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2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.最新文献

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Study of electromagnetic interference from a high power copper vapor laser 大功率铜蒸气激光器的电磁干扰研究
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513643
A. Gayen, B. Das, D. R. Poddar
{"title":"Study of electromagnetic interference from a high power copper vapor laser","authors":"A. Gayen, B. Das, D. R. Poddar","doi":"10.1109/ISEMC.2005.1513643","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513643","url":null,"abstract":"The copper-vapor laser (CVL) is a high power pulsed-electric discharge pumped laser. The laser lases in copper vapor media By heating the copper pieces to evaporation temperature (/spl sim/1500 /spl deg/C), copper vapors are generated in the laser head. The thermal energy required for heating the copper metal to vaporization is supplied through the excitation pulse. The discharge excitation is at a rate between 2 to 20 kHz. A pulse power supply unit (PPSU) generates the high voltage pulse (electrical pulse having voltage of the order of 15 to 20 kV at 1 to 2 kA for duration of /spl sim/600 nS), which is obtained by using a resonant charging circuit. Thus the PPSU generates power of the order of Megawatt (/spl sim/20 MW). Hence the power supply unit along with the high voltage (HV) cable carrying the electrical pulse to the laser head is a source of electromagnetic interference (EMI). In addition the laser head where the discharge takes place is also a source of electromagnetic noise. The paper presents a study of electromagnetic interference from a high power copper vapor laser system.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"45 1","pages":"847-850 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89940456","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
A comparison of the microwave oven and reverberation chamber 微波炉与混响室的比较
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513645
Yi Huang, Xu Zhu, B. Nair
{"title":"A comparison of the microwave oven and reverberation chamber","authors":"Yi Huang, Xu Zhu, B. Nair","doi":"10.1109/ISEMC.2005.1513645","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513645","url":null,"abstract":"The reverberation chamber is a facility mainly for electromagnetic compatibility (EMC) tests whilst the microwave oven is used for heating applications. They both generate a time-averaged uniform field in the area of interest. In this paper, these two facilities are compared in terms of their applications, operation principles, design philosophy and especially the field uniformity with the aid of electromagnetic simulation techniques, where a dyadic Green's function is employed. It is revealed that a well-designed reverberation chamber can outperform a conventional microwave oven in terms of the field uniformity. A modified microwave oven design is suggested accordingly.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"82 1","pages":"856-860 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85947127","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
FDTD-SUPML simulation of photonic integrated circuits 光子集成电路的FDTD-SUPML仿真
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513566
Hai Lin, R. Dou, Gaofeng Wang, Bing-Zhong Wang
{"title":"FDTD-SUPML simulation of photonic integrated circuits","authors":"Hai Lin, R. Dou, Gaofeng Wang, Bing-Zhong Wang","doi":"10.1109/ISEMC.2005.1513566","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513566","url":null,"abstract":"Accurate modeling of photonic integrated circuits (PIC) is essential for development of high performance optical components. In this work, a finite difference time domain method (FDTD), combined with a simplified uniaxial perfectly matched layer boundary condition is presented to efficiently analyze light propagation in PIC. The FDTD-SUPML formulation can be easily applied to complex optical components. Numerical examples illustrate that this combined approach gives high accuracy.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"19 1","pages":"501-504 Vol. 2"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78302009","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Domain decomposition and multi-scale finite elements for electromagnetic analysis of integrated electronic systems 集成电子系统电磁分析的域分解和多尺度有限元
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513637
A. Cangellaris, Hong Wu
{"title":"Domain decomposition and multi-scale finite elements for electromagnetic analysis of integrated electronic systems","authors":"A. Cangellaris, Hong Wu","doi":"10.1109/ISEMC.2005.1513637","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513637","url":null,"abstract":"A finite element methodology is presented for computer-aided analysis and design of the interconnect and power distribution network of integrated, packaged electronic systems. The concept of multi-scale finite elements is introduced to describe the generalization of the traditional finite element, understood as a small finite volume of the computational domain over which the unknown field quantity is approximated in terms of interpolate polynomial functions, to a generalized, electromagnetic behavior-baring, scaleable, mathematical macro-model, which captures the electromagnetic response of a sub-region of the computational domain, in a manner seamlessly compatible with the finite element modeling infrastructure. Such generalized finite elements, combined with a domain decomposition methodology suitable for multi-layered electronic substrate electromagnetic modeling, help enhance the modeling versatility and applicability of finite elements to integrated electronic system modeling.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"43 1","pages":"817-822 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81866637","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 8
Experiment study on radiation characteristics of corona discharge on hardware 硬件电晕放电辐射特性的实验研究
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513641
Lin Xiaoyu, Chen Shixiu, Xie Qi-jia, Xia Chang-zheng, Sun Youlin
{"title":"Experiment study on radiation characteristics of corona discharge on hardware","authors":"Lin Xiaoyu, Chen Shixiu, Xie Qi-jia, Xia Chang-zheng, Sun Youlin","doi":"10.1109/ISEMC.2005.1513641","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513641","url":null,"abstract":"Characteristics of electromagnetic wave radiated from corona discharge on hardware has been studied. Experiment results and analysis show that the physical model of corona discharge on hardware can be simulated by a short dipole antenna and the electrical field above ground is a superposition field due to ground reflection.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"77 1","pages":"840-843 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75608094","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effects of radio frequency interference in OPAMP differential input stages 射频干扰对OPAMP差分输入级的影响
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513647
M. Corradin, G. Spiazzi, S. Buso
{"title":"Effects of radio frequency interference in OPAMP differential input stages","authors":"M. Corradin, G. Spiazzi, S. Buso","doi":"10.1109/ISEMC.2005.1513647","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513647","url":null,"abstract":"The paper deals with the problem of RFI induced output dc offset in operational amplifiers. In particular, it presents an extended analysis of the effect of the input differential stage nonlinearity in the generation of the output voltage offset. Differently from previously presented analyses, the proposed approach allows to take into account the effects of non purely square-law device models, e.g. including also velocity saturation effects. The paper also analyzes the common emitter differential input pair the analysis results can be easily extended to represent sub-threshold biased MOSFET differential stages. Based on the proposed analytical approach the paper discusses two very simple design provisions that mitigate the RFI effects. Design trade-offs related to these solutions are discussed. The proposed solutions are validated by simulations.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"41 1","pages":"866-871 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90889257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Electromagnetic characterization of conductive magnetic/non-magnetic shielding materials 导电磁性/非磁性屏蔽材料的电磁特性
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513497
M. Badic, M. Marinescu, L. Aciu
{"title":"Electromagnetic characterization of conductive magnetic/non-magnetic shielding materials","authors":"M. Badic, M. Marinescu, L. Aciu","doi":"10.1109/ISEMC.2005.1513497","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513497","url":null,"abstract":"The theory of shielding was developed mostly on the basis of transmission lines model, using the Schelkunoff-Schulz isomorphism. The paper uses the transmission line theory but abandons the isomorphism that led to theory vs. experiments mismatch. The new model assumes transversal capacitive coupling between the sample under test and the coaxial TEM measuring cell. Thus, occurrence of higher modes inside the tested material at high frequencies is avoided, and experimental curves IL=F(/spl omega/) validate theoretical predictions.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"12 1","pages":"185-189 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73472613","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Field statistics in an enclosure with an aperture - effect of Q-factor and number of modes 具有孔径效应的壳体的场统计——q因子和模数的影响
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513489
J. Dawson, T. Konefal, M. Robinson, A. Marvin, S. Porter, L. Chirwa
{"title":"Field statistics in an enclosure with an aperture - effect of Q-factor and number of modes","authors":"J. Dawson, T. Konefal, M. Robinson, A. Marvin, S. Porter, L. Chirwa","doi":"10.1109/ISEMC.2005.1513489","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513489","url":null,"abstract":"The statistics of the fields within an enclosure illuminated by an external field via an aperture have been investigated using Monte-Carlo methods. The field statistics in the volume of the enclosure are shown to correspond to the Rayleigh statistics found in properly functioning reverberation chambers when a sufficiently large number of modes is excited. The variation of field behaviour near the conducting walls is investigated. The deviation of the field statistics from the Rayleigh distribution as the number of excited modes falls is also investigated.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"263 1","pages":"141-146 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83923265","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 18
Termination with reverse-connected common-mode choke (T-ReCC) for a differential transmission line 差分传输线端接反接共模扼流圈(T-ReCC)
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513495
H. Suenaga, O. Shibata, Y. Saito
{"title":"Termination with reverse-connected common-mode choke (T-ReCC) for a differential transmission line","authors":"H. Suenaga, O. Shibata, Y. Saito","doi":"10.1109/ISEMC.2005.1513495","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513495","url":null,"abstract":"In this paper, a new termination circuit that consists of two common-mode chokes for a differential transmission line is proposed. It dramatically reduces common-mode noise while maintaining the transmission performance of a differential-mode signal. The noise-reduction effect of the circuit is explained here theoretically; it was also verified experimentally using an evaluation board.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"121 1","pages":"175-178 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85846373","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Specifying and characterizing cable/connector systems for high-speed interfaces in defense/aerospace systems 国防/航空航天系统中高速接口用电缆/连接器系统的规定和特性
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513661
J. G. Kraemer
{"title":"Specifying and characterizing cable/connector systems for high-speed interfaces in defense/aerospace systems","authors":"J. G. Kraemer","doi":"10.1109/ISEMC.2005.1513661","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513661","url":null,"abstract":"This paper presents a common-sense approach for specifying and characterizing cable/connector systems used for high-speed data interfaces between defense/aerospace equipment, most specifically equipment using off-the-shelf non-defense/aerospace interfaces. The approach described examines the cable/connector system by itself to specify and characterize its ability to impede the transfer of interference, prevent emissions of the desired signal, and to meet required signal integrity attributes. Cable/connector system specification wording and verification methods are provided.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"79 1","pages":"943-948 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86833930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
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