: Field Emission Beyond Information Displays 27‐2:信息显示器以外的场发射
Digest of technical papers. SID International Symposium Pub Date : 2023-06-01 DOI: 10.1002/sdtp.16568
Salvador Barranco Cárceles, A. Kyritsakis, Veronika Zadin, A. Mavalankar, I. Underwood
{"title":"27‐2: Field Emission Beyond Information Displays","authors":"Salvador Barranco Cárceles, A. Kyritsakis, Veronika Zadin, A. Mavalankar, I. Underwood","doi":"10.1002/sdtp.16568","DOIUrl":"https://doi.org/10.1002/sdtp.16568","url":null,"abstract":"Field emission is at the heart of a wide range of research areas \u0000and technologies. The commercialisation of some of these \u0000technologies has been limited due to the challenges to achieve \u0000emission uniformity, yield, and lifetime within the tolerances \u0000that the industry demands. The recent advances in simulation \u0000tools and nanofabrication have enabled the effective design and \u0000production of field emitter enabled technologies. Here, we \u0000present the construction, functionalities, and limitations of our \u0000computational tool for field emission design and analysis, along \u0000with relevant examples ranging from 3D portable medical \u0000imaging to novel cancer therapy.","PeriodicalId":91069,"journal":{"name":"Digest of technical papers. SID International Symposium","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48464547","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
P‐32: Stress analysis of LED Welding Pin on Glass Based MLED Curved Light Board P‐32：基于玻璃的MLED曲面光板上LED焊接引脚的应力分析
Digest of technical papers. SID International Symposium Pub Date : 2023-06-01 DOI: 10.1002/sdtp.16856
Ji-wei Sun, Hongli Zhu, Yue Qiu, Kun Lu, Yubiao Li, Zeyu Song, Hui Zheng
{"title":"P‐32: Stress analysis of LED Welding Pin on Glass Based MLED Curved Light Board","authors":"Ji-wei Sun, Hongli Zhu, Yue Qiu, Kun Lu, Yubiao Li, Zeyu Song, Hui Zheng","doi":"10.1002/sdtp.16856","DOIUrl":"https://doi.org/10.1002/sdtp.16856","url":null,"abstract":"In MLED curved backlight products, studying the film layer, component peeling and failure of MLED light plates is an important research point. In this paper, simulation analysis and actual testing were conducted to address the question of whether the internal stress caused by the bending of MLED light plates would lead to LED failure. According to the simulation results, when the curvature radius of the light board is less than R630mm, the LED will be peeled off due to the internal stress caused by bending. Meanwhile, based on the simulation and test results, the applicable curvature radius range of the glass‐based MLED light board was derived and an improvement scheme for the longitudinal alignment of LEDs was proposed. In addition, reliability tests (temperature 60°C, humidity 90, 1000h) were conducted to test the cumulative effect of the internal stresses generated at the LED solder pin positions in the time axis under different radii of curvature. The results showed that no LED peeling and failure occurred in all cases, which verified that it is feasible to make curved products with Glass‐based MLED light board.","PeriodicalId":91069,"journal":{"name":"Digest of technical papers. SID International Symposium","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48636997","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
67‐4: Uniform Polycrystalline Si Films Obtained via the Fiber‐laser‐based Spot‐Beam‐Annealing Method 67‐4：通过基于光纤激光的点束退火方法获得的均匀多晶硅膜
Digest of technical papers. SID International Symposium Pub Date : 2023-06-01 DOI: 10.1002/sdtp.16726
Jayoung Park, Ruobing Song, N. Lisenko, Bonan Shen, Alexander Killips, Adithya Nair, J. Im
{"title":"67‐4: Uniform Polycrystalline Si Films Obtained via the Fiber‐laser‐based Spot‐Beam‐Annealing Method","authors":"Jayoung Park, Ruobing Song, N. Lisenko, Bonan Shen, Alexander Killips, Adithya Nair, J. Im","doi":"10.1002/sdtp.16726","DOIUrl":"https://doi.org/10.1002/sdtp.16726","url":null,"abstract":"Experimental findings are presented on the polycrystalline Si films produced using fiber‐laser‐based Spot‐Beam Annealing (SBA) method. Quantitative analysis was performed based on the results obtained from TEM and other microstructure characterization tools. Comparison is made to the films generated using a state‐of‐the‐art manufacturing ELA system under optimal processing conditions.","PeriodicalId":91069,"journal":{"name":"Digest of technical papers. SID International Symposium","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45229153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
26‐2: Quantitative Evaluation of Display Readability in a Car Simulator under Ambient Light Conditions 26-2：环境光照条件下汽车模拟器显示可读性的定量评估
Digest of technical papers. SID International Symposium Pub Date : 2023-06-01 DOI: 10.1002/sdtp.16564
A. Lesuffleur, M. Linder, C. Kang, David S. Hermann, B. Reimer, Thomas McWilliams, Bruce Mehler
{"title":"26‐2: Quantitative Evaluation of Display Readability in a Car Simulator under Ambient Light Conditions","authors":"A. Lesuffleur, M. Linder, C. Kang, David S. Hermann, B. Reimer, Thomas McWilliams, Bruce Mehler","doi":"10.1002/sdtp.16564","DOIUrl":"https://doi.org/10.1002/sdtp.16564","url":null,"abstract":"This paper introduces a new approach to evaluate the influence \u0000of anti‐reflective and anti‐glare surface treatments on the \u0000readability of automotive displays. A car simulator was equipped \u0000with an illumination setup to mimic real ambient light scenarios. \u0000During the experiments we measured the ability of the driver to \u0000collect information from the display while driving. Our results \u0000validate this approach and demonstrate that the choice of surface \u0000treatment depends on the scenarios considered by the car \u0000manufacturers.","PeriodicalId":91069,"journal":{"name":"Digest of technical papers. SID International Symposium","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42423660","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
P‐121: Evidence for the formation of localized charge traps during OLED degradation P‐121:OLED降解过程中局部电荷阱形成的证据
Digest of technical papers. SID International Symposium Pub Date : 2023-06-01 DOI: 10.1002/sdtp.16820
Stefano Sem, S. Jenatsch, S. Züfle, W. Brütting, B. Ruhstaller
{"title":"P‐121: Evidence for the formation of localized charge traps during OLED degradation","authors":"Stefano Sem, S. Jenatsch, S. Züfle, W. Brütting, B. Ruhstaller","doi":"10.1002/sdtp.16820","DOIUrl":"https://doi.org/10.1002/sdtp.16820","url":null,"abstract":"In this study we investigate the details of the degradation processes occurring in a specific TADF OLED stack. The devices are stressed with constant current. In order to gain understanding in the underlying degradation mechanisms, a series of experimental techniques are performed during stressing interruption. To complement the measurements, electrical device simulations are used to model the OLEDs and identify the degradation causes. Specifically, it is found that the generation of trap states at an interface causes a variation of the charge injection and accumulation inside the device.","PeriodicalId":91069,"journal":{"name":"Digest of technical papers. SID International Symposium","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47684059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
P‐92: A Fast Response Time FFS‐LCD with Novel Electrode Design P‐92:基于新型电极设计的快速响应时间FFS‐LCD
Digest of technical papers. SID International Symposium Pub Date : 2023-06-01 DOI: 10.1002/sdtp.16846
Hongwei Zhao, Wenpeng Lin, Yan Yang, Lan Zhu, Chenping Lan, Caijiao Zhong, Xianyan Yang
{"title":"P‐92: A Fast Response Time FFS‐LCD with Novel Electrode Design","authors":"Hongwei Zhao, Wenpeng Lin, Yan Yang, Lan Zhu, Chenping Lan, Caijiao Zhong, Xianyan Yang","doi":"10.1002/sdtp.16846","DOIUrl":"https://doi.org/10.1002/sdtp.16846","url":null,"abstract":"In this paper, an FFS LCD is developed which contains ITO3 electrode other than the ITO2 pixel electrode, and the ITO3 electrode has a separate timing signal. This configuration can optimize response time by increasing the electric field strength of LC cell. In addition, the transmittance for the LCD using novel electrode design is also improved compared to conventional LCD. This electrode design will have opportunities for applications in the field of gaming and virtual reality displays.","PeriodicalId":91069,"journal":{"name":"Digest of technical papers. SID International Symposium","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47823103","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
78‐3: Piezoresistive Area Sensor with Polymer and CNTs Mixture on Oxide TFT Backplane 78‐3:氧化TFT背板上聚合物和碳纳米管混合物的压阻式面积传感器
Digest of technical papers. SID International Symposium Pub Date : 2023-06-01 DOI: 10.1002/sdtp.16765
Chanju Park, Jin Jang
{"title":"78‐3: Piezoresistive Area Sensor with Polymer and CNTs Mixture on Oxide TFT Backplane","authors":"Chanju Park, Jin Jang","doi":"10.1002/sdtp.16765","DOIUrl":"https://doi.org/10.1002/sdtp.16765","url":null,"abstract":"We demonstrate a highly sensitive, lateral pressure sensor using carbon nanotubes (CNTs) embedded in styrene‐ethylene‐butadiene‐styrene (SEBS) layer on 48 x 48 AM backplane for pressure mapping. The sensor exhibits highly sensitive, piezoresistive performances with current ratio of ~10 6 with a broad detection range of 330 Pa to 28 kPa, and response and recovery times of less than 10 ms and 20 ms, respectively.","PeriodicalId":91069,"journal":{"name":"Digest of technical papers. SID International Symposium","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47996836","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
63‐2: Nano‐wire Grid Polarizer and Meta‐surface Textures Integrated High Efficient and Single Polarized Light Emitting Diode 63‐2：纳米线栅偏振器和元表面纹理集成高效单极发光二极管
Digest of technical papers. SID International Symposium Pub Date : 2023-06-01 DOI: 10.1002/sdtp.16710
Xianqin Meng, Zhongxiao Li, Yun Lai, Weiting Peng, Mingxing Wang, Zhiqiang Jiao, Wei Wang, Shan Liu, Pengxia Liang, Shiqing Ma, Xiaochuan Chen, Dan Wang, Xue Dong
{"title":"63‐2: Nano‐wire Grid Polarizer and Meta‐surface Textures Integrated High Efficient and Single Polarized Light Emitting Diode","authors":"Xianqin Meng, Zhongxiao Li, Yun Lai, Weiting Peng, Mingxing Wang, Zhiqiang Jiao, Wei Wang, Shan Liu, Pengxia Liang, Shiqing Ma, Xiaochuan Chen, Dan Wang, Xue Dong","doi":"10.1002/sdtp.16710","DOIUrl":"https://doi.org/10.1002/sdtp.16710","url":null,"abstract":"A low power consumption is an essential issue for all of the electrical products, especially for the wearable electrical products, and the liquid crystal displays. This manuscript proposed a single polarized light emitting diode (LED) chip which is used for a direct back light unit for LCD. A wire grid polarizer and a meta‐surface textures are set on the top and bottom of the LED chip in order to obtain a high polarization and transparency. After optimization the potential parameters, the transmittance of TM and the polarization are 93.71% and 99.3% respectively. It can replace the normal LED of direct back light unit in order to obtain a high efficiency of 20% improvement, by comparing liquid crystal display using the APF polarizer. It can be used for reducing power consumption and supply dependence, as well as the cost of displays.","PeriodicalId":91069,"journal":{"name":"Digest of technical papers. SID International Symposium","volume":" ","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47148237","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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