{"title":"Sub-ppb NH3 room-temperature sensor using WO3–PANI heterointerfaces on SiNW","authors":"Siyuan Gao,Kuibo Lan,Zhehang Wang,Ce Yang,Ruibing Chen,Mao Ye,Guoxuan Qin","doi":"10.1063/5.0342318","DOIUrl":"https://doi.org/10.1063/5.0342318","url":null,"abstract":"Reliable detection of low concentrations of NH3 at room temperature remains challenging. Traditional metal oxide sensors usually rely on relatively high operating temperatures, while conductive polymer sensors often suffer from insufficient stability and limited signal amplification at extremely low concentrations. In this work, a silicon-based NH3 sensor with a WO3–polyaniline (PANI)/silicon nanowire arrays (SiNW) composite structure was constructed. In this structure, WO3 and PANI form n–p heterointerfaces, while the SiNW array provides a three-dimensional scaffold that facilitates gas diffusion and supports charge transport within the sensing layer. Owing to the coupled effects of the WO3–PANI heterointerface and the SiNW-supported sensing architecture, the device exhibits a distinct resistance response to NH3 at room temperature. The obtained sensor shows good selectivity, repeatability, and stability, with a detectable NH3 concentration as low as 0.1 ppb under the present testing conditions. Compared with the PANI/SiNW reference device, the WO3–PANI/SiNW sensor exhibits a stronger response and improved detection capability in the low-concentration range. The enhanced sensing performance is mainly attributed to the synergistic effects of PANI deprotonation, WO3–PANI interfacial barrier modulation, and SiNW-assisted gas diffusion and charge transport. This work provides a feasible strategy for designing low-power, highly sensitive ammonia gas sensors based on interface-modulated polymer/oxide heterostructures.","PeriodicalId":8094,"journal":{"name":"Applied Physics Letters","volume":"19 1","pages":""},"PeriodicalIF":4.0,"publicationDate":"2026-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148895939","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Synergistic thickness–modulus control of wrinkle-driven thermal strain dissipation in flexible heterostructures","authors":"Wei Tang,Zhanyu He,Weikang Liu,Lvkuan Zou,Hengguo Lai,Rui Hu,Zhongming Zeng","doi":"10.1063/5.0353124","DOIUrl":"https://doi.org/10.1063/5.0353124","url":null,"abstract":"Stiff thin films deposited on compliant substrates inevitably suffer from thermal mismatch strain, which severely degrades the performance of strain-sensitive functional materials. A key challenge in thermal stress engineering is to quantify dissipated thermal strain and mitigate thermal stress via interlayer design. Here, we systematically investigate the thermal strain relaxation mechanism governed by structural stiffness (thickness) and intrinsic material properties (Young's modulus) by tuning the thicknesses of the HfO2 interlayer and polyimide (PI). Using a geometry-confined configuration that converts multiaxial strain into a quasi-uniaxial state, we generate one-dimensional wrinkles for quantitative strain analysis. The results show that out-of-plane buckling acts as an effective channel for thermal strain relaxation. Notably, residual strain retention is strongly modulated by the synergy between interlayer thickness and modulus. These findings provide practical mechanical guidelines for flexible heterogeneous integration, highlighting the necessity to balance interfacial rigidity with thermal strain dissipation through tailored material selection and geometric optimization.","PeriodicalId":8094,"journal":{"name":"Applied Physics Letters","volume":"3 1","pages":""},"PeriodicalIF":4.0,"publicationDate":"2026-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148894093","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Long Chang,Zhiyuan Qian,Huimin Zhang,Dawei Cao,Mingming Chen
{"title":"Erratum: “Oxygen vacancies-assisted carrier transport toward improved Au/HfO2−x/Si Schottky photodetectors” [Appl. Phys. Lett.\u0000 128\u0000 , 243302 (2026)]","authors":"Long Chang,Zhiyuan Qian,Huimin Zhang,Dawei Cao,Mingming Chen","doi":"10.1063/5.0354479","DOIUrl":"https://doi.org/10.1063/5.0354479","url":null,"abstract":"In the original paper, we provided the raw C–V data and subsequently calculated the Dit and Qf values from them. Since HfO2−x exhibits high leakage, the raw C–V data should be calibrated before further analysis. In this erratum, we provide calibrated C–V data of Au/HfO2/Si capacitors and corrected Dit and Qf values of HfO2/n-Si and HfO2−x/n-Si samples. These corrections do not impact the overall conclusions presented in the paper.","PeriodicalId":8094,"journal":{"name":"Applied Physics Letters","volume":"35 1","pages":""},"PeriodicalIF":4.0,"publicationDate":"2026-08-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"148895937","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}