2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.最新文献

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Modelling of EMC problems using TLM method 用TLM方法建模电磁兼容问题
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513553
A. Piccolo, V. Galdi, M. Acone, A. Amendolara
{"title":"Modelling of EMC problems using TLM method","authors":"A. Piccolo, V. Galdi, M. Acone, A. Amendolara","doi":"10.1109/ISEMC.2005.1513553","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513553","url":null,"abstract":"The paper deals with the modeling of electromagnetic (EMC) problems in power systems using transmission line modeling (TLM) technique. A methodology to model sources and victims of electromagnetic interferences (EMIs) in terms of lumped equivalent circuits for the 3D EMC analysis is presented. The simulated circuits are modeled by generic series loads connected to the ports of the series condensed nodes in a standard TLM mesh. The proposed approach assures the description of the parasitic phenomena with an high level of accuracy in a wide range of frequencies, allowing the modeling of coupling mechanisms both at low and at high frequency in EMC problems without requiring their explicit modeling. The proposed approach is implemented in an EMC simulator and two case studies have been presented to explain and to validate the method.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"67 1","pages":"432-437 Vol. 2"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73828560","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Estimation of electric parameters for thin shielding sheets 薄屏蔽片的电参数估计
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513481
T. Tosaka, I. Nagano, S. Yagitani
{"title":"Estimation of electric parameters for thin shielding sheets","authors":"T. Tosaka, I. Nagano, S. Yagitani","doi":"10.1109/ISEMC.2005.1513481","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513481","url":null,"abstract":"We suggest an estimation method of the electric parameters for thin shielding sheets. In order to evaluate our estimation method, we estimated the electric parameters for the metallic materials which have known electric parameters, and evaluated our method. For the non-magnetic materials, the estimated relative permeability was the same as the nominal values. For the ferromagnetic materials, the estimated relative permeability varied 0% to 30% from the nominal values. For both types of materials, the estimated conductivities were 0% to 9.8% different from the nominal values. Next, we apply our estimation method to shielding sheets, and we can estimate the electric parameters for items such as thin cloths","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"24 1","pages":"97-101"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75325007","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Circuit models for mode conversion in clock signal distribution 时钟信号分配中模式转换的电路模型
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513468
F. Pajares, M. Ribó, J.-R. Regeu, P. Rodríguez-Cepeda, L. Pradell
{"title":"Circuit models for mode conversion in clock signal distribution","authors":"F. Pajares, M. Ribó, J.-R. Regeu, P. Rodríguez-Cepeda, L. Pradell","doi":"10.1109/ISEMC.2005.1513468","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513468","url":null,"abstract":"Clock signal paths are often routed near other signal strips over a ground plane. These situations generate configurations of strips involving coupled microstrip sections interacting with non coupled microstrip sections, and generating transitions between coupled and uncoupled microstrip sections that heavily modify the propagations of both clock and information signals. These transitions usually cause a degradation of the signal integrity. The transitions generated by typical configurations of strips are: a microstrip-coupled microstrip tee and a coupled microstrip-microstrip cross. In this paper, rigorous circuit models for these transitions are presented and applied to the prediction of the behavior of a clock distribution near a signal path. The models presented are multimodal: they split the contribution of even (common) and odd (differential) signals (modes) into different ports, and allow the analysis of circuits that present different responses to either mode. The good agreement between circuit simulation and measurements validates the models","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"26 1","pages":"39-44"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74789033","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Comprehensive models for the investigation of on-chip switching noise generation and coupling 片上开关噪声产生和耦合研究的综合模型
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513597
J. Ihm, I. Chung, G. Manetas, A. Cangellaris
{"title":"Comprehensive models for the investigation of on-chip switching noise generation and coupling","authors":"J. Ihm, I. Chung, G. Manetas, A. Cangellaris","doi":"10.1109/ISEMC.2005.1513597","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513597","url":null,"abstract":"A comprehensive modeling methodology is presented for the investigation of on-chip noise generation and coupling due to power switching. The methodology utilizes a comprehensive electromagnetic model for the on-chip portion of the power grid. Thus, the tedious and error-prone extraction of a distributed RLC model for the power grid is avoided and the generated model allows for power grid induced broadband and distributed noise coupling to be taken into account in the transient simulation. The electromagnetic model for the power grid is complemented by a distributed RC model for the semiconductor substrate and RLCG models for the interconnects. Thus, a comprehensive model results for the quantification of on-chip interconnect and power grid noise effects during switching. Transient simulations using this model are carried out using a hybrid time-domain integration scheme which combines a SPICE-like engine for the analysis of all RLCG netlists and the nonlinear drivers incorporated in the model with a numerical integration algorithm for the discrete electromagnetic model for the power grid","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"163 1","pages":"666-671"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78502435","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 11
Understanding skin current distributions on an aircraft at HF using eigencurrent expansions 用特征电流展开法了解飞机高频处的蒙皮电流分布
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513552
C. Leat
{"title":"Understanding skin current distributions on an aircraft at HF using eigencurrent expansions","authors":"C. Leat","doi":"10.1109/ISEMC.2005.1513552","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513552","url":null,"abstract":"In order to EMV test whole aircraft at HF, impractically large TEM cells or reverberation chambers and RF amplifier powers are required if the accepted principles are applied. Novel methods are called for which minimise RF amplifier power requirements and utilise more than the generally accepted uniform field volume of the TEM cell, or apply currents directly to the skin using direct current injection. Numerical modelling provides a valuable tool to explore and optimise these novel methods of applying EMV testing to whole aircraft at HF. However, the volume of data presented to the designer by such programs can be overwhelming: method of moments numerical models of small aircraft at HF produce several thousand sub-sectional basis functions. Comparisons between alternative methods therefore require either arbitrary decimation of this data or some other approach. Furthermore, the raw moment method data provides little insight into the ways in which the techniques may be improved. In this paper, a method of using eigencurrent expansions is demonstrated on an all-metal Aermacchi MB326H aircraft. It is shown that at HF, only a handful of the strongest skin eigencurrents are required to provide meaningful understanding of the DCI or free-space-generated skin currents on the whole aircraft This method may be used to systematically optimise the design of the DCI technique, including selecting injection sites, amplitudes and phases.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"55 1","pages":"426-431 Vol. 2"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81015089","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Validating anechoic chambers above 1 GHz using a reciprocal site VSWR technique 使用互向站点VSWR技术验证1ghz以上的消声室
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513501
A. Kriz
{"title":"Validating anechoic chambers above 1 GHz using a reciprocal site VSWR technique","authors":"A. Kriz","doi":"10.1109/ISEMC.2005.1513501","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513501","url":null,"abstract":"In this paper, three validation methods for anechoic chambers above 1 GHz are presented. They are related to the Site VSWR concept developed by CISPR/A. The reciprocal site VSWR method as well as the site VSWR method are proper methods to validate EMC chambers. The use of omnidirectional field probes and omnidirectional antenna does not have a significant impact on the test result The required time for the reciprocal site VSWR method is significantly higher. For antenna and microwave chambers other methods using continuous scan techniques have to be applied.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"16 1","pages":"206-209 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77846277","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Development of a multiresolution time domain EMI measurement system that fulfills CISPR 16-1 实现CISPR 16-1的多分辨率时域电磁干扰测量系统的研制
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513545
S. Braun, M. Aidam, P. Russer
{"title":"Development of a multiresolution time domain EMI measurement system that fulfills CISPR 16-1","authors":"S. Braun, M. Aidam, P. Russer","doi":"10.1109/ISEMC.2005.1513545","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513545","url":null,"abstract":"Measurement systems, that allow to measure within short measurement time electromagnetic interference (EMI), will reduce the costs for compliance tests. A time-domain EMI (TDEMI) measurement system can reduce the measurement time by several orders of magnitude. In order to have the permission to use a time-domain EMI measurement system for compliance measurements it has to fulfill the CISPR 16-1 (1999) completely. In the following the requirements given by CISPR 16-1 are applied to the TDEMI measurement system. The characteristics of the TDEMI measurement system are compared with the rules of CISPR 16-1. A multiresolution TDEMI (MRTDEMI) measurement system that uses several analog-to-digital converters (ADCs) is presented. With such a system the signal-to-noise ratio (SNR) is enhanced. Measurements have been carried out in the frequency range 30 MHz - 1 GHz. It is shown, that almost all requirements are fulfill led by the MRTDEMI measurement system.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"150 1","pages":"388-393 Vol. 2"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72840990","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 31
Matched lossy decoupling termination for power plane noise mitigation 匹配的有损去耦端接,用于降低功率平面噪声
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513626
Xin Wu
{"title":"Matched lossy decoupling termination for power plane noise mitigation","authors":"Xin Wu","doi":"10.1109/ISEMC.2005.1513626","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513626","url":null,"abstract":"Matched lossy decoupling termination is investigated for suppressing the power plane noise. Termination rule is developed based on the frequency dependence characteristics of the lossy decoupling and power plane noise propagation modes. By using the matched lossy decoupling termination, the decoupling benefits can be expanded from hundreds of MHz to 2 GHz or above where the traditional decoupling technology fails due to inductive effects.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"6 1","pages":"762-765 Vol. 3"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73166290","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Comparing FSV and human responses to data comparisons 比较FSV和人类对数据比较的反应
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513515
B. Archambeault, S. Connor, A. Duffy
{"title":"Comparing FSV and human responses to data comparisons","authors":"B. Archambeault, S. Connor, A. Duffy","doi":"10.1109/ISEMC.2005.1513515","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513515","url":null,"abstract":"The feature selective validation (FSV) method was developed with the specific goal to mirror the approach taken by engineers when assessing data presented visually during the validation of computational electromagnetics. The FSV (feature selective validation) technique has been demonstrated to have good agreement with the human survey results for a number of different data sets. Survey results for data sets in good agreement show a very small standard deviation, however, data sets with fair agreement have a significantly higher standard deviation.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"16 1","pages":"284-289 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81459315","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 17
Evaluation method of common-mode choke coil used for high speed telecommunications port 高速通信端口用共模扼流圈评价方法
2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005. Pub Date : 2005-10-03 DOI: 10.1109/ISEMC.2005.1513502
T. Hoshino, F. Amemiya, N. Kuwabara
{"title":"Evaluation method of common-mode choke coil used for high speed telecommunications port","authors":"T. Hoshino, F. Amemiya, N. Kuwabara","doi":"10.1109/ISEMC.2005.1513502","DOIUrl":"https://doi.org/10.1109/ISEMC.2005.1513502","url":null,"abstract":"A method of measuring characteristics of the common-mode choke coil, which is used for a high-speed telecommunications system using UTP cable, is needed to evaluate the performance. We present a new method of measuring the S-parameters of the coil. The two-port F-matrix parameters of the balun were obtained from three-port S-parameters, and the S-parameters of the coil were measured at the unbalance port of the baluns, which was connected to both ends of the coil. The F-matrix parameters of the coil were obtained from the F-matrix parameters of the balun and the measured S-parameters. When two baluns were connected to each other at the balance ports, the S-parameters were measured find compared with the calculated value from the F-matrix parameters of the balun. The results indicated that the difference was within 0.1 dB from 30 MHz to 100 MHz, and within 1 dB from 100 MHz to 300 MHz. The differential mode insertion losses were also measured for five types of the coils. The results indicated that the proposed method obtained a realistic insertion loss value which was not less than 0 dB although the insertion loss measured by the usual method was not a realistic value because it was less than 0 dB up to 100 MHz.","PeriodicalId":6459,"journal":{"name":"2005 International Symposium on Electromagnetic Compatibility, 2005. EMC 2005.","volume":"34 1","pages":"210-215 Vol. 1"},"PeriodicalIF":0.0,"publicationDate":"2005-10-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86541519","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
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